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Sub-diffraction dark spot localization microscopy

delete2021-07-09
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PRE
AI
C
Chuankang Li
李玉珠 (Yuzhu Li)
Z
Zhengyi Zhan
Y
Yuhang Li
刘欣 cover
刘欣 (Xin Liu)
Y
Yong Liu *
X
Xiang Hao
匡翠方 (Cuifang Kuang)
刘旭 (Xü Liu)
DOI:10.1364/PRJ.429933delete
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Abstract

Abstract

En 中文
Single molecular localization microscopy (SMLM) is a useful tool in biological observation with sub-10-nm resolution. However, SMLM is incapable of discerning two molecules within the diffraction-limited region unless with the help of a stochastic on-off switching scheme which yet entails time-consuming processes. Here, we produce a novel kind of focal spot pattern, called sub-diffraction dark spot (SDS), to localize molecules within the sub-diffraction region of interest. In our proposed technique nominated as sub-diffracted dark spot localization microscopy (SDLM), multiple molecules within the diffraction-limited region could be distinguished without the requirement of stochastic fluorescent switches. We have numerically investigated some related impacts of SDLM, such as detection circle diameter, collected photon number, background noise, and SDS size. Simulative localization framework has been implemented on randomly distributed and specifically structured samples. In either two- or three-dimensional case, SDLM is evidenced to have similar to 2 nmlocalization accuracy. (C) 2021 Chinese Laser Press
Keywords:
LIMIT

Journal

Photonics Research cover
Photonics Research
IF:
7.2
Papers:
2.4K
Citations:
1.3W

Organization

S
Shanghai University of Electric Power
Scholars:
5.2K
Papers: 3.4K
Citations: 4.9K
Z
zhejiang university
Scholars:
17.7W
Papers: 12.1W
Citations: 152
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