arrow
返回
U

Umberto Amato

consiglio nazionale delle ricerche (cnr)

25H指数
135论文数
1.9K被引数
收录论文 26
发表时间
Correction: Amato et al. Detecting Important Features and Predicting Yield from Defects Detected by SEM in Semiconductor Production. Sensors 2025, 25, 4218修正:Amato等人。利用半导体生产中通过SEM检测到的缺陷来检测重要特征和预测产量。传感器 2025, 25, 4218
errSensors
IF3.5
err2026-08-13
err0
errOAAI
errUmberto Amato; Anestis Antoniadis; Italia De Feis; Anastasiia Doinychko; Irène Gijbels; Antonino La Magna; Daniele Pagano; Francesco Piccinini; Easter Selvan Suviseshamuthu; Carlo Severgnini; Andres Torres; Patrizia Vasquez
err分享
err收藏
Predictive Maintenance of Pins in the ECD Equipment; Cu Deposition in the Semiconductor Industry
errSENSORS
IF3.5
err2023-07-08
err1
errOAAI
errAmato, Umberto; Antoniadis, Anestis; De Feis, Italia; Fazio, Domenico; Genua, Caterina; Gijbels, Irene; Granata, Donatella; La Magna, Antonino; Pagano, Daniele; Tochino, Gabriele; Vasquez, Patrizia
err分享
err收藏
Forecasting high resolution electricity demand data with additive models including smooth and jagged components
err2021-01-01
err23
PREAI
errAmato, Umberto; Antoniadis, Anestis; De Feis, Italia; Goude, Yannig; Lagache, Audrey
err分享
err收藏
err分享
err收藏
PROLIFIC: A Fast and Robust Profile-Likelihood-Based Muscle Onset Detection in Electromyogram Using Discrete Fibonacci Search
err2020-01-01
err6
errOAAI
errSuviseshamuthu, Easter S.; Allexandre, Didier; Amato, Umberto; Della Vecchia, Biancamaria; Yue, Guang H.
err分享
err收藏
Life cycle of scientific publications in the field of high social impact
err2019-10-18
err0
PREAI
errRuggiero, B.; Amato, U.; Franco, B.; De Petrocellis, L.; Vettoliere, A.; Granata, C.; Silvestrini, S.; Bonavolonta, C.; Valentino, M.; Brocchieri, J.; Silvestrini, P.
err分享
err收藏
err分享
err收藏
An empirical study on optic disc segmentation using an active contour model
err2015-04-01
err55
PREAI
errMary, M. Caroline Viola Stella; Rajsingh, Elijah Blessing; Jacob, J. Kishore Kumar; Anandhi, D.; Amato, Umberto; Selvan, S. Easter
err分享
err收藏
Cloud mask via cumulative discriminant analysis applied to satellite infrared observations: scientific basis and initial evaluation
err2014-10-07
err32
errOAAI
errAmato, U.; Lavanant, L.; Liuzzi, G.; Masiello, G.; Serio, C.; Stuhlmann, R.; Tjemkes, S. A.
err分享
err收藏
Evaluation of supervised methods for the classification of major tissues and Subcortical structures in multispectral brain magnetic resonance images
err2014-07-01
err8
PREAI
errMurino, Loredana; Granata, Donatella; Carfora, Maria Francesca; Selvan, S. Easter; Alfano, Bruno; Amato, Umberto; Larobina, Michele
err分享
err收藏
On the benefits of Laplace samples in solving a rare event problem using cross-entropy method
err2013-12-01
err3
errOAAI
errSelvan, S. Easter; Subathra, M. S. P.; Christinal, A. Hepzibah; Amato, Umberto
err分享
err收藏
Descent Algorithms on Oblique Manifold for Source-Adaptive ICA Contrast
err2012-12-01
err32
PREAI
errSelvan, Suviseshamuthu Easter; Amato, Umberto; Gallivan, Kyle A.; Qi, Chunhong; Carfora, Maria Francesca; Larobina, Michele; Alfano, Bruno
err分享
err收藏
An MRI digital brain phantom for validation of segmentation methods
err2011-06-01
err20
PREAI
errAlfano, Bruno; Comerci, Marco; Larobina, Michele; Prinster, Anna; Hornak, Joseph P.; Selvan, S. Easter; Amato, Umberto; Quarantelli, Mario; Tedeschi, Gioacchino; Brunetti, Arturo; Salvatore, Marco
err分享
err收藏
The influence of management and environmental variables on soil N2O emissions in a crop system in Southern Italy
err2010-12-03
err37
PREAI
errRanucci, Silvia; Bertolini, Teresa; Vitale, Luca; Di Tommasi, Paul; Ottaiano, Lucia; Oliva, Marco; Amato, Umberto; Fierro, Angelo; Magliulo, Vincenzo
err分享
err收藏
Technical Note: Functional sliced inverse regression to infer temperature, water vapour and ozone from IASI data
err2009-07-29
err26
errOAAI
errAmato, U.; Antoniadis, A.; De Feis, I.; Masiello, G.; Matricardi, M.; Serio, C.
err分享
err收藏
Experimental Approach to the Selection of the Components in the Minimum Noise Fraction
err2009-01-01
err49
PREAI
errAmato, Umberto; Cavalli, Rosa Maria; Palombo, Angelo; Pignatti, Stefano; Santini, Federico
err分享
err收藏