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收藏High-Ge-Content Si1-xGex Gate Stacks with Low-Temperature Deposited Ultrathin Epitaxial Si: Growth, Structures, Low Interfacial Traps, and Reliability
Wan, Hsien-Wen; Cheng, Yi-Ting; Cheng, Chao-Kai; Hong, Yu-Jie; Chu, Tien-Yu; Chang, Mu-Tung; Hsu, Chia-Hung; Kwo, Jueinai; Hong, Minghwei
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收藏Low-Temperature-Grown Single-Crystal Si Epitaxially on Ge, Followed by Direct Deposition of High-κ Dielectrics-Attainment of Low Interfacial Traps and Highly Reliable Ge MOS
Wan, Hsien-Wen; Hong, Yu-Jie; Cheng, Yi-Ting; Cheng, Chao-Kai; Hsu, Chia-Hung; Wu, Chien-Ting; Pi, Tun-Wen; Kwo, Jueinai; Hong, Minghwei
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