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H
Han Haitjema
ku leuven
30
H指数
175
论文数
4.6K
被引数
0
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37
发表时间
发表时间
IF
被引数
Moody Revisited: Least-Squares Solutions of the Union Jack Surface Plate Measurement Method
Moody重述:联合杰克表面板测量方法的加权最小二乘解
Metrology
IF
1.5
2026-04-13
0
OA
AI
Haitjema, Han
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Accuracy of polarized laser scattering detection of surface/subsurface damage in ground quartz glass
极化激光散射检测地面石英玻璃表面/亚表面损伤的精度
NDT & E International
IF
4.5
2025-11-12
0
PRE
AI
Shengwei Song; Pengfei Xu; Jingfei Yin; Han Haitjema
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Framework for uncertainty evaluation in optical surface topography measurement using a virtual instrument
基于虚拟仪器的光学表面形貌测量不确定度评定框架
MEASUREMENT
IF
5.6
2025-06-02
0
OA
AI
Hooshmand, Helia; Pappas, Athanasios; Isa, Mohammed A.; Su, Rong; Haitjema, Han; Piano, Samanta; Leach, Richard
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Uncertainty propagation from probe spacing to Fourier 3-probe straightness measurement
ISA TRANSACTIONS
IF
6.5
2024-11-01
0
PRE
AI
Huang, Pu; Xie, Jin; Haitjema, Han; Lu, Kuo; Shi, Shengyu
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收藏
Viewpoint Planning; Range Sensors Using Feature Cluster Constrained Spaces; Robot Vision Systems
SENSORS
IF
3.5
2023-09-18
1
OA
AI
Magana, Alejandro; Vlaeyen, Michiel; Haitjema, Han; Bauer, Philipp; Schmucker, Benedikt; Reinhart, Gunther
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Uncertainty evaluation of an on-machine chromatic confocal measurement system
MEASUREMENT
IF
5.6
2023-07-01
8
OA
AI
Ye, Long; Qian, Jun; Haitjema, Han; Reynaerts, Dominiek
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Virtual task-specific measurement uncertainty determination for laser scanning
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY
IF
3.7
2023-03-01
6
OA
AI
Vlaeyen, M.; Haitjema, H.; Dewulf, W.
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On-machine workpiece straightness profile measurement using a hybrid Fourier 3-sensor method
使用混合傅立叶3传感器方法在机器上工件直线度轮廓测量
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY
IF
3.7
2023-01-01
3
OA
AI
Huang, Pu; Shi, Shengyu; Xie, Jin; Haitjema, Han; Niu, Zengyuan; He, Quanpeng; Lu, Kuo
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Characterization of measurement and instrument noise in areal surface topography measurements by the Allan deviation
通过Allan偏差表征区域表面形貌测量中的测量和仪器噪声
CIRP ANNALS-MANUFACTURING TECHNOLOGY
IF
3.6
2023-01-01
9
OA
AI
Vanrusselt, Maxim; Haitjema, Han
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On-machine chromatic confocal measurement for micro-EDM drilling and milling
微细电火花钻铣的在机共焦色度测量
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY
IF
3.7
2022-07-01
28
PRE
AI
Ye, Long; Qian, Jun; Haitjema, Han; Reynaerts, Dominiek
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The implication and evaluation of geometrical imperfections on manufactured surfaces
CIRP ANNALS-MANUFACTURING TECHNOLOGY
IF
3.6
2022-01-01
10
PRE
AI
Mullany, B.; Savio, E.; Haitjema, H.; Leach, R.
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Depolarization of surface scattering in polarized laser scattering detection for machined silicon wafers
加工硅片偏振激光散射检测中表面散射的去极化
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY
IF
3.7
2022-01-01
6
OA
AI
Yin, Jingfei; Bai, Qian; Haitjema, Han; Zhang, Bi
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International comparison of flatness deviation in areal surface topography measurements
CIRP ANNALS-MANUFACTURING TECHNOLOGY
IF
3.6
2022-01-01
3
OA
AI
Vanrusselt, Maxim; Haitjema, Han; Leach, Richard; de Groot, Peter
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Hybrid dual laser processing for improved quality of inclined up-facing surfaces in laser powder bed fusion of metals
JOURNAL OF MATERIALS PROCESSING TECHNOLOGY
IF
7.5
2021-12-01
18
OA
AI
Metelkova, Jitka; Vanmunster, Lars; Haitjema, Han; Ordnung, Daniel; Kruth, Jean-Pierre; Van Hooreweder, Brecht
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Digital Twin of an Optical Measurement System
SENSORS
IF
3.5
2021-10-06
23
OA
AI
Vlaeyen, Michiel; Haitjema, Han; Dewulf, Wim
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Texture of inclined up-facing surfaces in laser powder bed fusion of metals
ADDITIVE MANUFACTURING
IF
11.1
2021-06-01
19
OA
AI
Metelkova, Jitka; Vanmunster, Lars; Haitjema, Han; Van Hooreweder, Brecht
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Error compensation for laser line scanners
MEASUREMENT
IF
5.6
2021-04-01
6
OA
AI
Vlaeyen, M.; Haitjema, H.; Dewulf, W.
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Uncertainty evaluation and reduction in three-probe roundness profile measurement based on the system transfer function
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY
IF
3.7
2021-03-01
7
OA
AI
Shi, Shengyu; Haitjema, Han; Wang, Yingjun; Jin, Gang
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Two-dimensional detection of subsurface damage in silicon wafers with polarized laser scattering
基于偏振激光散射的硅片亚表面损伤二维检测
JOURNAL OF MATERIALS PROCESSING TECHNOLOGY
IF
7.5
2020-10-01
22
OA
AI
Yin, Jingfei; Bai, Qian; Haitjema, Han; Zhang, Bi
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The Calibration of Displacement Sensors
SENSORS
IF
3.5
2020-01-21
17
OA
AI
Haitjema, Han
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研究方向
暂时未获取到该数据
合作学者
合作期刊
J
Jean‐Pierre Kruth
H 指数: 89 · 论文数: 582
C
C. J. Evans
H 指数: 77 · 论文数: 725
王盈君
(Yingjun Wang)
H 指数: 67 · 论文数: 529
F
Fengzhou Fang
H 指数: 60 · 论文数: 526
S
Seung‐Woo Kim
H 指数: 58 · 论文数: 726
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