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A

Ali Javey

Lawrence Berkeley National Laboratory
H指数:129
被引数:7.1万

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Dimensional Scaling Effect in Percolative Oxide Semiconductor Transistors

渗流氧化物半导体晶体管中的维度缩放效应

ACS Nano
IF16
2026-04-060
OA
Robert Tseng; Yi-Hou Kuo; Yi-Yu Pan; Zheng-Hong Li; Sung-Tsun Wang; Ciao-Fen Chen; Shun-Tsung Lo; Yu-Cheng Chan; Ya-Jing Wu; Shih-Chieh Chen; Cheng-Chen Kuo; Chun-Chen Wang; Cheng-Hsien Wu; Wen-Hsiang Lu; Xinyu Bao; Nguyen Thi Phuong Thao; Emi Minamitan; Ali Javey; Chun-Liang Lin; Der-Hsien Lien
Contemporary Challenges in van der Waals 2D Semiconductors

范德华二维半导体的当代挑战

ACS Nano
IF16
2026-01-190
PRE
Balakrishnan Kirubasankar; Ashok Mondal; Seok Joon Yun; Debottam Daw; Yongshan Xu; Lan-Anh T. Nguyen; Yeonjeong Koo; Kamal Kumar Paul; Heemyoung Hong; Hyeongwoo Lee; Yuting Luo; Kailang Liu; Naoki Higashitarumizu; Daniel Erkensten; Chang Yun Heo; Yu-Rim Jeon; Taemin Lee; Dae-Hyun Nam; Xinghui Liu; Soo Min Kim; Dinh Loc Duong; Qinke Wu; Deji Akinwande; Mark C. Hersam; Ali Javey; Ermin Malic; Bilu Liu; Tianyou Zhai; Heejun Yang; Kyoung-Duck Park; Ki Kang Kim; Young Hee Lee

研究方向

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M
Mark Hettick
H 指数:38论文数:62被引数:7,592
K
Kuniharu Takei
H 指数:61论文数:332被引数:2.1万
J
Joel W. Ager
H 指数:122论文数:911被引数:5.6万
D
Der‐Hsien Lien
H 指数:48论文数:147被引数:1.5万
Y
Yu‐Lun Chueh
H 指数:75论文数:576被引数:2.2万
R
Rehan Kapadia
H 指数:32论文数:139被引数:5,127
范智勇 封面图
范智勇
H 指数:96论文数:497被引数:3.1万
M
Matin Amani
H 指数:38论文数:84被引数:8,851
N
Naoki Higashitarumizu
H 指数:15论文数:68被引数:669
D
D. C. Chrzan
H 指数:46论文数:242被引数:8,106