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Hyeong Joon Kim

Chonnam National University

41H指数
333论文数
5.4K被引数
收录论文 67
发表时间
Gene expression analysis of patients with chronic myeloid leukemia who discontinued tyrosine kinase inhibitor慢性髓系白血病患者酪氨酸激酶抑制剂停药后的基因表达分析
err2025-07-31
err0
errOAAI
errHyunkyung Park; Hyeong-Joon Kim; Sang-Kyun Sohn; Yoonsuk Baik; Dongho Kim; Sung-Yeoun Lee; Jee Hyun Kong; Hawk Kim; Dong-Yeop Shin; Jae-Sook Ahn; Jinny Park; Seonyang Park; Inho Kim
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Smart Decentralization of Personal Health Records with Physician Apps and Helper Agents on Blockchain: Platform Design and Implementation Study
err2021-06-07
err5
errOAAI
errKim, Hyeong-Joon; Kim, Hye Hyeon; Ku, Hosuk; Yoo, Kyung Don; Lee, Suehyun; Park, Ji In; Kim, Hyo Jin; Kim, Kyeongmin; Chung, Moon Kyung; Lee, Kye Hwa; Kim, Ju Han
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Clinical Genome Data Model (cGDM) provides Interactive Clinical Decision Support for Precision Medicine
err2020-01-29
err10
errOAAI
errKim, Hyo Jung; Kim, Hyeong Joon; Park, Yoomi; Lee, Woo Seung; Lim, Younggyun; Kim, Ju Han
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Analysis of the threshold switching mechanism of a Te-SbO selector device for crosspoint nonvolatile memory applications
err2017-10-30
err10
PREAI
errKim, Young Seok; Park, Ji Woon; Lee, Jong Ho; Choi, In Ah; Heo, Jaeyeong; Kim, Hyeong Joon
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Fermi-level unpinning in Pt/Al2O3/GaSb PMOS capacitors by sulphurization and rapid thermal annealing of GaSb surfaces
err2016-08-19
err7
PREAI
errKim, Seongkyung; Yoo, Sijung; Lim, Hajin; Kim, Joon-Rae; Jeong, Jae Kyeong; Kim, Hyeong Joon
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Effects of ZrO2 doping on HfO2 resistive switching memory characteristics
err2014-08-19
err41
PREAI
errRyu, Seung Wook; Cho, Seongjae; Park, Joonsuk; Kwac, Jungsuk; Kim, Hyeong Joon; Nishi, Yoshio
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Impact of the Cation Composition on the Electrical Performance of Solution-Processed Zinc Tin Oxide Thin-Film Transistors阳离子组成对溶液处理的氧化锌锡薄膜晶体管电性能的影响
err2014-08-12
err47
PREAI
errKim, Yoon Jang; Oh, Seungha; Yang, Bong Seob; Han, Sang Jin; Lee, Hong Woo; Kim, Hyuk Jin; Jeong, Jae Kyeong; Hwang, Cheol Seong; Kim, Hyeong Joon
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Dynamics of negative bias thermal stress-induced threshold voltage shifts in indium zinc oxide transistors: impact of the crystalline structure on the activation energy barrier
err2014-04-03
err10
PREAI
errOh, Seungha; Yang, Bong Seob; Kim, Yoon Jang; Choi, Yu Jin; Kim, Un Ki; Han, Sang Jin; Lee, Hong Woo; Kim, Hyuk Jin; Kim, Sungmin; Jeong, Jae Kyeong; Kim, Hyeong Joon
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Photobias Instability of High Performance Solution Processed Amorphous Zinc Tin Oxide Transistors
err2013-04-12
err69
PREAI
errKim, Yoon Jang; Yang, Bong Seob; Oh, Seungha; Han, Sang Jin; Lee, Hong Woo; Heo, Jaeyeong; Jeong, Jae Kyeong; Kim, Hyeong Joon
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Anomalous behavior of negative bias illumination stress instability in an indium zinc oxide transistor: A cation combinatorial approach
err2012-08-27
err41
PREAI
errOh, Seungha; Yang, Bong Seob; Kim, Yoon Jang; Oh, Myeong Sook; Jang, Mi; Yang, Hoichang; Jeong, Jae Kyeong; Hwang, Cheol Seong; Kim, Hyeong Joon
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Ti-electrode effects of NiO based resistive switching memory with Ni insertion layer
err2012-03-27
err25
PREAI
errRyu, Seung Wook; Ahn, Young Bae; Kim, Hyeong Joon; Nishi, Yoshio
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Threshold switching in Si-As-Te thin film for the selector device of crossbar resistive memory
err2012-03-21
err43
PREAI
errLee, Jong Ho; Kim, Gun Hwan; Ahn, Young Bae; Park, Ji Woon; Ryu, Seung Wook; Hwang, Cheol Seong; Kim, Hyeong Joon
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Comparison of thermal and atomic-layer-deposited oxides on 4H-SiC after post-oxidation-annealing in nitric oxide
err2012-02-24
err30
PREAI
errKim, Changhyun; Moon, Jeong Hyun; Yim, Jeong Hyuk; Lee, Do Hyun; Lee, Jong Ho; Lee, Hun Hee; Kim, Hyeong Joon
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Zirconium-assisted reaction in low temperature atomic layer deposition using Bis(ethyl-methyl-amino)silane and water
err2011-09-01
err3
PREAI
errWon, Seok-Jun; Kim, Joon Rae; Suh, Sungin; Choi, Yu Jin; Kim, Hyeong Joon
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Effect of Catalyst Layer Density and Growth Temperature in Rapid Atomic Layer Deposition of Silica Using Tris(tert-pentoxy)silanol
err2011-05-03
err25
PREAI
errWon, Seok-Jun; Kim, Joon Rae; Suh, Sungin; Lee, Nae-In; Hwang, Cheol Seong; Kim, Hyeong Joon
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Role of ZrO2 incorporation in the suppression of negative bias illumination-induced instability in Zn-Sn-O thin film transistors
err2011-03-25
err68
PREAI
errYang, Bong Seob; Huh, Myung Soo; Oh, Seungha; Lee, Ung Soo; Kim, Yoon Jang; Oh, Myeong Sook; Jeong, Jae Kyeong; Hwang, Cheol Seong; Kim, Hyeong Joon
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