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Patrick Girard

centre national de la recherche scientifique (cnrs)

43H指数
814论文数
7.8K被引数
收录论文 20
发表时间
FN2LD: FeFET-based nonvolatile and node-upset-recovery latch designs with cost optimizationFN2LD: 基于FeFET的非易失性及节点翻转恢复锁存器设计,具有成本优化
err2025-11-01
err0
PREAI
errYan, Aibin; Jiang, Wangjin; Wang, Haotian; Kang, Biying; Huang, Zhengfeng; Ni, Tianming; Wen, Xiaoqing; Girard, Patrick
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FeMPIM: A FeFET-Based Multifunctional Processing-in-Memory Cell
err2024-04-01
err41
PREAI
errYan, Aibin; Chen, Yu; Gao, Zhongyu; Ni, Tianming; Huang, Zhengfeng; Cui, Jie; Girard, Patrick; Wen, Xiaoqing
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Two Double-Node-Upset-Hardened Flip-Flop Designs for High-Performance Applications
err2023-10-01
err43
errOAAI
errYan, Aibin; Cao, Aoran; Huang, Zhengfeng; Cui, Jie; Ni, Tianming; Girard, Patrick; Wen, Xiaoqing; Zhang, Jiliang
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A ReRAM-Based Non-Volatile and Radiation-Hardened Latch Design
err2022-10-22
err2
errOAAI
errYan, Aibin; Wei, Shaojie; Chen, Yu; Fan, Zhengzheng; Huang, Zhengfeng; Cui, Jie; Girard, Patrick; Wen, Xiaoqing
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MATISSE, the VLTI mid-infrared imaging spectro-interferometer
err2022-03-28
err64
errOAAI
errLopez, B.; Lagarde, S.; Petrov, R. G.; Jaffe, W.; Antonelli, P.; Allouche, F.; Berio, P.; Matter, A.; Meilland, A.; Millour, F.; Robbe-Dubois, S.; Henning, Th; Weigelt, G.; Glindemann, A.; Agocs, T.; Bailet, Ch; Beckmann, U.; Bettonvil, F.; van Boekel, R.; Bourget, P.; Bresson, Y.; Bristow, P.; Cruzalebes, P.; Eldswijk, E.; Caujolle, Y. Fantei; Herrera, J. C. Gonzalez; Graser, U.; Guajardo, P.; Heininger, M.; Hofmann, K-H; Kroes, G.; Laun, W.; Lehmitz, M.; Leinert, C.; Meisenheimer, K.; Morel, S.; Neumann, U.; Paladini, C.; Percheron, I; Riquelme, M.; Schoeller, M.; Stee, Ph; Venema, L.; Woillez, J.; Zins, G.; Abraham, P.; Abadie, S.; Abuter, R.; Accardo, M.; Adler, T.; Alonso, J.; Augereau, J-C; Boehm, A.; Bazin, G.; Beltran, J.; Bensberg, A.; Boland, W.; Brast, R.; Burtscher, L.; Castillo, R.; Chelli, A.; Cid, C.; Clausse, J-M; Connot, C.; Conzelmann, R. D.; Danchi, W-C; Delbo, M.; Drevon, J.; Dominik, C.; van Duin, A.; Ebert, M.; Eisenhauer, F.; Flament, S.; Frahm, R.; Rosas, V. Gamez; Gabasch, A.; Gallenne, A.; Garces, E.; Girard, P.; Glazenborg, A.; Gonte, F. Y. J.; Guitton, F.; de Haan, M.; Hanenburg, H.; Haubois, X.; Hocde, V; Hogerheijde, M.; ter Horst, R.; Hron, J.; Hummel, C. A.; Hubin, N.; Huerta, R.; Idserda, J.; Isbell, J. W.; Ives, D.; Jakob, G.; Jasko, A.; Jochum, L.; Klarmann, L.; Klein, R.; Kragt, J.; Kuindersma, S.; Kokoulina, E.; Labadie, L.; Lacour, S.; Leftley, J.; Le Poole, R.; Lizon, J-L; Lopez, M.; Lykou, F.; Merand, A.; Marcotto, A.; Mauclert, N.; Maurer, T.; Mehrgan, L. H.; Meisner, J.; Meixner, K.; Mellein, M.; Menut, J. L.; Mohr, L.; Mosoni, L.; Navarro, R.; Nussbaum, E.; Pallanca, L.; Pantin, E.; Pasquini, L.; Duc, T. Phan; Pott, J-U; Pozna, E.; Richichi, A.; Ridinger, A.; Rigal, F.; Rivinius, Th; Roelfsema, R.; Rohloff, R-R; Rousseau, S.; Salabert, D.; Schertl, D.; Schuhler, N.; Schuil, M.; Shabun, K.; Soulain, A.; Stephan, C.; Toledo, P.; Tristram, K.; Tromp, N.; Vakili, F.; Varga, J.; Vinther, J.; Waters, L. B. F. M.; Wittkowski, M.; Wolf, S.; Wrhel, F.; Yoffe, G.
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Novel Quadruple-Node-Upset-Tolerant Latch Designs With Optimized Overhead for Reliable Computing in Harsh Radiation Environments
err2022-01-01
err65
errOAAI
errYan, Aibin; Xu, Zhelong; Feng, Xiangfeng; Cui, Jie; Chen, Zhili; Ni, Tianming; Huang, Zhengfeng; Girard, Patrick; Wen, Xiaoqing
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A Survey of Test and Reliability Solutions for Magnetic Random Access Memories磁随机存取存储器的测试和可靠性解决方案综述
err2021-02-01
err28
errOAAI
errGirard, Patrick; Cheng, Yuanqing; Virazel, Arnaud; Zhao, Weisheng; Bishnoi, Rajendra; Tahoori, Mehdi B.
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A Survey of Testing Techniques for Approximate Integrated Circuits近似集成电路测试技术综述
err2020-12-01
err18
errOAAI
errTraiola, Marcello; Virazel, Arnaud; Girard, Patrick; Barbareschi, Mario; Bosio, Alberto
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Novel Speed-and-Power-Optimized SRAM Cell Designs With Enhanced Self-Recoverability From Single- and Double-Node Upsets
err2020-12-01
err59
errOAAI
errYan, Aibin; Chen, Yan; Hu, Yuanjie; Zhou, Jun; Ni, Tianming; Cui, Jie; Girard, Patrick; Wen, Xiaoqing
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Information Assurance Through Redundant Design: A Novel TNU Error-Resilient Latch for Harsh Radiation Environment
err2020-06-01
err85
PREAI
errYan, Aibin; Hu, Yuanjie; Cui, Jie; Chen, Zhili; Huang, Zhengfeng; Ni, Tianming; Girard, Patrick; Wen, Xiaoqing
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Quadruple Cross-Coupled Dual-Interlocked-Storage-Cells-Based Multiple-Node-Upset-Tolerant Latch Designs
err2020-03-01
err46
PREAI
errYan, Aibin; Ling, Yafei; Cui, Jie; Chen, Zhili; Huang, Zhengfeng; Song, Jie; Girard, Patrick; Wen, Xiaoqing
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Novel Quadruple Cross-Coupled Memory Cell Designs With Protection Against Single Event Upsets and Double-Node Upsets
err2019-01-01
err27
errOAAI
errYan, Aibin; Zhou, Jun; Hu, Yuanjie; Cui, Jie; Huang, Zhengfeng; Girard, Patrick; Wen, Xiaoqing
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Scan-Chain Intra-Cell Aware Testing
err2018-04-01
err4
PREAI
errTouati, Aymen; Bosio, Alberto; Girard, Patrick; Virazel, Arnaud; Bernardi, Paolo; Reorda, Matteo Sonza; Auvray, Etienne
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Group and phase delay sensing for cophasing large optical arrays
err2014-10-15
err21
errOAAI
errMourard, D.; Ali, W. Dali; Meilland, A.; Tarmoul, N.; Patru, F.; Clausse, J. M.; Girard, P.; Henault, F.; Marcotto, A.; Mauclert, N.
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A Comprehensive Framework for Logic Diagnosis of Arbitrary Defects
err2010-03-01
err12
PREAI
errBosio, Alberto; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud
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