T. Ishikawa - Publications, H-index & Citations

T. Ishikawa

nagoya university

18H指数

160论文数

1.0K被引数

收录论文 12

发表时间

Draft Genome Sequence of Botrytis fabiopsis, a Causal Agent of Chocolate Spot on Broad Bean (Vicia faba) Newly Recorded in Japan 日本新记录的大豆灰霉病（Vicia faba）病原菌Botrytis fabiopsis的基因组序列草图

PHYTOFRONTIERS

IF1.1

2026-02-01

PREAI

Ashida, Akira; Ishikawa, Toshiharu; Takemoto, Daigo

Large negative anisotropic magnetoresistance in Co2MnGa Heusler alloy epitaxial thin films

APPLIED PHYSICS LETTERS

IF3.6

2018-09-14

PREAI

Sato, T.; Kokado, S.; Kosaka, S.; Ishikawa, T.; Ogawa, T.; Tsunoda, M.

Degradation analysis of AlGaN/GaN high electron mobility transistor by electroluminescence, electric field-induced optical second-harmonic generation, and photoluminescence imaging

APPLIED PHYSICS LETTERS

IF3.6

2018-07-05

PREAI

Katsuno, Takashi; Manaka, Takaaki; Soejima, Narumasa; Ishikawa, Tsuyoshi; Iwamoto, Mitsumasa

Three-dimensional current collapse imaging of AlGaN/GaN high electron mobility transistors by electric field-induced optical second-harmonic generation

APPLIED PHYSICS LETTERS

IF3.6

2016-11-07

PREAI

Katsuno, Takashi; Manaka, Takaaki; Ishikawa, Tsuyoshi; Soejima, Narumasa; Uesugi, Tsutomu; Iwamoto, Mitsumasa

Current collapse imaging of Schottky gate AlGaN/GaN high electron mobility transistors by electric field-induced optical second-harmonic generation measurement

APPLIED PHYSICS LETTERS

IF3.6

2014-06-27

PREAI

Katsuno, Takashi; Manaka, Takaaki; Ishikawa, Tsuyoshi; Ueda, Hiroyuki; Uesugi, Tsutomu; Iwamoto, Mitsumasa

Impact of surface morphology above threading dislocations on leakage current in 4H-SiC diodes

APPLIED PHYSICS LETTERS

IF3.6

2012-07-23

PREAI

Fujiwara, Hirokazu; Naruoka, Hideki; Konishi, Masaki; Hamada, Kimimori; Katsuno, Takashi; Ishikawa, Tsuyoshi; Watanabe, Yukihiko; Endo, Takeshi

Relationship between threading dislocation and leakage current in 4H-SiC diodes

APPLIED PHYSICS LETTERS

IF3.6

2012-06-11

PREAI

Fujiwara, Hirokazu; Naruoka, Hideki; Konishi, Masaki; Hamada, Kimimori; Katsuno, Takashi; Ishikawa, Tsuyoshi; Watanabe, Yukihiko; Endo, Takeshi

Coherent and intense multibeam generation by the apex of sharp nano-objects: Electron half-circular prism

APPLIED PHYSICS LETTERS

IF3.6

2007-10-15

PREAI

Cho, B.; Ishikawa, T.; Oshima, C.

Measurement of pressures in 10-10 Pa range from the damping speed of field emission current

APPLIED PHYSICS LETTERS

IF3.6

2007-07-03

PREAI

Cho, B.; Itagaki, T.; Ishikawa, T.; Oshima, C.

Highly efficient electron gun with a single-atom electron source

APPLIED PHYSICS LETTERS

IF3.6

2007-04-06

PREAI

Ishikawa, Tsuyoshi; Urata, Tomohiro; Cho, Boklae; Rokuta, Eiji; Oshima, Chuhei; Terui, Yoshinori; Saito, Hidekazu; Yonezawa, Akira; Tsong, Tien T.

Single-atom coherent field electron emitters for practical application to electron microscopy: Buildup controllability, self-repairing function and demountable characteristic

APPLIED SURFACE SCIENCE

IF6.9

2006-03-01

PREAI

Rokuta, E; Itagaki, T; Ishikawa, T; Cho, BL; Kuo, HS; Tsong, TT; Oshima, C

Atomic-scale field emitter with self-repairable function and thermodynamically stable structure:: FEM study on Pd-covered nanopyramids on W<1 1 1> tips

APPLIED SURFACE SCIENCE

IF6.9

2005-09-01

PREAI

Rokuta, E; Itagaki, T; Miura, D; Moriyama, T; Ishikawa, T; Cho, BL; Fu, TY; Tsong, TT; Oshima, C

研究方向