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W

William A. Hubbard

nanoelectronic imaging inc

18H指数
130论文数
2.7K被引数
收录论文 30
发表时间
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Thermal Imaging of Self-Heated Cross-Sections via Mapping of Secondary Electron Emission Currents通过次级电子发射电流映射实现自加热截面的热成像
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errWilliam A Hubbard; B C Regan
err分享
err收藏
Assessing STEM-Based Electron Beam–Induced Current (STEM-EBIC) as a Correlative Probe of Interfacial Electronic Activity in Magnéli-Phase Oxide Thin Films评估基于STEM的电子束诱导电流（STEM-EBIC）作为Magnéli相氧化物薄膜界面电子活性的相关性探针
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errF E Camino; W A Hubbard; S Hwang; K Kisslinger; A Rúa
err分享
err收藏
STEM EBIC Imaging of Three-Terminal Devices三端器件的STEM EBIC成像
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errTristan P O’Neill; Yueyun Chen; Emmanuel Quezada; William A Hubbard; Suman Datta; B C Regan
err分享
err收藏
STEM EBIC Imaging of a Ferroelectric Field Effect Transistor (FeFET)透射电镜电子束诱导电流成像在铁电场效应晶体管(FeFET)中的应用
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errB C Regan; Tristan P O’Neill; Emmanuel Quezada; William A Hubbard; Suman Datta; Yueyun Chen
err分享
err收藏
Cross-Platform Preparation of Advanced-Node finFET Samples for STEM EBIC跨平台制备先进节点FinFET样品用于STEM EBIC
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errWilliam A Hubbard; Cecile Bonifacio; Heiko Stegmann; Gregory Johnson; Hyunhwa Kim; Yagiz Ince; Chih-Kong Ken Yang; B C Regan
err分享
err收藏
Multi-Modal Ion Beam Preparation of STEM EBIC Specimens: Delayering, FIB Milling, Concentrated Ar Ion Beam Polishing, and Dopant Contrast多模离子束制备STEM EBIC样品：分层、FIB铣削、高能Ar离子束抛光和掺杂剂对比
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errC S Bonifacio; W A Hubbard; P Nowakowski; R Li; M L Ray; P Fischione
err分享
err收藏
Investigating Thermal Depolarization and Repolarization of Ferroelectric HZO with In Situ TEM and STEM EBIC研究铁电HZO的热去极化和再极化现象：原位TEM和STEM EBIC表征
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errTristan P O’Neill; Yueyun Chen; Ho Leung Chan; Megan K Lenox; William A Hubbard; Jon F Ihlefeld; B C Regan
err分享
err收藏
A FIB-Based Circuit Edit Approach to TEM Sample Preparation of GaN Devices for STEM EBIC and Electrical Biasing Characterizations基于FIB的电路编辑方法用于GaN器件的TEM样品制备，以进行STEM EBIC和电偏置表征
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errLifang Hu; Sam Shichijo; William A Hubbard; B C Regan; M J Kim
err分享
err收藏
Revealing Preparation and Imaging-Induced Defects in Operando GaN HEMT Samples with STEM EBIC揭示原位GaN HEMT样品中制备和成像诱导缺陷的STEM EBIC研究
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errWilliam A Hubbard; B C Regan
err分享
err收藏
Electrode Grains Template Ferroelectric Domains in a Hafnia-Based Capacitor电极晶粒在铪基电容器中模板铁电畴
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errYueyun Chen; Tristan P O’Neill; Ho Leung Chan; Megan K Lenox; William A Hubbard; Jon F Ihlefeld; B C Regan
err分享
err收藏
SE For Free: Constructing Secondary Electron Images from Two-Channel STEM EBIC
errMicroscopy and Microanalysis
IF3
err2025-07-25
err0
errOAAI
errWilliam A Hubbard; B C Regan
err分享
err收藏
The Crucial Role of TEM Specimen Preparation in STEM EBIC Analysis of Advanced Semiconductor Devices
errMicroscopy and Microanalysis
IF3
err2025-07-25
err0
PREAI
errC S Bonifacio; W Hubbard; R Li; M L Ray; P Fischione
err分享
err收藏
Annealing Optimization for HZO Thin Films with In-Situ STEM EBIC Characterization
errMicroscopy and Microanalysis
IF3
err2025-07-25
err0
PREAI
errYueyun Chen; Ho Leung Chan; Tristan P O’Neill; Megan K Lenox; William A Hubbard; Jon F Ihlefeld; B C Regan
err分享
err收藏
Mapping Ferroelectric Fields Reveals the Origins of the Coercivity Distribution
errACS NANO
IF16
err2024-07-17
err0
errOAAI
errChan, Ho Leung; Fields, Shelby S.; Chen, Yueyun; O'Neill, Tristan P.; Lenox, Megan K.; Hubbard, William A.; Ihlefeld, Jon F.; Regan, Brian C.
err分享
err收藏
InAsP Quantum Dot-Embedded InP Nanowires toward Silicon Photonic Applications面向硅光子应用的InAsP量子点嵌入式InP纳米线
errACS APPLIED MATERIALS & INTERFACES
IF8.2
err2022-02-17
err9
PREAI
errChang, Ting-Yuan; Kim, Hyunseok; Hubbard, William A.; Azizur-Rahman, Khalifa M.; Ju, Jung Jin; Kim, Je-Hyung; Lee, Wook-Jae; Huffaker, Diana
err分享
err收藏
Visualizing the Electron Wind Force in the Elastic Regime
errNANO LETTERS
IF9.1
err2021-12-05
err16
errOAAI
errMecklenburg, Matthew; Zutter, Brian T.; Ling, Xin Yi; Hubbard, William A.; Regan, B. C.
err分享
err收藏
Mapping Charge Recombination and the Effect of Point-Defect Insertion in GaAs Nanowire Heterojunctions
errPHYSICAL REVIEW APPLIED
IF4.4
err2021-10-18
err2
PREAI
errZutter, Brian T.; Kim, Hyunseok; Hubbard, William A.; Ren, Dingkun; Mecklenburg, Matthew; Huffaker, Diana; Regan, B. C.
err分享
err收藏
Imaging Dielectric Breakdown in Valence Change Memory
errADVANCED FUNCTIONAL MATERIALS
IF19
err2021-09-30
err9
errOAAI
errHubbard, William A.; Lodico, Jared J.; Chan, Ho Leung; Mecklenburg, Matthew; Regan, Brian C.
err分享
err收藏
Electron-Transparent Thermoelectric Coolers Demonstrated with Nanoparticle and Condensation Thermometry
errACS NANO
IF16
err2020-08-04
err12
PREAI
errHubbard, William A.; Mecklenburg, Matthew; Lodico, Jared J.; Chen, Yueyun; Ling, Xin Yi; Patil, Roshni; Kessel, W. Andrew; Flatt, Graydon J. K.; Chan, Ho Leung; Vareskic, Bozo; Bal, Gurleen; Zutter, Brian; Regan, B. C.
err分享
err收藏
Irreversibility at macromolecular scales in the flake graphite of the lithium-ion battery anode锂离子电池阳极的片状石墨在大分子尺度上的不可逆性
errJOURNAL OF POWER SOURCES
IF7.9
err2019-10-01
err19
errOAAI
errLodico, Jared J.; Lai, Chun-Han; Woodall, Mark; Chan, Ho Leung; Garcia, Erick; Hubbard, William A.; Dunn, Bruce; Regan, B. C.
err分享
err收藏

研究方向

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