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Han-Seul Kim

Tokyo Institute of Technology
H指数:11
被引数:695

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Cover Picture: Self-Closing of Cracks Generated in Microstructure-Controlled 400 μm-Thick Composite Cathodes for All-Solid-State Batteries: Observed by In Situ Scanning Electron Microscopy with Energy-Dispersive X-Ray Spectroscopy (Batteries & Supercaps 6/2025)

封面图片:全固态电池中微观结构控制的400μm厚复合阴极产生的裂纹的自闭合:由带能谱仪的现场扫描电子显微镜观察(Batteries & Supercaps 6/2025)

2025-06-220
PRE
Self-Closing of Cracks Generated in Microstructure-Controlled 400 μm-Thick Composite Cathodes for All-Solid-State Batteries: Observed by In Situ Scanning Electron Microscopy with Energy-Dispersive X-Ray Spectroscopy

全固态电池中微观结构调控的400 μm厚复合阴极产生的裂纹的自闭合:通过原位扫描电子显微镜与能量色散X射线光谱法观察

2025-05-130
PRE