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Namlab Ggmbh

Scholars26
Papers11
Citations1
Related Papers (10)
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Readout Current in HZO-Based Bilayer FTJs: Physical Mechanisms and Design Insight
errIEEE Transactions on Electron Devices
IF3.2
err2026-03-16
err0
errOAAI
errM. Segatto; F. M. Puglisi; F. Driussi; D. Lizzit; L. Carpentieri; S. Slesazeck; T. Mikolajick; D. Esseni
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Controlling the Wake-Up Mechanism and Switching Kinetics of Ferroelectric HfxZr1 – xO2 through Hf Content Modulation
errACS Applied Materials & Interfaces
IF8.2
err2025-10-29
err0
errOAAI
errAthira Sunil; Ruben Alcala; Cláudia Silva; Thomas Mikolajick; Suzanne Lancaster
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Does a Morphotropic Phase Boundary Exist in ZrxHf1-xO2-Based Thin Films?
errAdvanced Functional Materials
IF19
err2025-10-26
err0
errOAAI
errPramoda Vishnumurthy; Richard Ganser; Dong-Gyu Kim; Intak Jeon; Chang Hwa Jung; Hanjin Lim; Thomas Mikolajick; Susan Trolier-McKinstry; Alfred Kersch; Uwe Schroeder
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Emerging applications: Neuromorphic computing and reservoir computing
errMRS Bulletin
IF4.9
err2025-09-23
err0
PREAI
errKasidit Toprasertpong; Thomas Mikolajick; Suman Datta; Qianqian Huang; Shinichi Takagi
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Process Integration of U-Shape Ambipolar Schottky–Barrier Field-Effect Transistors
errAdvanced Electronic Materials
IF5.3
err2025-09-23
err0
errOAAI
errCigdem Cakirlar; Bruno Neckel Wesling; Konstantinos Moustakas; Giulio Galderisi; Sylvain Pelloquin; Oskar Baumgartner; Mischa Thesberg; Thomas Mikolajick; Guilhem Larrieu; Jens Trommer
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Offset Field Extraction With Multi-Bit Magnetic Tunnel Junction Structures
errIEEE Transactions on Electron Devices
IF3.2
err2025-07-01
err0
errOAAI
errMeike Hindenberg; Abhishek Talapatra; Benjamin Lilienthal-Uhlig; Johannes Müller; Raik Hoffmann; Thomas Mikolajick
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ZrO2 Based Multilayered Stacks with Al2O3, Y2O3 or La2O3 Interlayers for SiC Power Devices
errACS APPLIED MATERIALS & INTERFACES
IF8.2
err2025-05-02
err0
errOAAI
errKrause, S; Mikhaylov, A; Schroeder, U; Mikolajick, T; Wachowiak, A
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Edge of Chaos Theory Unveils the First and Simplest Ever Reported Hodgkin-Huxley Neuristor
errADVANCED ELECTRONIC MATERIALS
IF5.3
err2025-03-06
err0
errOAAI
errAscoli, A; Demirkol, AS; Messaris, I; Ntinas, V; Prousalis, D; Slesazeck, S; Mikolajick, T; Corinto, F; Bonnin, M; Gilli, M; Civalleri, PP; Tetzlaff, R; Chua, L
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Ferroelectric Al1-xScxN Opposite State Retention Model Based on Switching Dynamics
errADVANCED FUNCTIONAL MATERIALS
IF19
err2025-03-06
err1
PREAI
errGuido, R; Gremmel, M; Mikolajick, T; Fichtner, S; Schroeder, U
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Peak Splitting and Bias Fields in Ferroelectric Hafnia Mediated by Interface Charge Effects
errACS Applied Materials & Interfaces
IF8.2
err
err0
PREAI
errMoritz Engl; Wassim Hamouda; Ines Häusler; Suzanne Lancaster; Luca Carpentieri; Thomas Mikolajick; Catherine Dubourdieu; Stefan Slesazeck
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