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张祥朝 封面图

张祥朝 (Xiangchao Zhang)

fudan university

19H指数
155论文数
1.3K被引数
收录论文 56
发表时间
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Anti-Ambipolar Transistor Based on Van Der Waals Heterostructure Enables Gate-Programmable Rectification基于范德华异质结构的抗双极晶体管实现了门控可编程整流
errAdvanced Functional Materials
IF19
err2026-07-31
err0
PREAI
errJiao Qi; Hong Zhou; Xuanbo Zhao; Weiqi Shi; Weibo Duan; Zhiping Zhang; Xiangchao Zhang; Yuxiang Zheng; Rongjun Zhang
err分享
err收藏
Phase measuring deflectometry based on shearing wavefront error matching基于剪切波前误差匹配的相测量偏折术
errOptics and Lasers in Engineering
IF3.7
err2026-07-10
err0
PREAI
errPeng Chen; Yunjie Wu; Xinying Fan; Mingyu Liu; Lingbao Kong; Xiangchao Zhang; Kai Xu; Shixiang Wang
err分享
err收藏
High-Sensitivity Defect Inspection for Unpatterned Wafers via Integrating Dark-Field Scattering and Diffraction Phase Microscopy高灵敏度无图形晶圆缺陷检测：通过集成暗场散射与衍射相位显微镜
errSensors
IF3.5
err2026-02-15
err0
errOAAI
errXiangchao Zhang; Qianru Zheng; Di Li; Ruifang Ye
err分享
err收藏
Stress Measurement and Defect Identification of Optical Components Based on Digital Holographic Photoelasticity基于数字全息光弹法的光学元件应力测量与缺陷识别
errNANOMANUFACTURING AND METROLOGY
IF0
err2025-09-25
err0
errOAAI
errHu, Dongyang; Zheng, Qianru; Wang, Chen; Zhang, Xiangchao
err分享
err收藏
Enhancing the efficiency and determinacy of in-situ monoscopic phase measuring deflectometry by Bayesian approach
errPRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY
IF3.7
err2025-04-01
err0
PREAI
errChen, Yunuo; Lang, Wei; Chen, Ting; Niu, Xingman; Zhang, Xiangchao
err分享
err收藏
Design and Calibration of a Slit Light Source for Infrared Deflectometry
errSENSORS
IF3.5
err2025-02-05
err0
errOAAI
errYe, Lu; Zhang, Xiangchao; Xu, Min; Wang, Wei
err分享
err收藏
Polypyrrol/iron-manganese oxide/graphene oxide composites as electrode materials for supercapacitors based on core-shell layered structure
errJOURNAL OF MATERIALS SCIENCE
IF3.9
err2025-01-21
err1
PREAI
errFu, Yue; Dong, Yangyang; Zhang, Xiangchao; Niu, Haijun; Qin, Chuanli; Jiang, Xiankai
err分享
err收藏
Nontrivial impact of interlayer coupling on thermal conductivity: Opposing trends in in-plane and out-of-plane phonons
errPHYSICAL REVIEW B
IF3.7
err2024-12-06
err1
PREAI
errFeng, H. F.; Liu, B.; Bai, J. L.; Zhang, X.; Song, Z. X.; Guo, Zhi-Xin
err分享
err收藏
Precision Optical Metrology and Smart Sensing
errSENSORS
IF3.5
err2024-10-23
err0
errOAAI
errZhang, Xiangchao; Wang, Jian; Wang, Yajun
err分享
err收藏
Innovative Core-Shell Tubular Structure in Polymer/Manganese-Nickel Oxide/Carbon Nanotube Blends for Electrochemical Components
errJOURNAL OF POLYMER SCIENCE
IF3.6
err2024-10-15
err0
errOAAI
errFu, Yue; Dong, Yangyang; Zhang, Xiangchao; Niu, Haijun; Qin, Chuanli; Jiang, Xiankai
err分享
err收藏
Recognition and separation of fringe patterns in deflectometric measurement of transparent elements based on empirical curvelet transform
errMEASUREMENT
IF5.6
err2024-09-01
err0
PREAI
errYang, Peide; Chen, Ting; Wang, Dongfang; Ye, Lu; Chen, Yunuo; Lang, Wei; Zhang, Xiangchao
err分享
err收藏
Separation of fringe patterns in fast deflectometric measurement of transparent optical elements based on neural network-assisted fast iterative filtering method
errADVANCES IN MANUFACTURING
IF3.8
err2024-07-04
err1
PREAI
errChen, Ting; Yang, Pei-De; Zhang, Xiang-Chao; Lang, Wei; Chen, Yu-Nuo; Xu, Min
err分享
err收藏
Coherent amplitude modulation of continuous-wave light in cesium vapor
errOPTICS LETTERS
IF3.3
err2024-06-04
err0
errOAAI
errZhang, X.; Kim, J. B.; Antypas, D.
err分享
err收藏
Simplifying the monoscopic deflectometric measurement by extra-facility-free workpiece positioning
errPRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY
IF3.7
err2024-05-01
err1
PREAI
errChen, Yunuo; Zhang, Xiangchao; Lang, Wei; Chen, Ting; Hu, Zhifei; Jiang, Xiangqian
err分享
err收藏
Aluminum scandium nitride on 8-inch Si wafers: material characterization and photonic device demonstration
errOPTICS EXPRESS
IF3.3
err2024-04-29
err4
errOAAI
errXiong, Zixin; Zhang, Xiangchao; Li, Zhenyu; Liu, Iaofei; Qiu, Yang; Zhao, Xingyan; Zheng, Shaonan; Zhong, Qize; Dong, Yuan; Hu, Ting
err分享
err收藏
Adaptive coded phase mask design and high-quality image reconstruction for interference-less coded aperture correlation holography
errOPTICS EXPRESS
IF3.3
err2024-03-21
err0
errOAAI
errXiong, Rui; Zhang, Xiangchao; Ma, Xinyang; Li, Leheng; Ni, Zhanghao; Jiang, Xiangqian
err分享
err收藏
Holistic calibration method of deflectometry by holonomic framework priors
errOPTICS LETTERS
IF3.3
err2024-01-30
err1
PREAI
errLang, Wei; Zhang, Xiangchao; Chen, Yunuo; Chen, Ting; Jiang, Xiangqian
err分享
err收藏
Fast, intelligent and high-precision adaptive null interferometry for optical freeform surfaces by backpropagation
errOPTICS EXPRESS
IF3.3
err2024-01-12
err0
errOAAI
errLu, Qi; Gong, Weichao; Sun, Ying; Wang, Weiwei; Zhang, Xu; Wang, Peili; Ding, Yifan; Wang, Wei; Liu, Shijie; Zhang, Xiangchao; Xu, Min; Shao, Jianda
err分享
err收藏
In-situ sub-aperture stitching measurement based on monoscopic phase measuring deflectometry
errPRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY
IF3.7
err2024-01-01
err4
errOAAI
errChen, Ting; Chen, Yunuo; Lang, Wei; Zhang, Xiangchao; Wang, Wei; Xu, Min
err分享
err收藏
Flexible Measurement of High-Slope Micro-Nano Structures with Tilted Wave Digital Holographic Microscopy
errSENSORS
IF3.5
err2023-11-30
err2
errOAAI
errMa, Xinyang; Xiong, Rui; Wang, Wei; Zhang, Xiangchao
err分享
err收藏

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合作期刊
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