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K

Kingsley Egbo

leibniz-institut im forschungsverbund berlin e.v
H指数:19
被引数:908

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Assessment of Trapping Phenomena in As-Grown and Thermally-Treated Si-Doped κ-Ga2O3 Layers via Optical Admittance Spectroscopy

通过光学导纳谱法对As-Grown和Thermally-Treated Si掺杂κ-Ga2O3层的俘获现象进行评估

2025-07-030
OAAI