Michael Kolbe - Publications, H-index & Citations

Michael Kolbe

physikalisch-technische bundesanstalt (ptb)

18H指数

107论文数

1.3K被引数

收录论文 16

发表时间

Experimental determination of the oxygen K-shell fluorescence yield using thin SiO2 and Al2O3 foils

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY

IF3.8

2016-10-01

PREAI

Hoenicke, P.; Kolbe, M.; Krumrey, M.; Unterumsberger, R.; Beckhoff, B.

Program for catenary-pantograph analysis, PrOSA statement of methods and validation according EN 50318

VEHICLE SYSTEM DYNAMICS

IF3.9

2014-10-28

PREAI

Finner, Lars; Poetsch, Gero; Sarnes, Bernhard; Kolbe, Michael

Reference-free quantification of particle-like surface contaminations by grazing incidence X-ray fluorescence analysis

JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY

IF3.1

2012-01-01

PREAI

Reinhardt, Falk; Osan, Janos; Torok, Szabina; Pap, Andrea Edit; Kolbe, Michael; Beckhoff, Burkhard

Atomic Layer Deposition of High-κ Dielectrics on Sulphur-Passivated Germanium

JOURNAL OF THE ELECTROCHEMICAL SOCIETY

IF3.3

2011-01-01

OAAI

Sioncke, S.; Lin, H. C.; Brammertz, G.; Delabie, A.; Conard, T.; Franquet, A.; Meuris, M.; Struyf, H.; De Gendt, S.; Heyns, M.; Fleischmann, C.; Temst, K.; Vantomme, A.; Muller, M.; Kolbe, M.; Beckhoff, B.; Caymax, M.

Towards Passivation of Ge(100) Surfaces by Sulfur Adsorption from a (NH4)2S Solution: A Combined NEXAFS, STM and LEED Study

JOURNAL OF THE ELECTROCHEMICAL SOCIETY

IF3.3

2011-01-01

PREAI

Fleischmann, C.; Sioncke, S.; Couet, S.; Schouteden, K.; Beckhoff, B.; Mueller, M.; Hoenicke, P.; Kolbe, M.; Van Haesendonck, C.; Meuris, M.; Temst, K.; Vantomme, A.

Depth profile characterization of ultra shallow junction implants

ANALYTICAL AND BIOANALYTICAL CHEMISTRY

IF3.8

2009-11-26

PREAI

Hoenicke, Philipp; Beckhoff, Burkhard; Kolbe, Michael; Giubertoni, Damiano; van den Berg, Jaap; Pepponi, Giancarlo

Depth-profiling of vertical sidewall nanolayers on structured wafers by grazing incidence X-ray fluorescence (vol 63, pg 1359, 2008)

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY

IF3.8

2009-03-01

OAAI

Hoenicke, P.; Beckhoff, B.; Kolbe, M.; List, S.; Conard, T.; Struyff, H.

Evaluation of High-Resolution X-ray Absorption and Emission Spectroscopy for the Chemical Speciation of Binary Titanium Compounds

ANALYTICAL CHEMISTRY

IF6.7

2009-02-09

PREAI

Reinhardt, F.; Beckhoff, B.; Eba, H.; Kanngiesser, B.; Kolbe, M.; Mizusawa, M.; Mueller, M.; Pollakowski, B.; Sakurai, K.; Ulm, G.

Depth-profiling of vertical sidewall nanolayers on structured wafers by grazing incidence X-ray flourescence

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY

IF3.8

2008-12-01

PREAI

Hoenicke, P.; Beckhoff, B.; Kolbe, M.; List, S.; Conard, T.; Struyff, H.

Nondestructive characterization of nanoscale layered samples

ANALYTICAL AND BIOANALYTICAL CHEMISTRY

IF3.8

2008-11-08

PREAI

Baake, Olaf; Hoffmann, Peter S.; Flege, Stefan; Ortner, Hugo M.; Gottschalk, Sebastian; Berky, Wolfram; Balogh, Adam G.; Ensinger, Wolfgang; Beckhoff, Burkhard; Kolbe, Michael; Gerlach, Martin; Pollakowski, Beatrix; Weser, Jan; Ulm, Gerhard; Haschke, Michael; Blokhina, Elena; Peter, Markus; Porta, Dominique; Heck, Martin

Measuring and Interpreting X-ray Fluorescence from Planetary Surfaces

ANALYTICAL CHEMISTRY

IF6.7

2008-10-15

PREAI

Owens, Alan; Beckhoff, Burkhard; Fraser, George; Kolbe, Michael; Krumrey, Michael; Mantero, Alfonso; Mantler, Michael; Peacock, Anthony; Pia, Maria-Grazia; Pullan, Derek; Schneider, Uwe G.; Ulms, Gerhard

Reference-free total reflection X-ray fluorescence analysis of semiconductor surfaces with synchrotron radiation

ANALYTICAL CHEMISTRY

IF6.7

2007-09-20

131

PREAI

Beckhoff, Burkhard; Fliegauf, Rolf; Kolbe, Michael; Mueller, Matthias; Weser, Jan; Ulm, Gerhard

Detector calibration and measurement of fundamental parameters for X-ray spectrometry

MICROCHIMICA ACTA

IF5.3

2006-05-04

PREAI