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IEEE Design & Test

IF1.9
Papers39
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Journal Papers 39
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Exploring Asymmetric Autoencoder Architectures for Computationally Efficient Neural Image Compression
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deleteAugusto, Leonardo; Arguilar, Vitor; da Silveira, Thiago L. T.; Grellert, Mateus
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SBCCI 2024
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deleteNacif, Jose Augusto; Vilela Neto, Omar Paranaiba
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The Internet Likes to Watch
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deleteDavidson, Scott
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Special Issue Dedicated to the 2024 Symposium on Integrated Circuits and Systems Design (SBCCI)
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deletePande, Partha Pratim
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Threat Detection in NoC-Based Manycores Using Lightweight Machine-Learning Models
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deleteDal Zotto, Angelo Elias; Moraes, Fernando Gehm
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The VCR Effect in Active-RC Continuous-Time Sigma-Delta Modulators
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deletedos Santos, Tawan Chrysther; Girardi, Alessandro Goncalves; de Aguirre, Paulo Cesar C.
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DiffLight: Generative Diffusion Model Acceleration With Silicon Photonics
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deleteSuresh, Tharini; Afifi, Salma; Pasricha, Sudeep
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EAVREF: An Evolutionary-Algorithm-Based Tool for Low-Power CMOS Voltage Reference Designs
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deleteItaliano, Ana; Almeida, Luciana; Brito, Thiago; Petraglia, Mariane R.; Olivera, Fabian
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Impact of Partial TMR on RISC-V Processor Reliability
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deleteMaranon, Eduardo; Benevenuti, Fabio; Kastensmidt, Fernanda; Medina, Nilberto; Added, Nemitala; Aguiar, Vitor; Guazzelli, Marcilei
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Low-Power Truncated PanTompkins Architecture Exploring Approximate Radix-2m Squaring Units
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deleteRibeiro, Leo dos Santos; da Rosa, Morgana Macedo Azevedo; Soares, Rafael I.; da Costa, Eduardo Antonio Cesar
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A Real-Time Hardware for LES Solving and MV Calculation in VVC Affine Prediction
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deleteMaass, Denis; Munoz, Marcello; Perleberg, Murilo; Agostini, Luciano; Porto, Marcelo
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Semiconductor Microelectronics and Nanoelectronics Research and Education in Academia
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deleteBasu, Sankar; Brunvand, Erik
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RF Leakage in Embedded Devices: Security and Reliability Risks
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deleteDanieli, Erez; Weizman, Yoav; Popovtzer, David; Levi, Itamar
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On the Origin of AI Species
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deleteDavidson, Scott
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Special Issue on Emerging Challenges With 3-D NAND Flash Storage
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deletePande, Partha Pratim
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Special Issue on Emerging Challenges With 3-D NAND Flash Storage
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deleteRay, Biswajit; Raghunathan, Shyam; Pasricha, Sudeep
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Report on the 2025 Embedded Systems Week (ESWEEK)
deleteIEEE Design & Test
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deleteKuo, Tei-Wei; Pimentel, Andy D.; Chang, Yuan-Hao; Hsieh, Jen-Wei
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Reliability, Security, and Sustainability Challenges in 3-D NAND Flash SSDs
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deleteRay, Biswajit; Raghunathan, Shyam; Pasricha, Sudeep
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3-D Ferroelectric NAND In-Storage Processing Architecture for Mass Spectrometry
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deleteHsu, Po-Kai; Xu, Weihong; Shon, Minji; Zhao, Zijian; Ni, Kai; Rosing, Tajana; Yu, Shimeng
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SoC-GPIO-Based Dynamic Power Noise Control for Video Sensor Applications
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deleteWu, Zong-Si; Leu, Jenq-Shiou
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