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Matthew R. Linford

brigham young university

48H指数
318论文数
1.1W被引数
收录论文 73
发表时间
The x- and y-Symmetrization of XPS Spectra, and the Creation of Models From x-Symmetrized Spectra for the Visually ImpairedXPS光谱的x-和y-对称化,以及基于x-对称化光谱为视障人士创建模型
err2026-01-01
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PREAI
errLizarbe, Alvaro J.; Jafari, Samira; Wright, Kristopher S.; Lewis, Garrett; Crossman, Jacob D.; Jones, Michael P.; Terry, Jeff; Linford, Matthew R.
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Introduction to the Special Issue: Modern Methods and Avoiding Errors in Surface Analysis特刊引言:现代方法与表面分析中的错误避免
err2025-01-01
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errOAAI
errPinder, Joshua W.; Crossman, Jacob D.; Kulbacki, Braxton; van Spronsen, Matthijs A.; Baltrusaitis, Jonas; Linford, Matthew R.
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Introduction to the Special Collection for the Society of Vacuum Coaters'66th Annual Technical Conference
err2024-09-01
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PREAI
errPinder, Joshua W.; Crossman, Jacob; Kulbacki, Braxton; Linford, Matthew R.
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A practical guide to interpreting low energy ion scattering (LEIS) spectra解释低能离子散射 (LEIS) 光谱的实用指南
err2024-06-01
err8
PREAI
errPrusa, Stanislav; Linford, Matthew R.; Vanic, Elena; Babik, Pavel; Pinder, Joshua W.; Sikola, Tomas; Brongersma, Hidde H.
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Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters避免x射线光电子能谱数据收集和分析中的常见错误,并正确报告仪器参数
err2024-02-01
err29
errOAAI
errPinder, Joshua W.; Major, George H.; Baer, Donald R.; Terry, Jeff; Whitten, James E.; Cechal, Jan; Crossman, Jacob D.; Lizarbe, Alvaro J.; Jafari, Samira; Easton, Christopher D.; Baltrusaitis, Jonas; van Spronsen, Matthijs A.; Linford, Matthew R.
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Microstructure quantification of oblique angle sputtered porous a-Si thin films as a basis for structure-property relations of solid phase microextraction coatings
err2023-11-01
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errOAAI
errMoeini, Behnam; Fullwood, David T.; Minson, Paul; Shollenberger, Daniel; Bell, David S.; Argyle, Morris D.; Vanfleet, Richard; Linford, Matthew R.
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Controlling the surface silanol density in capillary columns and planar silicon via the self-limiting, gas-phase deposition of tris(dimethylamino) methylsilane, and quantification of surface silanols after silanization by low energy ion scattering
err2023-09-01
err0
errOAAI
errMoeini, Behnam; Pinder, Joshua W.; Avval, Tahereh G.; Jacobsen, Collin; Brongersma, Hidde H.; Prusa, Stanislav; Babik, Pavel; Vanickova, Elena; Argyle, Morris D.; Strohmeier, Brian R.; Jones, Brian; Shollenberger, Daniel; Bell, David S.; Linford, Matthew R.
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Area-Selective Atomic Layer Deposition of ZnO on Si\SiO2 Modified with Tris(dimethylamino)methylsilane用三 (二甲基氨基) 甲基硅烷改性的Si \ SiO2上ZnO的区域选择性原子层沉积
err2023-06-29
err3
errOAAI
errMoeini, Behnam; Avval, Tahereh G. G.; Brongersma, Hidde H. H.; Prusa, Stanislav; Babik, Pavel; Vanickova, Elena; Strohmeier, Brian R. R.; Bell, David S. S.; Eggett, Dennis; George, Steven M. M.; Linford, Matthew R. R.
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A tag-and-count approach for quantifying surface silanol densities on fused silica based on atomic layer deposition and high-sensitivity low-energy ion scattering
err2023-01-01
err10
errOAAI
errAvval, Tahereh G.; Prusa, Stanislav; Cushman, Cody, V; Hodges, Grant T.; Fearn, Sarah; Kim, Seong H.; Cechal, Jan; Vanickova, Elena; Babik, Pavel; Sikola, Tomas; Brongersma, Hidde H.; Linford, Matthew R.
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Flow-Through Atmospheric Pressure-Atomic Layer Deposition Reactor for Thin-Film Deposition in Capillary Columns
err2022-05-17
err8
PREAI
errPatel, Dhananjay I.; Major, George H.; Jacobsen, Collin; Shah, Dhruv; Strohmeier, Brian R.; Shollenberger, Daniel; Bell, David S.; Argyle, Morris D.; Linford, Matthew R.
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Substrate protection and deprotection with salt films to prevent surface contamination and enable selective atomic layer deposition
err2020-10-01
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PREAI
errShah, Dhruv; Patel, Dhananjay, I; Roychowdhury, Tuhin; Johnson, Brian, I; Linford, Matthew R.
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Boron coordination structure at the surfaces of sodium borosilicate and aluminoborosilicate glasses by B K-edge NEXAFS
err2020-10-01
err9
PREAI
errSmith, Nicholas J.; Cushman, Cody, V; Linford, Matthew R.; Schaut, Robert A.; Banerjee, Joy; Youngman, Randall E.; Thomsen, Lars; Fisher, Landon S.; Barlow, Anders J.; Pigram, Paul J.
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Sputtered silicon solid phase microextraction fibers with a polydimethylsiloxane stationary phase with negligible carry-over and phase bleed
err2020-07-01
err17
PREAI
errRoychowdhury, Tuhin; Patel, Dhananjay, I; Shah, Dhruv; Diwan, Anubhav; Kaykhaii, Massoud; Herrington, Jason S.; Bell, David S.; Linford, Matthew R.
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Direct Dielectric Barrier Discharge Ionization Promotes Rapid and Simple Lubricant Oil Fingerprinting
err2020-05-26
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PREAI
errZuppa Neto, Tatiana de O.; Avval, Tahereh G.; de Oliveira Morais, Pedro A.; Ellis, Wade C.; Chapman, Sean C.; de Oliveira, Anselmo E.; Linford, Matthew R.; Farnsworth, Paul B.; Antoniosi Filho, Nelson R.
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Semiempirical Peak Fitting Guided by ab Initio Calculations of X-ray Photoelectron Spectroscopy Narrow Scans of Chemisorbed, Fluorinated Silanes
err2020-02-04
err16
PREAI
errJohnson, Brian, I; Avval, Tahereh G.; Wheeler, Joshua; Anderson, Hans C.; Diwan, Anubhav; Stowers, Kara J.; Ess, Daniel H.; Linford, Matthew R.
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