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Irène Gijbels

ku leuven

40H指数
238论文数
8.2K被引数
收录论文 22
发表时间
Correction: Amato et al. Detecting Important Features and Predicting Yield from Defects Detected by SEM in Semiconductor Production. Sensors 2025, 25, 4218修正:Amato等人。利用半导体生产中通过SEM检测到的缺陷来检测重要特征和预测产量。传感器 2025, 25, 4218
errSensors
IF3.5
err2026-08-13
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errOAAI
errUmberto Amato; Anestis Antoniadis; Italia De Feis; Anastasiia Doinychko; Irène Gijbels; Antonino La Magna; Daniele Pagano; Francesco Piccinini; Easter Selvan Suviseshamuthu; Carlo Severgnini; Andres Torres; Patrizia Vasquez
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A General Framework for Circular Local Likelihood Regression
err2023-12-21
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errAlonso-Pena, Maria; Gijbels, Irene; Crujeiras, Rosa M.
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Predictive Maintenance of Pins in the ECD Equipment; Cu Deposition in the Semiconductor Industry
errSENSORS
IF3.5
err2023-07-08
err1
errOAAI
errAmato, Umberto; Antoniadis, Anestis; De Feis, Italia; Fazio, Domenico; Genua, Caterina; Gijbels, Irene; Granata, Donatella; La Magna, Antonino; Pagano, Daniele; Tochino, Gabriele; Vasquez, Patrizia
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PARAMETRIC COPULA ADJUSTED FOR NON- AND SEMIPARAMETRIC REGRESSION
err2022-04-01
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errOAAI
errZhao, Yue; Gijbels, Irene; Van Keilegom, Ingrid
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Extremile Regression极值回归
err2021-03-08
err10
errOAAI
errDaouia, Abdelaati; Gijbels, Irene; Stupfler, Gilles
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Extremiles: A New Perspective on Asymmetric Least Squares
err2018-10-29
err22
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errDaouia, Abdelaati; Gijbels, Irene; Stupfler, Gilles
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On a General Definition of Depth for Functional Data
err2017-11-01
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errOAAI
errGijbels, Irene; Nagy, Stanislav
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IMPROVED KERNEL ESTIMATION OF COPULAS: WEAK CONVERGENCE AND GOODNESS-OF-FIT TESTING
err2009-10-01
err108
errOAAI
errOmelka, Marek; Gijbels, Irene; Veraverbeke, Noel
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Nonparametric simultaneous testing for structural breaks
err2008-03-01
err14
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errGao, Jiti; Gijbels, Irene; Van Bellegeme, Sebastien
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