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Petr Klapetek

czech metrology institute

24H指数
273论文数
6.3K被引数
收录论文 36
发表时间
A FAIR road to a bioAFM databank一个公平的道路通向生物原子力显微镜数据库
err2026-08-28
err0
PREAI
errJean-Luc Pellequer; Sebastian Aguayo; Andrea Alessandrini; David Alsteens; Toshio Ando; Audrey Beaussart; Michael Betton; Timo Betz; Kerstin G. Blank; Simone Bovio; Clément Campillo; Claudio Canale; Alexander X. Cartagena-Rivera; Filomena A. Carvalho; Ignacio Casuso; Guillaume Charras; Marti Checa; Liam Collins; Adai Colom; Luca Costa; Etienne Dague; Tanya E. S. Dahms; Pedro Jose de Pablo; Alexandra Delvallée; Simone Dinarelli; Lorna Dougan; Yves F. Dufrêne; Andra C. Dumitru; Yuri M. Efremov; Sofiane El-Kirat-Chatel; Paolo Facci; Georg E. Fantner; Amir Farokh Payam; Cécile Feuillie; Cristina Flors; Nancy Forde; Cécile Formosa-Dague; Gregory Francius; Clemens M. Franz; Kristian Franze; Ricardo Garcia; Sergi Garcia-Manyes; Núria Gavara; Marina I. Giannotti; Marco Girasole; Martin Guthold; George R. Heath; Céline Heu; Peter Hinterdorfer; Jamie K. Hobbs; Bart W. Hoogenboom; Sébastien Janel; Miklós Kellermayer; Petr Klapetek; Noriyuki Kodera; Melanie Koehler; Frank Lafont; Guillaume Lamour; Jessem Landoulsi; Valérie M. Laurent; Philippe Leclère; Malgorzata Lekka; Hongbin Li; Giovanni Longo; Arin Marchesi; Marion Mathelié-Guinlet; Gerald A. Meininger; Ioanna Mela; Pierre-Emmanuel Milhiet; Ruben Millan-Solsona; Tea Mišić Radić; Michaël Molinari; Fernando Moreno-Herrero; Michael A. Nash; Olivier Noël; Yoo Jin Oh; Laia Pasquina-Lemonche; Shivprasad Patil; Patricia Pedraz; Ana Paula Pêgo; Thomas T. Perkins; Martin Pesl; Tri Thanh Pham; Laura Picas; Alessandro Podestà; Johannes Preiner; Jan Přibyl; Roger Proksch; Pierre-Henri Puech; Alice L. B. Pyne; Manfred Radmacher; Lorena Redondo-Morata; Felix Rico; Wouter H. Roos; Robert Ros; Nuno C. Santos; Ugis Sarkans; Tilman E. Schäffer; Hermann Schillers; Zhifeng Shao; Delphine Sicard; Adam Cohen Simonsen; Igor Sokolov; Susana R. Sousa; Bjørn T. Stokke; Andreas Stylianou; Marek Szymonski; Florence Tama; Neil H. Thomson; Takayuki Uchihashi; Massimo Vassalli; Claude Verdier; Anthony Vial; Véronique Vié; Tomaso Zambelli; Renato Zenobi; Peng Zheng; Claire Valotteau
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The Surface-Topography Challenge: A Multi-Laboratory Benchmark Study to Advance the Characterization of Topography表面形貌挑战:一项多实验室基准研究以推进形貌表征
err2025-07-26
err0
errOAAI
errA. Pradhan; M. H. Müser; N. Miller; J. P. Abdelnabe; L. Afferrante; D. Albertini; D. A. Aldave; L. Algieri; N. Ali; A. Almqvist; T. Amann; P. Ares; B. N. Balzer; L. Baugh; E. A. Berberich; M. Björling; M. S. Bobji; F. Bottiglione; B. Brodmann; W. Cai; G. Carbone; R. W. Carpick; F. Cassin; J. Cayer-Barrioz; M. I. Chowdhury; M. Ciavarella; E. Cihan; D. Huang; E. Delplanque; A. J. Deptula; S. Descartes; A. Dhinojwala; M. Dienwiebel; D. Dini; A. C. Dunn; C. Edwards; M. Eriten; A. Esawi; R. M. Espinosa-Marzal; L. Fang; A. Fatemi; C. Fidd; D. Gabriel; F. Gaslain; G. Giordano; J. Gómez-Herrero; L. Gontard; N. N. Gosvami; G. Greenwood; C. Greiner; T. Grejtak; A. Haroun; M. Hasan; S. Hoppe; L. Isa; R. L. Jackson; S. Jang; O. Johnson; F. Kaiser; M. Kalin; K. Kalliorinne; P. H. Karanjkar; S. H. Kim; S. Kinzelberger; P. Klapetek; B. A. Krick; C. Kumar; N. Kumar; S. Kumar; P. LaMascus; R. Larsson; P. Laux; M. J. Lee; P. M. Lee; W. Lee; C. Leriche; J. Li; Y. Li; Y. -S. Li; T. A. Lubrecht; I. A. Lyashenko; C. Ma; T. Ma; F. Maaboudallah; S. Mahmood; F. Mangolini; M. Marian; D. Mazuyer; Y. Meng; N. Menga; T. Miller; D. M. Mulvihill; M. Najah; D. Nečas; C. I. Papadopoulos; A. Papangelo; M. Pauli; B. N. J. Persson; A. Peterson; A. A. Pitenis; P. Podsiadlo; M. Polajnar; V. L. Popov; T. Požar; A. Prasad; G. Prieto; C. Putignano; M. H. Rahman; S. B. Ramisetti; S. Raumel; I. J. Reyes; N. Rodriguez; M. Rodríguez Ripoll; H. Rojacz; P. Sainsot; A. Samodurova; D. Savio; M. Scaraggi; F. Schaefer; S. W. Scherrer; K. D. Schulze; K. E. Shaffer; M. A. Sidebottom; D. Skaltsas; J. Soni; C. Spies; G. W. Stachowiak; L. Steinhoff; N. C. Strandwitz; K. Sun; S. Tripathi; W. R. Tuckart; S. Ugar; M. Valtr; K. E. Van Meter; J. Vdovak; J. G. Vilhena; G. Violano; G. Vorlaufer; M. Walczak; B. Weber; T. Woloszynski; M. Wolski; A. Yadav; V. A. Yastrebov; M. Yongjian; L. Yuan; J. Yus; J. Zhang; X. Zhang; Q. Zheng; L. Pastewka; T. D. B. Jacobs
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Molecular surface coverage standards by reference-free GIXRF supporting SERS and SEIRA substrate benchmarking
err2024-08-28
err1
errOAAI
errCara, Eleonora; Hoenicke, Philipp; Kayser, Yves; Beckhoff, Burkhard; Giovannozzi, Andrea M.; Klapetek, Petr; Zoccante, Alberto; Cossi, Maurizio; Tay, Li-Lin; Boarino, Luca; Ferrarese Lupi, Federico
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Electrical and Thermal Conductivities of Single CuxO Nanowires单根CuxO纳米线的电导率和热导率
err2023-10-25
err3
errOAAI
errDe Carlo, Ivan; Baudino, Luisa; Klapetek, Petr; Serrapede, Mara; Michieletti, Fabio; De Leo, Natascia; Pirri, Fabrizio; Boarino, Luca; Lamberti, Andrea; Milano, Gianluca
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Local thermoelectric response from a single Neel domain wall
err2022-11-23
err3
errOAAI
errPuttock, Robert; Barton, Craig; Saugar, Elias; Klapetek, Petr; Fernandez-Scarioni, Alexander; Freitas, Paulo; Schumacher, Hans W.; Ostler, Thomas; Chubykalo-Fesenko, Oksana; Kazakova, Olga
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Nanometrology
err2022-10-26
err0
errOAAI
errKlapetek, Petr
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Optical characterization of inhomogeneous thin films with randomly rough boundaries exhibiting wide intervals of spatial frequencies
err2022-10-07
err3
errOAAI
errOhlidal, Ivan; Vohanka, Jiri; Bursikova, Vilma; Dvorak, Jan; Klapetek, Petr; Kaur, Nupinder Jeet
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Impact of roughness on heat conduction involving nanocontacts
err2021-10-18
err12
errOAAI
errGuen, Eloise; Chapuis, Pierre-Olivier; Kaur, Nupinder Jeet; Klapetek, Petr; Gomes, Severine
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GSvit - An open source FDTD solver for realistic nanoscale optics simulations
err2021-08-01
err3
errOAAI
errKlapetek, Petr; Grolich, Petr; Nezval, David; Valtr, Miroslav; Slesinger, Radek; Necas, David
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SThM-based local thermomechanical analysis: Measurement intercomparison and uncertainty analysis
err2020-10-01
err13
errOAAI
errGuen, Eloise; Klapetek, Petr; Puttock, Robert; Hay, Bruno; Allard, Alexandre; Maxwell, Tony; Chapuis, Pierre-Olivier; Renahy, David; Davee, Guillaume; Valtr, Miroslav; Martinek, Jan; Kazakova, Olga; Gomes, Severine
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Comparison and Validation of Different Magnetic Force Microscopy Calibration Schemes
errSMALL
IF12.1
err2020-02-09
err20
PREAI
errCorte-Leon, Hector; Neu, Volker; Manzin, Alessandra; Barton, Craig; Tang, Yuanjun; Gerken, Manuela; Klapetek, Petr; Schumacher, Hans Werner; Kazakova, Olga
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Modeling the influence of roughness on nanoindentation data using finite element analysis
err2019-10-01
err27
PREAI
errCampbell, Anna Charvatova; Bursikova, Vilma; Martinek, Jan; Klapetek, Petr
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Determination of tip transfer function for quantitative MFM using frequency domain filtering and least squares method
err2019-03-07
err15
errOAAI
errNecas, David; Klapetek, Petr; Neu, Volker; Havlicek, Marek; Puttock, Robert; Kazakova, Olga; Hu, Xiukun; Zajickova, Lenka
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Graphics cards based topography artefacts simulations in Scanning Thermal Microscopy
err2017-05-01
err11
errOAAI
errKlapetek, Petr; Martinek, Jan; Grolich, Petr; Valtr, Miroslav; Kaur, Nupinder Jeet
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