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Francesco Iannuzzo

Polytechnic University of Turin

37H指数
332论文数
5.4K被引数
收录论文 45
发表时间
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A Cauer-Foster Integrated Thermal Network Model for Multi-Chip SiC Power Modules Considering Temperature-Dependent Material Properties考乌尔-福斯特集成热网络模型：考虑温度依赖性材料特性的多芯片SiC功率模块
errIEEE Open Journal of Power Electronics
IF3.9
err2026-06-02
err0
errOAAI
errShuoyu Ye; Jingyang Hu; Guofu Chen; Chushan Li; Haoze Luo; Wuhua Li; Xiangning He; Francesco Iannuzzo
err分享
err收藏
Dynamic Gate Stress: Impact of duty cycle and gate resistance on automotive grade planar-gate 1200 V SiC MOSFET动态栅极应力：占空比和栅极电阻对汽车级平面栅极1200 V SiC MOSFET的影响
errMicroelectronics Reliability
IF1.9
err2026-05-01
err0
PREAI
errFiore, Michele; Sitta, Alessandro; Mauromicale, Giuseppe; Sequenzia, Gaetano; Iannuzzo, Francesco; Calabretta, Michele
err分享
err收藏
An Energy-Efficient Voltage-Doubler-Based DC–DC Stage for Current Source Inverter Operation
errIEEE Journal of Emerging and Selected Topics in Power Electronics
IF4.9
err2025-10-10
err0
PREAI
errRoberto Giacomobono; Fabrizio Marignetti; Francesco Iannuzzo; Ariya Sangwongwanich
err分享
err收藏
Contact Pressure Distribution Measurement for the Press Pack IGBT by Ultrasonic Measurement Method压装IGBT的接触压力分布超声测量方法
errIEEE Transactions on Instrumentation and Measurement
IF5.9
err2025-01-01
err0
PREAI
errZeyu Duan; Ran Yao; Hui Li; Xiao Wang; Wei Lai; Francesco Iannuzzo; Ying Li; Kai Ma
err分享
err收藏
Investigation on Saturation Voltage Increment of Multichip Press-Pack IGBTs Under Power Cycling Tests
errIEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
IF7.2
err2024-11-01
err0
PREAI
errZhan, Cao; Zhu, Lingyu; Zhang, Yaxin; Ji, Shengchang; Iannuzzo, Francesco; Blaabjerg, Frede
err分享
err收藏
Intelligent Condition Monitoring of Multiple Thermal Degradation of IGBT Modules Based on Case Temperature Matrix
errIEEE TRANSACTIONS ON POWER ELECTRONICS
IF6.5
err2024-10-01
err1
PREAI
errZhan, Cao; Tang, Yizheng; Zhu, Lingyu; Wang, Weicheng; Gou, Yating; Ji, Shengchang; Iannuzzo, Francesco
err分享
err收藏
Figures-of-Merit Study for Thermal Transient Measurement of SiC MOSFETs
errIEEE TRANSACTIONS ON POWER ELECTRONICS
IF6.5
err2024-09-01
err1
PREAI
errZhang, Yi; Zhang, Yichi; Wong, Voon Hon; Kalker, Sven; Caruso, Antonio; Ruppert, Lukas; Iannuzzo, Francesco; de Doncker, Rik W.
err分享
err收藏
Online Junction Temperature Extraction for Cascode GaN Devices Based on Turn-On Delay基于导通延迟的共源共栅GaN器件结温在线提取
errIEEE TRANSACTIONS ON POWER ELECTRONICS
IF6.5
err2024-08-01
err1
PREAI
errLu, Zhebie; Iannuzzo, Francesco
err分享
err收藏
In-Operation Junction Temperature Extraction for Cascode GaN Devices Based on Turn-Off Delay基于关断延迟的共源共栅GaN器件工作结温提取
errIEEE TRANSACTIONS ON POWER ELECTRONICS
IF6.5
err2024-04-01
err2
PREAI
errLu, Zhebie; Iannuzzo, Francesco
err分享
err收藏
A Double-Sided Cooling Approach of Discrete SiC MOSFET Device Based on Press-Pack Package
errIEEE OPEN JOURNAL OF POWER ELECTRONICS
IF3.9
err2024-01-01
err0
errOAAI
errYao, Ran; Zhu, Zheyan; Li, Hui; Lai, Wei; Chen, Xianping; Iannuzzo, Francesco; Liu, Renkuan; Luo, Xiaorong
err分享
err收藏
Low Inductive Characterization of Fast-Switching SiC MOSFETs and Active Gate Driver Units
errIEEE TRANSACTIONS ON INDUSTRY APPLICATIONS
IF4.5
err2023-09-01
err5
PREAI
errPhilipps, Daniel A.; Xue, Peng; Ubostad, Tobias Nieckula; Iannuzzo, Francesco; Peftitsis, Dimosthenis
err分享
err收藏
Multidimensional Mission-Profile-Based Lifetime Estimation Approach for IGBT Modules in MMC-HVdc Application Considering Bidirectional Power Transfer
errIEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
IF7.2
err2023-07-01
err10
PREAI
errZhan, Cao; Zhu, Lingyu; Wang, Weicheng; Zhang, Yaxin; Ji, Shengchang; Iannuzzo, Francesco
err分享
err收藏
Short-Circuit Capability Optimization of Press-Pack IGBT by Improving Active Edge Heat Dissipation
errIEEE TRANSACTIONS ON POWER ELECTRONICS
IF6.5
err2023-05-01
err1
PREAI
errYu, Yue; Li, Hui; Yao, Ran; Iannuzzo, Francesco; Zhu, Zheyan; Chen, Xianping
err分享
err收藏
Design for Reliability of SiC-MOSFET-Based 1500-V PV Inverters With Variable Gate Resistance栅极电阻可变的sic-mosfet 1500光伏逆变器可靠性设计
errIEEE TRANSACTIONS ON INDUSTRY APPLICATIONS
IF4.5
err2022-09-01
err10
errOAAI
errHe, Jinkui; Sangwongwanich, Ariya; Yang, Yongheng; Zhang, Kaichen; Iannuzzo, Francesco
err分享
err收藏
Self-Sustained Turn-OFF Oscillation of Cascode GaN HEMTs: Occurrence Mechanism, Instability Analysis, and Oscillation Suppression共源共栅GaN hemt的自持关断振荡: 发生机理，不稳定性分析和振荡抑制
errIEEE TRANSACTIONS ON POWER ELECTRONICS
IF6.5
err2022-05-01
err14
errOAAI
errXue, Peng; Iannuzzo, Francesco
err分享
err收藏
A Fully Coupled Model of Multi-Chip Press-Pack IGBT for Thermo-Mechanical Stress Distribution Prediction
errIEEE TRANSACTIONS ON INDUSTRY APPLICATIONS
IF4.5
err2022-05-01
err10
errOAAI
errZhan, Cao; Zhu, Lingyu; Zhang, Yaxin; Dai, Jiangang; Hou, Ting; Song, Ying; Ji, Shengchang; Iannuzzo, Francesco
err分享
err收藏
Voltage Balancing of Series IGBTs in Short-Circuit Conditions串联igbt在短路条件下的电压平衡
errIEEE TRANSACTIONS ON POWER ELECTRONICS
IF6.5
err2022-05-01
err2
errOAAI
errZarghani, Mostafa; Peyghami, Saeed; Iannuzzo, Francesco; Blaabjerg, Frede; Kaboli, Shahriyar
err分享
err收藏
Intrusiveness of Power Device Condition Monitoring Methods: Introducing Figures of Merit for Condition Monitoring
errIEEE INDUSTRIAL ELECTRONICS MAGAZINE
IF4.1
err2022-03-01
err8
errOAAI
errRizzo, Santi Agatino; Susinni, Giovanni; Iannuzzo, Francesco
err分享
err收藏
Separation and Validation of Bond-Wire and Solder Layer Failure Modes in IGBT Modules
errIEEE TRANSACTIONS ON INDUSTRY APPLICATIONS
IF4.5
err2022-03-01
err9
errOAAI
errLi, Wenzhao; Zhou, Dao; Iannuzzo, Francesco; Hartmann, Michael; Blaabjerg, Frede
err分享
err收藏
Online Junction Temperature and Current Simultaneous Extraction for SiC MOSFETs With Electroluminescence Effect
errIEEE TRANSACTIONS ON POWER ELECTRONICS
IF6.5
err2022-01-01
err23
errOAAI
errLuo, Haoze; Mao, Junjie; Li, Chengmin; Iannuzzo, Francesco; Li, Wuhua; He, Xiangning
err分享
err收藏

研究方向

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合作学者
合作期刊
F
Frede Blaabjerg
H 指数: 193 · 论文数: 4.2K
M
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H 指数: 91 · 论文数: 937
李慧君 封面图
李慧君 (Huijun Li)
H 指数: 87 · 论文数: 2.2K
何
何香凝 (Xiangning He)
H 指数: 75 · 论文数: 749
Y
Yongheng Yang
H 指数: 72 · 论文数: 617
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