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收藏Deep insights into the mechanism of nitrogen on the endurance enhancement in ferroelectric field effect transistors: Trap behavior during memory window degradation
Huang, Yuanquan; Yuan, Hongye; Nie, Bowen; Gong, Tiancheng; Wang, Yuan; Lv, Shuxian; Jiang, Pengfei; Wei, Wei; Yang, Yang; Chai, Junshuai; Wu, Zhicheng; Wang, Xiaolei; Luo, Qing
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收藏Trap characteristics of hafnium oxide-based ferroelectric field-effect transistors measured by using a current transient method
Li, Yilin; Zhu, Hui; Liu, Xing; Wang, Xiaolei; Xu, Hao; Pan, Shijie; Xiang, Jinjuan; Zhou, Lixing; Yao, Zhiwen; Sun, Yerong; Feng, Shiwei
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收藏Advanced process and electron device technology
Zhang, Dan; Su, Xiaojing; Chang, Hao; Xu, Hao; Wang, Xiaolei; He, Xiaobin; Li, Junjie; Zhao, Fei; Yao, Qide; Luo, Yanna; Ma, Xueli; Yang, Hong; Li, Yongliang; Wu, Zhenhua; Su, Yajuan; Yang, Tao; Wei, Yayi; Du, Anyan; Zhu, Huilong; Li, Junfeng; Yin, Huaxiang; Luo, Jun; Ye, Tianchun; Wang, Wenwu
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收藏Thermodynamic driving force of transient negative capacitance of ferroelectric capacitors
Zhang, Yuanyuan; Sun, Xiaoqing; Chai, Junshuai; Xu, Hao; Ma, Xueli; Xiang, Jinjuan; Han, Kai; Wang, Xiaolei; Wang, Wenwu; Ye, Tianchun
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收藏Experimental study of the ultrathin oxides on SiGe alloy formed by low-temperature ozone oxidation
Ma, Xueli; Wang, Xiaolei; Zhou, Lixing; Xu, Hao; Zhang, Yuanyuan; Duan, Jiahui; Xiang, Jinjuan; Yang, Hong; Li, Junjie; Li, Yongliang; Yin, Huaxiang; Wang, Wenwu
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收藏Identification of a suitable passivation route for high-k/SiGe interface based on ozone oxidation
Ma, Xueli; Zhou, Lixing; Xiang, Jinjuan; Yang, Hong; Wang, Xiaolei; Li, Yongliang; Zhang, Jing; Zhao, Chao; Yin, Huaxiang; Wang, Wenwu; Ye, Tianchun
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收藏Reexamination of band offset transitivity employing oxide heterojunctions
Wang, Xiaolei; Xiang, Jinjuan; Wang, Wenwu; Zhang, Jing; Han, Kai; Yang, Hong; Ma, Xueli; Zhao, Chao; Chen, Dapeng; Ye, Tianchun
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