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Advanced process and electron device technology

delete2022-06-01
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OA
AI
D
Dan Zhang
X
Xiaojing Su
H
Hao Chang
许
许浩 (Hao Xu)
王
王小磊 (Xiaolei Wang)
X
Xiaobin He
李俊杰 封面图
李俊杰 (Junjie Li)
F
Fei Zhao
Q
Qide Yao
Y
Yanna Luo
X
Xueli Ma
H
Hong Yang
Y
Yongliang Li
Z
Zhenhua Wu
S
SU Ya-juan
T
Tao Yang
Y
Yayi Wei
A
Anyan Du
H
Huilong Zhu
李峻峰 封面图
李峻峰 (Junfeng Li)
H
Huaxiang Yin
罗
罗俊 (Jun Luo)
T
Tianchun Ye
W
Wenwu Wang *
DOI:10.26599/TST.2021.9010049delete
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摘要

摘要

En 中文
This article reviews advanced process and electron device technology of integrated circuits, including recent featuring progress and potential solutions for future development. In 5 years, for pushing the performance of fin field-effect transistors (FinFET) to its limitations, several processes and device boosters are provided. Then, the three-dimensional (3D) integration schemes with alternative materials and device architectures will pave paths for future technology evolution. Finally, it could be concluded that Moore's law will undoubtedly continue in the next 15 years.
Keyword:
advanced process
gate-all-around devices
three-dimensional (3D) integration
high-mobility channel
integrated circuits

期刊

T
Tsinghua Science and Technology
IF:
3.5
论文数:
987
被引数:
2.5K

机构

C
chinese academy of sciences
学者数:
56.7W
论文数: 45.0W
被引数: 704
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