Hagen, C. W. - Publications & Citations

Hagen, C. W.

Delft University of Technology

0H指数

3论文数

0被引数

收录论文 3

发表时间

Electron-beam patterned calibration structures for structured illumination microscopy

SCIENTIFIC REPORTS

IF3.9

2022-11-23

OAAI

Hari, Sangeetha; Slotman, Johan A.; Vos, Yoram; Floris, Christian; van Cappellen, Wiggert A.; Hagen, C. W.; Stallinga, Sjoerd; Houtsmuller, Adriaan B.; Hoogenboom, Jacob P.

Mechanical characterization of nanopillars by atomic force microscopy 通过原子力显微镜对纳米柱的机械表征

ADDITIVE MANUFACTURING

IF11.1

2021-03-01

OAAI

Angeloni, L.; Ganjian, M.; Nouri-Goushki, M.; Mirzaali, M. J.; Hagen, C. W.; Zadpoor, A. A.; Fratila-Apachitei, L. E.; Ghatkesar, M. K.

Combined Focused Electron Beam-Induced Deposition and Etching for the Patterning of Dense Lines without Interconnecting Material 聚焦电子束诱导的沉积和蚀刻相结合，用于在没有互连材料的情况下图案化密集的线

MICROMACHINES

IF3

2020-12-24

OAAI

Hari, Sangeetha; Trompenaars, P. H. F.; Mulders, J. J. L.; Kruit, Pieter; Hagen, C. W.

研究方向