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X. Perpiñà

Institute of Microelectronics of Barcelona

22H指数
130论文数
4.3K被引数
收录论文 35
发表时间
Impact of Si ion implantation on α-Ga2O3 and β-Ga2O3 lateral MESFET transistorsSi离子注入对α-Ga₂O₃和β-Ga₂O₃横向MESFET晶体管的影响
err2026-09-17
err0
errOAAI
errAniol Vellvehí; Pierre Gallarday; Edgars Butanovs; Vincent Sallet; José Rebollo; Josep Montserrat; Edvards Strods; Martins Zubkins; Lauris Dimitrocenko; Corine Sartel; Ekaterine Chikoidze; Xavier Perpiña; Miquel Vellvehi; Amador Pérez-Tomás
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Physics-Based Strategies for Fast TDDB Testing and Lifetime Estimation in SiC Power MOSFETs
err2024-05-01
err3
PREAI
errAvino-Salvado, Oriol; Buttay, Cyril; Bonet, Ferran; Raynaud, Christophe; Bevilacqua, Pascal; Rebollo, Jose; Morel, Herve; Perpina, Xavier
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Local Thermal Resistance Extraction in Monolithic Microwave Integrated Circuits
err2021-12-01
err7
errOAAI
errVellvehi, Miquel; Perpina, Xavier; Leon, Javier; Avino-Salvado, Oriol; Ferrer, Conrad; Jorda, Xavier
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Origin of large negative electrocaloric effect in antiferroelectric PbZrO3
err2021-02-22
err54
errOAAI
errVales-Castro, Pablo; Faye, Romain; Vellvehi, Miquel; Nouchokgwe, Youri; Perpina, Xavier; Caicedo, J. M.; Jorda, Xavier; Roleder, Krystian; Kajewski, Dariusz; Perez-Tomas, Amador; Defay, Emmanuel; Catalan, Gustau
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BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF Circuits基于BPF的热传感器电路,用于RF电路的片上测试
errSENSORS
IF3.5
err2021-01-26
err2
errOAAI
errAltet, Josep; Barajas, Enrique; Mateo, Diego; Billong, Alexandre; Aragones, Xavier; Perpina, Xavier; Reverter, Ferran
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Power Losses and Current Distribution Studies by Infrared Thermal Imaging in Soft- and Hard-Switched IGBTs Under Resonant Load
err2020-05-01
err14
errOAAI
errFernandez, Manuel; Perpina, Xavier; Vellvehi, Miquel; Avino-Salvado, Oriol; Llorente, Sergio; Jorda, Xavier
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Output Power and Gain Monitoring in RF CMOS Class A Power Amplifiers by Thermal Imaging
err2019-08-01
err9
errOAAI
errPerpina, Xavier; Reverter, Ferran; Leon, Javier; Barajas, Enrique; Vellvehi, Miquel; Jorda, Xavier; Altet, Josep
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Thermal Management Strategies for Low- and High-Voltage Retrofit LED Lamp Drivers
err2019-04-01
err6
errOAAI
errPerpina, Xavier; Vellvehi, Miquel; Werkhoven, Robert J.; Jakovenko, Jiri; Kunen, Jos M. G.; Bancken, Peter; Bolt, Pieter J.; Jorda, Xavier
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Short-Circuit Study in Medium-Voltage GaN Cascodes, p-GaN HEMTs, and GaN MISHEMTs中压GaN共源共栅,p-gan hemt和GaN mishemt中的短路研究
err2017-11-01
err68
PREAI
errFernandez, Manuel; Perpina, Xavier; Roig-Guitart, Jaume; Vellvehi, Miquel; Bauwens, Filip; Tack, Marnix; Jorda, Xavier
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Single-MOSFET DC thermal sensor for RF-amplifier central frequency extraction用于射频放大器中心频率提取的单MOSFET直流热传感器
err2017-09-01
err3
errOAAI
errReverter, Ferran; Perpina, Xavier; Barajas, Enrique; Leon, Javier; Vellvehi, Miguel; Jorda, Xavier; Altet, Josep
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Thermal phase lag heterodyne infrared imaging for current tracking in radio frequency integrated circuits
err2017-02-27
err4
errOAAI
errPerpina, X.; Leon, J.; Altet, J.; Vellvehi, M.; Reverter, F.; Barajas, E.; Jorda, X.
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MOSFET dynamic thermal sensor for IC testing applications
err2016-05-01
err9
errOAAI
errReverter, Ferran; Perpina, Xavier; Barajas, Enrique; Leon, Javier; Vellvehi, Miquel; Jorda, Xavier; Altet, Josep
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Thermal Analysis of LED Lamps for Optimal Driver Integration
err2015-07-01
err19
PREAI
errPerpina, Xavier; Werkhoven, Robert J.; Vellvehi, Miquel; Jakovenko, Jiri; Jorda, Xavier; Kunen, Jos M. G.; Bancken, Peter; Bolt, Pieter J.
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Study of heat sources interacting in integrated circuits by laser mirage effect
err2014-08-27
err4
PREAI
errPerpina, X.; Jorda, X.; Vellvehi, M.; Altet, J.
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Small signal thermal analysis of local multibarrier behaviour in SiC Schottky diodes
err2014-08-22
err6
PREAI
errLeon, J.; Perpina, X.; Vellvehi, M.; Jorda, X.; Berthou, M.; Godignon, P.
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Thermomechanical Assessment of Die-Attach Materials for Wide Bandgap Semiconductor Devices and Harsh Environment Applications
err2014-05-01
err92
PREAI
errNavarro, Luis A.; Perpina, Xavier; Godignon, Philippe; Montserrat, Josep; Banu, Viorel; Vellvehi, Miquel; Jorda, Xavier
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