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J

Jacob P. Hoogenboom

delft university of technology

33H-index
139Paper Count
3.6KCitation Count
Published Papers 41
Publication Date
ColorEM-Net: Automated Segmentation of Structures in Large-Scale Electron Microscopy Using Element-Derived Ground Truth
err2026-01-01
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PREAI
errAswath, Anusha; Alsahaf, Ahmad M. J.; Duinkerken, B. H. Peter; Hoogenboom, Jacob P.; Giepmans, Ben N. G.; Azzopardi, George
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Basic considerations in the design of an electrostatic electron monochromator
err2025-12-01
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errOAAI
errAdriaans, M. J.; Hoogenboom, J. P.; Mohammadi-Gheidari, A.
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Sample Processing and Benchmarking for Multibeam Optical Scanning Transmission Electron Microscopy
err2025-04-02
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PREAI
errDuinkerken, B. H. Peter; Kievits, Arent J.; Wolters, Anouk H. G.; Henegouwen, Daan van Beijeren Bergen en; Kuipers, Jeroen; Hoogenboom, Jacob P.; Giepmans, Ben N. G.
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Thickness- and quality-controlled fabrication of fluorescence-targeted frozen-hydrated lamellae
err2025-03-01
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errOAAI
errBoltje, Daan B.; Skoupy, Radim; Taisne, Clemence; Evers, Wiel H.; Jakobi, Arjen J.; Hoogenboom, Jacob P.
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Depth-dependent scaling of axial distances in light microscopy
errOPTICA
IF8.5
err2024-04-19
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errOAAI
errLoginov, S., V; Boltje, D. B.; Hensgens, M. N. F.; Hoogenboom, J. P.; Wee, E. b. van der
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Robust Local Thickness Estimation of Sub-Micrometer Specimen by 4D-STEM
err2023-05-30
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errOAAI
errSkoupy, Radim; Boltje, Daan B. B.; Slouf, Miroslav; Mrazova, Katerina; Laznicka, Tomas; Taisne, Clemence M.; Krzyzanek, Vladislav; Hoogenboom, Jacob P. P.; Jakobi, Arjen J. J.
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Electron-beam patterned calibration structures for structured illumination microscopy
err2022-11-23
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errOAAI
errHari, Sangeetha; Slotman, Johan A.; Vos, Yoram; Floris, Christian; van Cappellen, Wiggert A.; Hagen, C. W.; Stallinga, Sjoerd; Houtsmuller, Adriaan B.; Hoogenboom, Jacob P.
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A cryogenic, coincident fluorescence, electron, and ion beam microscope
err2022-10-28
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errOAAI
errBoltje, Daan B.; Hoogenboom, Jacob P.; Jakobi, Arjen J.; Jensen, Grant J.; Jonker, Caspar T. H.; Kaag, Max J.; Koster, Abraham J.; Last, Mart G. F.; Pinto, Cecilia de Agrela; Plitzko, Juergen M.; Raunser, Stefan; Tacke, Sebastian; Wang, Zhexin; van der Wee, Ernest B.; Wepf, Roger; den Hoedt, Sander; Pfeffer, Suzanne R.
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Ultrafast scanning electron microscopy with sub-micrometer optical pump resolution
err2022-06-22
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errOAAI
errGarming, Mathijs W. H.; Weppelman, I. Gerward C.; Lee, Martin; Stavenga, Thijs; Hoogenboom, Jacob P.
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Integrated Array Tomography for 3D Correlative Light and Electron Microscopy
err2022-01-19
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errOAAI
errLane, Ryan; Wolters, Anouk H. G.; Giepmans, Ben N. G.; Hoogenboom, Jacob P.
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Electron-Beam Induced Luminescence and Bleaching in Polymer Resins and Embedded Biomaterial
err2021-09-04
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errOAAI
errSrinivasa Raja, Aditi; de Boer, Pascal; Giepmans, Ben N. G.; Hoogenboom, Jacob P.
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Structured illumination microscopy with noise-controlled image reconstructions
err2021-06-14
err46
errOAAI
errSmith, Carlas S.; Slotman, Johan A.; Schermelleh, Lothar; Chakrova, Nadya; Hari, Sangeetha; Vos, Yoram; Hagen, Cornelis W.; Mueller, Marcel; van Cappellen, Wiggert; Houtsmuller, Adriaan B.; Hoogenboom, Jacob P.; Stallinga, Sjoerd
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Optimization of negative stage bias potential for faster imaging in large-scale electron microscopy
err2021-01-01
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errOAAI
errLane, Ryan; Vos, Yoram; Wolters, Anouk H. G.; van Kessel, Luc; Chen, S. Elisa; Liv, Nalan; Klumperman, Judith; Giepmans, Ben N. G.; Hoogenboom, Jacob P.
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The 2018 correlative microscopy techniques roadmap
err2018-08-31
err98
errOAAI
errAndo, Toshio; Bhamidimarri, Satya Prathyusha; Brending, Niklas; Colin-York, H.; Collinson, Lucy; De Jonge, Niels; de Pablo, P. J.; Debroye, Elke; Eggeling, Christian; Franck, Christian; Fritzsche, Marco; Gerritsen, Hans; Giepmans, Ben N. G.; Grunewald, Kay; Hofkens, Johan; Hoogenboom, Jacob P.; Janssen, Kris P. F.; Kaufman, Rainer; Klumpermann, Judith; Kurniawan, Nyoman; Kusch, Jana; Liv, Nalan; Parekh, Viha; Peckys, Diana B.; Rehfeldt, Florian; Reutens, David C.; Roeffaers, Maarten B. J.; Salditt, Tim; Schaap, Iwan A. T.; Schwarz, Ulrich S.; Verkade, Paul; Vogel, Michael W.; Wagner, Richard; Winterhalter, Mathias; Yuan, Haifeng; Zifarelli, Giovanni
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Nanoscale Imaging of Light-Matter Coupling Inside Metal-Coated Cavities with a Pulsed Electron Beam
err2018-04-26
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errOAAI
errMoerland, Robert J.; Weppelman, I. Gerward C.; Scotuzzi, Marijke; Hoogenboom, Jacob P.
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Multi-color electron microscopy by element-guided identification of cells, organelles and molecules
err2017-04-07
err43
errOAAI
errScotuzzi, Marijke; Kuipers, Jeroen; Wensveen, Dasha I.; de Boer, Pascal; Hagen, Kees (C. ) W.; Hoogenboom, Jacob P.; Giepmans, Ben N. G.
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Nanodiamonds as multi-purpose labels for microscopy
err2017-04-07
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errOAAI
errHemelaar, S. R.; de Boer, P.; Chipaux, M.; Zuidema, W.; Hamoh, T.; Martinez, F. Perona; Nagl, A.; Hoogenboom, J. P.; Giepmans, B. N. G.; Schirhagl, R.
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Automated sub-5 nm image registration in integrated correlative fluorescence and electron microscopy using cathodoluminescence pointers
err2017-03-02
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errOAAI
errHaring, Martijn T.; Liv, Nalan; Zonnevylle, A. Christiaan; Narvaez, Angela C.; Voortman, Lenard M.; Kruit, Pieter; Hoogenboom, Jacob P.
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Nanoparticle discrimination based on wavelength and lifetime-multiplexed cathodoluminescence microscopy
err2017-01-01
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errOAAI
errGarming, Mathijs W. H.; Weppelman, I. Gerward C.; de Boer, Pascal; Perona Martinez, Felipe; Schirhagl, Romana; Hoogenboom, Jacob P.; Moerland, Robert J.
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Time-resolved cathodoluminescence microscopy with sub-nanosecond beam blanking for direct evaluation of the local density of states
err2016-10-14
err31
errOAAI
errMoerland, Robert J.; Weppelman, I. Gerward C.; Garming, Mathijs W. H.; Kruit, Pieter; Hoogenboom, Jacob P.
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