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Alexander L. Shluger

University College London

65H指数
433论文数
1.8W被引数
收录论文 165
发表时间
Mesoscopic Modeling of Structure-Transport Relationships in Dense CNT Films Containing Amorphous Carbon致密碳纳米管薄膜中含无定形碳的结构-传输关系介观建模
err2026-04-26
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PREAI
errYvelin Giret; Filippo Federici Canova; Al-Moatasem El-Sayed; Thomas R. Durrant; Rahul Sen; Harry Luan; Gennadi Bersuker; Alexander L. Shluger; David Z. Gao
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Structure and Dynamics of Water Confined at the SiO2/WS2 Interface
err2025-02-17
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PREAI
errMilton, Katherine L.; Hargreaves, Laura; Shluger, Alexander
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Electron Ptychography for Atom-by-Atom Quantification of 1D Defect Complexes in Monolayer MoS2电子ptychography用于单层MoS2中一维缺陷复合体的逐原子定量分析
err2025-02-07
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PREAI
errLoh, L; Ning, SC; Kieczka, D; Chen, Y; Yang, JM; Wang, Z; Pennycook, SJ; Eda, G; Shluger, AL; Bosman, M
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Electronic structure and properties of trapped holes in crystalline and amorphous Ga2O3
err2025-01-21
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PREAI
errKaewmeechai, Chaiyawat; Strand, Jack; Shluger, Alexander
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Reactions of Hydrogen-Passivated Silicon Vacancies in α-Quartz with Electron Holes and Hydrogen
err2025-01-19
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errOAAI
errFreire, Teofilo Cobos; Strand, Jack; Shluger, Alexander L.
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Unveiling surface dynamics: in situ oxidation of defective WS2揭示表面动力学:缺陷WS2的原位氧化
err2025-01-01
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errOAAI
errKieczka, Daria; Bussolotti, Fabio; Maddumapatabandi, Thathsara D.; Bosman, Michel; Shluger, Alexander
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Dielectric breakdown of oxide films in electronic devices (vol 9, pg 607, 2024)
err2024-10-30
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PREAI
errPadovani, Andrea; La Torraca, Paolo; Strand, Jack; Larcher, Luca; Shluger, Alexander L.
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Dielectric breakdown of oxide films in electronic devices电子器件中氧化膜的介电击穿
err2024-08-07
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PREAI
errPadovani, Andrea; La Torraca, Paolo; Strand, Jack; Larcher, Luca; Shluger, Alexander L.
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Electron emission from deep traps in HfO 2 under thermal and optical excitation
err2024-04-17
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errOAAI
errIzmailov, Roman; Strand, Jack; Ronchi, Nicolo; Shluger, Alexander; Afanas'ev, Valeri
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Modeling the Effects of Varying the Ti Concentration on the Mechanical Properties of Cu-Ti Alloys
err2024-02-19
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errOAAI
errFotopoulos, Vasileios; O'Hern, Corey S.; Shattuck, Mark D.; Shluger, Alexander L.
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Structure and Migration Mechanisms of Small Vacancy Clusters in Cu: A Combined EAM and DFT StudyCu中小空位团簇的结构和迁移机制: EAM和DFT的联合研究
err2023-04-25
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errOAAI
errFotopoulos, Vasileios; Mora-Fonz, David; Kleinbichler, Manuel; Bodlos, Rishi; Kozeschnik, Ernst; Romaner, Lorenz; Shluger, Alexander L.
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Difference in Structure and Electronic Properties of Oxygen Vacancies in α-Quartz and α-Cristobalite Phases of SiO2
err2023-02-07
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errOAAI
errMilton, Katherine L.; Durrant, Thomas R.; Cobos Freire, Teofilo; Shluger, Alexander L.
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Unique Atomic and Electronic Structures of Oxygen Vacancies in Amorphous SnO2 from First Principles and Informatics
err2022-11-01
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PREAI
errKiyohara, Shin; Mora-Fonz, David; Shluger, Alexander; Kumagai, Yu; Oba, Fumiyasu
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Energies and structures of Cu/Nb and Cu/W interfaces from density functional theory and semi-empirical calculations
err2022-03-01
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errOAAI
errBodlos, R.; Fotopoulos, V; Spitaler, J.; Shluger, A. L.; Romaner, L.
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The nature of column boundaries in micro-structured silicon oxide nanolayers
err2021-12-08
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errOAAI
errPatel, K.; Cottom, J.; Mehonic, A.; Ng, W. H.; Kenyon, A. J.; Bosman, M.; Shluger, A. L.
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Ultrasensitive hydrogen detection by electrostatically formed silicon nanowire decorated by palladium nanoparticles
err2021-11-01
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errOAAI
errMukherjee, Anwesha; Gnaim, Mohamad; Tov, Idan Shem; Hargreaves, Laura; Hayon, Joseph; Shluger, Alexander; Rosenwaks, Yossi
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