Not logged inSingle-field-plate GaN HEMTs achieving >2400 V breakdown voltage and 106% dynamic on-resistance at 600 V stress
Yang, Zhichao; Liao, Eason; Zhuang, Jungang; Dong, Hao; Zhang, Shuangshuang; Zhu, Lei; Yang, Zezheng; Zhang, Bingliang; Yu, Guohao; Zeng, Zhongming; Zhang, Baoshun
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SaveGaN high electron mobility transistors with a breakdown voltage over 2500 V achieved by low temperature MBE growth, subdivision of channel, and single field plate structure
Yang, Zhichao; Liao, Eason; Ding, Daniel; Zhuang, Jungang; Dong, Hao; Yang, Han; Zhu, Lei; Zhang, Bingliang; Yu, Guohao; Zeng, Zhongming; Zhang, Baoshun
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