Rock‐Hyun Baek - Publications, H-index & Citations

Physics-Assisted Neural Network Modeling of Advanced Recessed-3D nand Cells Under Sparse-Data Conditions 基于稀疏数据条件下先进凹陷式3D nand单元的物理辅助神经网络建模

IF3.2

2026-03-17

PREAI

Jiyoon Kim; Chanyang Park; Kihoon Nam; Donghyun Kim; Rock-Hyun Baek

Accurate ML-Based Prediction of Next-Generation nand With Limited Data Using Generative AI and Transfer Learning 基于生成式人工智能和迁移学习的下一代NAND有限数据下的准确机器学习预测

IF3.2

2026-03-10

PREAI

Kyeongrae Cho; Soomin Kim; Seungjoon Eom; Sinyeong Kang; Seongsoo Jeong; Rock-Hyun Baek

Investigation of Dielectric Wall LER-Induced DC/AC Performance Variability in Forksheet FETs

IF3.2

2026-03-10

PREAI

Soomin Kim; Kyeongrae Cho; Seungjoon Eom; Donghyun Kim; Sinyeong Kang; Seongsoo Jeong; Rock-Hyun Baek

Power, Performance, and Area Analysis of Ultra-Stacked Forksheet-FET for Angstrom Nodes 功率、性能和面积分析：用于埃级节点的超堆叠分叉沟道场效应晶体管

IF3.2

2025-12-04

PREAI

Minchan Kim; Seunghwan Lee; Junjong Lee; Sanguk Lee; Yonghwan Ahn; Gunryeol Cho; Rock-Hyun Baek

Random telegraph noise-based analysis of electron traps of sub-30-nm DRAM cell-array transistors in cryogenic operation 基于随机电报噪声的亚30纳米DRAM存储单元阵列晶体管在低温工作条件下的电子陷阱分析

IF3.2

2025-08-01

PREAI

Junjong Lee; Sanguk Lee; Yonghwan Ahn; Minchan Kim; Gunryeol Cho; Sunmin Yeou; Sung-Kyu Lim; Rock-Hyun Baek

Results in Physics

IF4.6

2025-06-09

OAAI

Sangwon Lee; Ho Jung Lee; Ga Won Yang; Sungju Choi; Jingyu Park; Seonhaeng Lee; Gang-Jun Kim; Namhyun Lee; Yoon Kim; Myounggon Kang; Rock-Hyun Baek; Changhyun Kim; Ickhyun Song; Dae Hwan Kim

Effect of post-metallization anneal on monolithic co-integration of Hf0.5Zr0.5O2-based FeFET and CMOS 后金属化退火对Hf0.5Zr0.5O2基FeFET与CMOS单片集成的影响

SCIENTIFIC REPORTS

IF3.9

2025-05-18

OAAI

An, Jehyun; Ham, Beomjoo; Hong, Giryun; Park, Jongseo; Kang, Bohyeon; Pyo, Jaeseong; Ahn, Sung-Min; Baek, Rock-Hyun

Mitigating IR drop in ultra-high-density 3D NAND flash via channel stress modulation and material optimization

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

IF4.6

2025-03-01

PREAI

Kim, Donghyun; Nam, Kihoon; Kim, Jiyoon; Jeong, Jinsu; Lee, Sanguk; Baek, Rock-Hyun

Analysis of Bias Temperature Instability in Peripheral CMOS Devices for Low-Temperature Memory Applications 低温度存储应用中周边CMOS器件的偏置温度不稳定性分析

IEEE Access

IF3.6

2025-01-01

OAAI

Jung Rae Cho; Seungwon Go; Jingyu Park; Tae Jun Yang; Seonhaeng Lee; Namhyun Lee; Dong Keun Lee; Yoon Kim; Myounggon Kang; Rock-Hyun Baek; Changhyun Kim; Sangwan Kim; Dae Hwan Kim

Machine Learning-Driven Extraction of Hybrid Compact Models Integrating Neural Networks and Berkeley Short-Channel Insulated-Gate Field-Effect Transistor Model-Common Multigate for Multidevice Applications 机器学习驱动的混合紧凑模型的提取集成了神经网络和Berkeley短沟道绝缘栅场效应晶体管模型-用于多设备应用的通用多栅极

Nonlinear Variation Decomposition of Neural Networks for Holistic Semiconductor Process Monitoring 用于整体半导体工艺监控的神经网络的非线性变化分解

IF6.1

2024-11-11

OAAI

Eom, Seungjoon; Lee, Seunghwan; Yun, Hyeok; Cho, Kyeongrae; Kim, Soomin; Baek, Rockhyun

Accurate Evaluation of Electro-Thermal Performance in Silicon Nanosheet Field-Effect Transistors with Schemes for Controlling Parasitic Bottom Transistors

IF6.1

2024-09-04

OAAI

Yun, Hyeok; Jang, Hyundong; Lee, Seunghwan; Lee, Junjong; Cho, Kyeongrae; Eom, Seungjoon; Kim, Soomin; Kim, Choong-Ki; Byun, Hong-Chul; Han, Seongjoo; Yoo, Min-Soo; Baek, Rock-Hyun

NANOMATERIALS

IF4.3

2024-06-10

OAAI

Jeong, Jinsu; Lee, Sanguk; Baek, Rock-Hyun

Neural Compact Modeling Framework for Flexible Model Parameter Selection with High Accuracy and Fast SPICE Simulation 用于高精度灵活模型参数选择和快速SPICE仿真的神经紧凑建模框架

Cryogenic Body Bias Effect in DRAM Peripheral and Buried-Channel-Array Transistor for Quantum Computing Applications

IF6.1

2024-01-06

OAAI

Eom, Seungjoon; Yun, Hyeok; Jang, Hyundong; Cho, Kyeongrae; Lee, Seunghwan; Jeong, Jinsu; Baek, Rock-Hyun

FEOL Monolithic Co-Integration of FeFET and CMOS on 8-Inch Wafer Using Laser Spike Annealing With Implementation of an FeFET Inverter

IF3.6

2024-01-01

OAAI

You, Hyunseo; Nam, Kihoon; An, Jehyun; Park, Chanyang; Kim, Donghyun; Lee, Seonhaeng; Lee, Namhyun; Baek, Rock-Hyun

Multi-Task Learning for Real-Time BSIM-CMG Parameter Extraction of NSFETs With Multiple Structural Variations

IF3.6

2024-01-01

OAAI

Kang, Bohyeon; An, Jehyun; Park, Jongseo; Hong, Giryun; Ham, Beomjoo; Pyo, Jaeseong; Ahn, Sung-Min; Baek, Rock-Hyun

Current-Voltage Modeling of DRAM Cell Transistor Using Genetic Algorithm and Deep Learning

IF3.6

2024-01-01

OAAI

Lee, Seunghwan; Eom, Seungjoon; Jeong, Jinsu; Lee, Junjong; Lee, Sanguk; Yun, Hyeok; Ahn, Yonghwan; Baek, Rock-Hyun

Modeling of 3D NAND Characteristics for Cross-Temperature by Using Graph Neural Network and Its Application 基于图神经网络的三维NAND交叉温度特性建模及其应用

IF3.6

2024-01-01

OAAI

Park, Jun Hui; Kim, Jung Nam; Lee, Seonhaeng; Kim, Gang-Jun; Lee, Namhyun; Baek, Rock-Hyun; Kim, Dae Hwan; Kim, Changhyun; Kang, Myounggon; Kim, Yoon

Accurate Prediction and Reliable Parameter Optimization of Neural Network for Semiconductor Process Monitoring and Technology Development 用于半导体工艺监控和技术开发的神经网络的准确预测和可靠参数优化

IF6.1

2023-10-09

OAAI

Cho, Kyeongrae; Lee, Jeong-Sik; Park, Chanyang; Yun, Hyeok; Jang, Hyundong; Eom, Seungjoon; Park, Min Sang; Choi, Hyun-Chul; Baek, Rock-Hyun