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Efficient On-Chip Randomness Testing Utilizing Machine Learning Techniques

delete2019-12-01
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PRE
AI
V
Vojtěch Mrázek
L
Lukáš Sekanina *
D
Dobai, Roland
M
Marek Sýs
P
Petr Švenda
DOI:10.1109/TVLSI.2019.2923848delete
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摘要

摘要

En 中文
Randomness testing is an important procedure that bit streams, produced by critical cryptographic primitives such as encryption functions and hash functions, have to undergo. In this paper, a new hardware platform for the randomness testing is proposed. The platform exploits the principles of genetic programming, which is a machine learning technique developed for the automated program and circuit design. The platform is capable of evolving efficient randomness distinguishers directly on a chip. Each distinguisher is represented as a Boolean polynomial in the algebraic normal form. The randomness testing is conducted for bit streams that are either stored in an on-chip memory or generated by a circuit placed on the chip. The platform is developed with a Xilinx Zynq-7000 All Programmable System on Chip that integrates a field programmable gate array with on-chip ARM processors. The platform is evaluated in terms of the quality of randomness testing, performance, and resources utilization. With power budget less than 3 W, the platform provides comparable randomness testing capabilities with the standard testing batteries running on a personal computer.
Keyword:
Evolutionary computation
field-programmable gate arrays (FPGAs)
random sequences
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期刊

I
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
IF:
3.1
论文数:
459
被引数:
7.3K

机构

M
masaryk university brno
学者数:
1.1W
论文数: 7.8K
被引数: 9
B
Brno University of Technology
学者数:
5.7K
论文数: 4.7K
被引数: 5.7K
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