Alexandra Delvallée - Publications, H-index & Citations

Alexandra Delvallée

laboratoire national de métrologie et d’essais (lne)

14H指数

52论文数

509被引数

收录论文 12

发表时间

A FAIR road to a bioAFM databank 一个公平的道路通向生物原子力显微镜数据库

Nature Methods

IF32.1

2026-08-28

PREAI

Jean-Luc Pellequer; Sebastian Aguayo; Andrea Alessandrini; David Alsteens; Toshio Ando; Audrey Beaussart; Michael Betton; Timo Betz; Kerstin G. Blank; Simone Bovio; Clément Campillo; Claudio Canale; Alexander X. Cartagena-Rivera; Filomena A. Carvalho; Ignacio Casuso; Guillaume Charras; Marti Checa; Liam Collins; Adai Colom; Luca Costa; Etienne Dague; Tanya E. S. Dahms; Pedro Jose de Pablo; Alexandra Delvallée; Simone Dinarelli; Lorna Dougan; Yves F. Dufrêne; Andra C. Dumitru; Yuri M. Efremov; Sofiane El-Kirat-Chatel; Paolo Facci; Georg E. Fantner; Amir Farokh Payam; Cécile Feuillie; Cristina Flors; Nancy Forde; Cécile Formosa-Dague; Gregory Francius; Clemens M. Franz; Kristian Franze; Ricardo Garcia; Sergi Garcia-Manyes; Núria Gavara; Marina I. Giannotti; Marco Girasole; Martin Guthold; George R. Heath; Céline Heu; Peter Hinterdorfer; Jamie K. Hobbs; Bart W. Hoogenboom; Sébastien Janel; Miklós Kellermayer; Petr Klapetek; Noriyuki Kodera; Melanie Koehler; Frank Lafont; Guillaume Lamour; Jessem Landoulsi; Valérie M. Laurent; Philippe Leclère; Malgorzata Lekka; Hongbin Li; Giovanni Longo; Arin Marchesi; Marion Mathelié-Guinlet; Gerald A. Meininger; Ioanna Mela; Pierre-Emmanuel Milhiet; Ruben Millan-Solsona; Tea Mišić Radić; Michaël Molinari; Fernando Moreno-Herrero; Michael A. Nash; Olivier Noël; Yoo Jin Oh; Laia Pasquina-Lemonche; Shivprasad Patil; Patricia Pedraz; Ana Paula Pêgo; Thomas T. Perkins; Martin Pesl; Tri Thanh Pham; Laura Picas; Alessandro Podestà; Johannes Preiner; Jan Přibyl; Roger Proksch; Pierre-Henri Puech; Alice L. B. Pyne; Manfred Radmacher; Lorena Redondo-Morata; Felix Rico; Wouter H. Roos; Robert Ros; Nuno C. Santos; Ugis Sarkans; Tilman E. Schäffer; Hermann Schillers; Zhifeng Shao; Delphine Sicard; Adam Cohen Simonsen; Igor Sokolov; Susana R. Sousa; Bjørn T. Stokke; Andreas Stylianou; Marek Szymonski; Florence Tama; Neil H. Thomson; Takayuki Uchihashi; Massimo Vassalli; Claude Verdier; Anthony Vial; Véronique Vié; Tomaso Zambelli; Renato Zenobi; Peng Zheng; Claire Valotteau

Toward a Correlative Metrology Approach on the Same 2D Flake: Graphene Oxide Case Study—Sample Preparation and Stability Issues 基于同一二维晶片的关联计量学方法：氧化石墨烯案例研究——样品制备和稳定性问题

Nanomaterials

IF4.3

2026-03-04

OAAI

Lydia Chibane; Alexandra Delvallée; Nolwenn Fleurence; Sarah Douri; José Morán-Meza; Christian Ulysse; François Piquemal; Nicolas Feltin; Emmanuel Flahaut

Strategy for Ensuring the Metrological Traceability of Nanoparticle Size Measurements by SEM

NANOMATERIALS

IF4.3

2024-05-25

OAAI

Feltin, Nicolas; Delvallee, Alexandra; Crouzier, Loic

Deep-reactive ion etching of silicon nanowire arrays at cryogenic temperatures 低温下硅纳米线阵列的深反应离子刻蚀

APPLIED PHYSICS REVIEWS

IF11.6

2024-04-17

OAAI

Xu, Jiushuai; Refino, Andam Deatama; Delvallee, Alexandra; Seibert, Sebastian; Schwalb, Christian; Hansen, Poul Erik; Foldyna, Martin; Siaudinyte, Lauryna; Hamdana, Gerry; Wasisto, Hutomo Suryo; Kottmeier, Jonathan; Dietzel, Andreas; Weimann, Thomas; Pruessing, Jan Kristen; Bracht, Hartmut; Peiner, Erwin

Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles

NANOMATERIALS

IF4.3

2023-03-09

OAAI

Feltin, Nicolas; Crouzier, Loic; Delvallee, Alexandra; Pellegrino, Francesco; Maurino, Valter; Bartczak, Dorota; Goenaga-Infante, Heidi; Tache, Olivier; Marguet, Sylvie; Testard, Fabienne; Artous, Sebastien; Saint-Antonin, Francois; Salzmann, Christoph; Deumer, Jerome; Gollwitzer, Christian; Koops, Richard; Sebaihi, Noham; Fontanges, Richard; Neuwirth, Matthias; Bergmann, Detlef; Hueser, Dorothee; Klein, Tobias; Hodoroaba, Vasile-Dan

Correlative Analysis of the Dimensional Properties of Bipyramidal Titania Nanoparticles by Complementing Electron Microscopy with Other Methods

NANOMATERIALS

IF4.3

2021-12-10

OAAI

Crouzier, Loic; Feltin, Nicolas; Delvallee, Alexandra; Pellegrino, Francesco; Maurino, Valter; Cios, Grzegorz; Tokarski, Tomasz; Salzmann, Christoph; Deumer, Jerome; Gollwitzer, Christian; Hodoroaba, Vasile-Dan

Traceable Nanoscale Measurements of High Dielectric Constant by Scanning Microwave Microscopy

NANOMATERIALS

IF4.3

2021-11-17

OAAI

Richert, Damien; Moran-Meza, Jose; Kaja, Khaled; Delvallee, Alexandra; Allal, Djamel; Gautier, Brice; Piquemal, Francois

A novel approach for 3D morphological characterization of silica nanoparticle population through HAADF-STEM 通过haadf-stem对二氧化硅纳米粒子群体进行3D形态表征的新方法

MEASUREMENT

IF5.6

2021-08-01

OAAI

Crouzier, Loic; Pailloux, Frederic; Delvallee, Alexandra; Devoille, Laurent; Feltin, Nicolas; Tromas, Christophe

Deep Learning Based Instance Segmentation of Titanium Dioxide Particles in the Form of Agglomerates in Scanning Electron Microscopy 扫描电镜下基于深度学习的团聚体形式二氧化钛颗粒的实例分割

NANOMATERIALS

IF4.3

2021-04-09

OAAI

Monchot, Paul; Coquelin, Loic; Guerroudj, Khaled; Feltin, Nicolas; Delvallee, Alexandra; Crouzier, Loic; Fischer, Nicolas

Progress in Traceable Nanoscale Capacitance Measurements Using Scanning Microwave Microscopy

NANOMATERIALS

IF4.3

2021-03-23

OAAI

Piquemal, Francois; Moran-Meza, Jose; Delvallee, Alexandra; Richert, Damien; Kaja, Khaled

Characterization of aerosols and fibers emitted from composite materials combustion

JOURNAL OF HAZARDOUS MATERIALS

IF11.3

2016-01-01

OAAI

Chivas-Joly, C.; Gaie-Levrel, F.; Motzkus, C.; Ducourtieux, S.; Delvallee, A.; De lagos, F.; Le Neve, S.; Gutierrez, J.; Lopez-Cuesta, J. -M.

Anomalous dissipation mechanism and Hall quantization limit in polycrystalline graphene grown by chemical vapor deposition

PHYSICAL REVIEW B

IF3.7

2014-09-18

OAAI

Lafont, F.; Ribeiro-Palau, R.; Han, Z.; Cresti, A.; Delvallee, A.; Cummings, A. W.; Roche, S.; Bouchiat, V.; Ducourtieux, S.; Schopfer, F.; Poirier, W.

研究方向