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M
Mohamed Belhaj
Université de Toulouse
24
H指数
214
论文数
1.8K
被引数
0
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21
发表时间
发表时间
IF
被引数
Nanoengineered carbon coating for ultra-high reduction of total electron emission yield
纳米工程碳涂层用于总电子发射产额的超高降低
Applied Surface Science
IF
6.9
2026-09-05
0
PRE
AI
Chan How Oh; Sarah Dadouch; Alan G. Salek; Sean L. Butler; Alan Pickhaver; Lilian Wade; Jessica Benedicto; Nicolas Fil; Siu Hon Tsang; Palaniappan Alagappan; Eric Rius; Mohamed Belhaj; Dougal G. McCulloch; Edwin Hang Tong Teo
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Risk-taking in financial networks
金融网络中的风险承担
Games and Economic Behavior
IF
1
2025-12-01
0
PRE
AI
Belhaj, Mohamed; Bourles, Renaud; Deroian, Frederic
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Detailed Study of the Total Electron Emission Yield (TEEY) Properties of Black Kapton Under Electron Impact
黑凯普顿在电子轰击下总电子发射产额(TEEY)特性的详细研究
IEEE TRANSACTIONS ON PLASMA SCIENCE
IF
1.5
2025-12-01
0
PRE
AI
Belhaj, Mohamed; Dadouch, Sarah; Paulmier, Thierry; Deprez, Gregoire; Cipriani, Fabrice
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Multipactor predictions for ion cyclotron resonance heating antennas of the tokamak WEST
托卡马克西部离子回旋共振加热天线的多重预测
NUCLEAR FUSION
IF
4
2023-11-06
0
OA
AI
Sleiman, Eva Al Hajj; Hillairet, Julien; Belhaj, Mohamed; Dadouch, Sarah; Maquet, Vincent
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Low electron emission yield electrodeposited silver coating for electron multipacting mitigation
SURFACES AND INTERFACES
IF
6.3
2023-04-01
2
OA
AI
Belfio, Julie; Lazar, Florica; Belhaj, Mohamed; Jbara, Omar
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A comprehensive analysis of electron emission from a-Si:H/Al2O3 at low energies
JOURNAL OF PHYSICS D-APPLIED PHYSICS
IF
3.2
2023-01-24
2
OA
AI
Loffler, Janina; Belhaj, Mohamed; Bundaleski, Nenad; Leon, Juan J. Diaz; Thomet, Jonathan; Frey, Samira; Ballif, Christophe; Wyrsch, Nicolas
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Surface ionizing dose deposited by low energy electrons (10 eV-10 keV) in eleven monoatomic materials: Monte Carlo calculations and analytical expressions
APPLIED SURFACE SCIENCE
IF
6.9
2022-02-01
5
OA
AI
Gibaru, Q.; Inguimbert, C.; Caron, P.; Belhaj, M.; Raine, M.; Lambert, D.
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Monte-Carlo simulation and analytical expressions for the extrapolated range and transmission rate of low energy electrons [10 eV-10 keV] in 11 monoatomic materials
APPLIED SURFACE SCIENCE
IF
6.9
2021-12-01
6
OA
AI
Gibaru, Q.; Inguimbert, C.; Belhaj, M.; Raine, M.; Lambert, D.
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Experimental investigation about energy balance of electron emission from materials under electron impacts at low energy: application to silver, graphite and SiO2
JOURNAL OF PHYSICS D-APPLIED PHYSICS
IF
3.2
2017-11-06
7
OA
AI
Villemant, M.; Sarrailh, P.; Belhaj, M.; Garrigues, L.; Boniface, C.
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Investigation of the electron emission properties of silver: From exposed to ambient atmosphere Ag surface to ion-cleaned Ag surface
APPLIED SURFACE SCIENCE
IF
6.9
2015-12-01
32
OA
AI
Gineste, T.; Belhaj, M.; Teyssedre, G.; Puech, J.
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Calculation of the angular dependence of the total electron yield
VACUUM
IF
3.9
2015-12-01
18
PRE
AI
Bundaleski, N.; Belhaj, M.; Gineste, T.; Teodoro, O. M. N. D.
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The study of electron emission from aluminum in the very low primary energy range using Monte Carlo simulations
JOURNAL OF PHYSICS D-APPLIED PHYSICS
IF
3.2
2013-02-21
18
PRE
AI
Roupie, J.; Jbara, O.; Tondu, T.; Belhaj, M.; Puech, J.
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Risk taking under heterogenous revenue sharing
JOURNAL OF DEVELOPMENT ECONOMICS
IF
4.6
2012-07-01
10
PRE
AI
Belhaj, Mohamed; Deroian, Frederic
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Characterization of charge carrier lateral conduction in irradiated dielectric materials
JOURNAL OF PHYSICS D-APPLIED PHYSICS
IF
3.2
2011-10-18
16
PRE
AI
Hanna, R.; Paulmier, T.; Belhaj, M.; Molinie, P.; Dirassen, B.; Payan, D.; Balcon, N.
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Effect of the incident electron fluence on the electron emission yield of polycrystalline Al2O3
APPLIED SURFACE SCIENCE
IF
6.9
2011-03-01
22
PRE
AI
Belhaj, M.; Tondu, Th.; Inguimbert, V.
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The effects of incident electron current density and temperature on the total electron emission yield of polycrystalline CVD diamond
JOURNAL OF PHYSICS D-APPLIED PHYSICS
IF
3.2
2010-03-18
22
OA
AI
Belhaj, M.; Tondu, T.; Inguimbert, V.; Barroy, Pierre; Silva, Francois; Gicquel, Alix
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Experimental investigation of the effect of the internal space charge accumulation on the electron emission yield of insulators submitted to e-irradiation: application to polycrystalline MgO
JOURNAL OF PHYSICS D-APPLIED PHYSICS
IF
3.2
2009-06-29
24
PRE
AI
Belhaj, M.; Tondu, T.; Inguimbert, V.
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A Kelvin probe based method for measuring the electron emission yield of insulators and insulated conductors subjected to electron irradiation
JOURNAL OF PHYSICS D-APPLIED PHYSICS
IF
3.2
2009-04-30
20
PRE
AI
Belhaj, M.; Tondu, T.; Inguimbert, V.; Chardon, J. P.
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Charging effects of PET under electron beam irradiation in a SEM
JOURNAL OF PHYSICS D-APPLIED PHYSICS
IF
3.2
2008-11-27
20
PRE
AI
Jbara, O.; Fakhfakh, S.; Belhaj, M.; Rondot, S.; Hadjadj, A.; Patat, J. M.
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Quantitative voltage contrast method for electron irradiated insulators in SEM
JOURNAL OF PHYSICS D-APPLIED PHYSICS
IF
3.2
2008-08-15
5
PRE
AI
Belhaj, M.; Jbara, O.; Fakhfakh, S.
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研究方向
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合作学者
合作期刊
C
Christophe Ballif
H 指数: 96 · 论文数: 906
A
A. Gicquel
H 指数: 46 · 论文数: 244
D
Dougal G. McCulloch
H 指数: 44 · 论文数: 290
G
G. Teyssèdre
H 指数: 43 · 论文数: 535
E
Edwin Hang Tong Teo
H 指数: 42 · 论文数: 212
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