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Journal Details
Microelectronics Journal
IF
2.3
Papers
300
Citations
4718
Related Insights
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Journal Papers
303
Related Insights
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Journal Papers
303
Publication Date
Publication Date
IF
Citations
Analysis and design of extended continuous class-GF power amplifier under multi-objective conditions
Microelectronics Journal
IF
2.3
2026-08-01
0
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AI
Xuan, Xuefei; Zhang, Ruizhe; Chen, Kai; Wang, Jiapeng; Huang, Wenhao; Zhang, Zhiwei; Cheng, Zhiqun
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A high bandwidth and adaptive background timing mismatch calibration for time-interleaved ADC☆
Microelectronics Journal
IF
2.3
2026-08-01
0
PRE
AI
Luo, Jiahui; Jia, Hanbo; Guo, Xuan; Wu, Linzhen; Zhang, Yuzhen; Wu, Xiuheng; Sun, Kai; Liu, Xinyu
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A spike pixel with adaptive light intensity feedback adjustment mechanism for high-speed high-dynamic-range imaging
Microelectronics Journal
IF
2.3
2026-08-01
0
PRE
AI
Lei, Lunhao; Yang, Yuli; Nie, Kaiming; Xu, Jiangtao
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Modulating surface trapping and electric-field distribution in 0.1 μm GaN HEMTs via localized cap-layer engineering
Microelectronics Journal
IF
2.3
2026-08-01
1
PRE
AI
Mo, Jiongjiong; Lv, Beibei; Zhao, Xuran
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High accuracy 3-axis MEMS gyroscopes using the chopper integration demodulation technique
Microelectronics Journal
IF
2.3
2026-08-01
0
PRE
AI
Cai, Kangkang; Liu, Jian; Gao, Ji; Hu, Tiegang
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ChipMate: Design-experience-driven chip recommendation framework based on multi-agent collaboration
Microelectronics Journal
IF
2.3
2026-08-01
0
PRE
AI
Xu, Zihan; Liu, Jun; Zhao, Zhenxin; Wang, Yaqi; Wang, Junchao; Zhao, Wen-Sheng
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A self-starting boost converter with multi-mode operation and direct-sensing MPPT for photovoltaic energy harvesting☆
Microelectronics Journal
IF
2.3
2026-08-01
0
PRE
AI
Qian, Kefang; Xia, Huakang; Xia, Yinshui
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A high-linearity input buffer and early-trigger scheme for GS/s pipelined ADCs
Microelectronics Journal
IF
2.3
2026-08-01
0
PRE
AI
Liu, Tao; Guo, Xuan; Jia, Hanbo; Yang, Ruiqi; Liu, Zhihao; Xu, Fangyuan; Jiang, Zilin; Liu, Xinyu
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Win-CIM: A Winograd-optimized full-Digital Computing-in-Memory accelerator for general convolution in CNNs
Microelectronics Journal
IF
2.3
2026-08-01
0
PRE
AI
Xiao, Han; Liu, Yuanzhen; Zhao, Ruiyong; Liu, Yulan; Chen, Jing
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A 56-Gb/s NRZ sub-sampling CDR with improved gilbert-based frequency multiplier in 28 nm CMOS
Microelectronics Journal
IF
2.3
2026-08-01
0
PRE
AI
Qi, Yuxing; Dong, Zhicheng; Wang, Haohang; Zhang, Yangfan; Liu, Shubin
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An ultra-low-voltage startup PWM controller with gate boost and power supply switching techniques
Microelectronics Journal
IF
2.3
2026-08-01
0
PRE
AI
Wang, Xin; Li, Wengan; Zhao, Zenglong; Wang, Keping; Meng, Fanyi
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Investigation of the mechanical properties and construction of an Arrhenius-type constitutive model for SnBiInZn high-entropy alloy solder
Microelectronics Journal
IF
2.3
2026-08-01
0
PRE
AI
Wang, Gui; Huang, Chunyue; Chen, Yonglin; Yang, Jinmei; Lu, Ying
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A floating dummy IGBT with a polysilicon P-N junction gate for EMI suppression
Microelectronics Journal
IF
2.3
2026-08-01
0
PRE
AI
Qin, Yuchi; Feng, Quanyuan; Li, Zhimin
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Time-mode sub-threshold delay-locked loop for low-frequency clock generation
Microelectronics Journal
IF
2.3
2026-08-01
0
PRE
AI
Wu, Wenhao; Yuan, Fei; Zhou, Yushi
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A 60V chopper amplifier achieving 3 μV VOS with adaptive input bias current compensation
Microelectronics Journal
IF
2.3
2026-08-01
0
PRE
AI
Feng, Jingbin; Zhou, Shanshan; Hou, Peiru; Qu, Pengda; Zhao, Yue; Xiao, Zhiming
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An efficient modeling method for signal integrity analysis: Facing multi-dielectric-layer 2.5D integration
Microelectronics Journal
IF
2.3
2026-08-01
1
PRE
AI
Zhu, Yanlin; Ma, Yongtao; Wang, Xiaolin; Li, Leyang; Zhang, Xuran; Yan, Huan
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A novel design for radiation tolerant hexagonal double-sided spiral silicon drift detectors
Microelectronics Journal
IF
2.3
2026-08-01
0
PRE
AI
Huang, Huixiang; Huang, Hongyu; Lin, Guoxu; Shi, Xiangwei; Guo, Rongrong
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A 10-bit 50-MS/s SAR ADC employing PN-assisted LMS calibration and robust register logic achieving 78.4-dB SFDR
Microelectronics Journal
IF
2.3
2026-08-01
0
PRE
AI
Yang, Xijun; Men, Siqi; Shi, Yuzhuan; Sun, Jie
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Impact of DC current density on filling mechanism and microstructural evolution of metallization in TGV
Microelectronics Journal
IF
2.3
2026-08-01
1
PRE
AI
Qiao, Yangxu; Chen, Hongwei; Qin, Ke; Wang, Zihan; Wang, Miao; Li, Wenlei; Li, Yong; Wang, Dongbin; Gao, Libin; Zhang, Jihua
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TID-induced leakage-assisted degradation and failure mechanisms in cathode-short base-resistance-controlled thyristors
Microelectronics Journal
IF
2.3
2026-08-01
0
PRE
AI
Huo, Xuanyi; Song, Limei; Cai, Xiaowu; Pan, Longli; Lu, Jian; Shu, Lei; Li, Bo
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