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M

Masaru Kurokawa

tokyo metropolitan university

0H-index
2Paper Count
0Citation Count
Published Papers 1
Publication Date
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Self-Training-Based Wafer Map Defect Pattern Labeling for Classification Accuracy Improvement
errInternational Journal of Reliability Quality and Safety Engineering
IF0.9
err2026-02-01
err0
PREAI
errKurokawa, Masaru; Nagamura, Yoshikazu; Arai, Masayuki; Fukumoto, Satoshi
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Co-authors
Cooperation Journals
M
Masayuki Arai
H-index: 16 · Papers: 580
S
Satoshi Fukumoto
H-index: 11 · Papers: 118
Y
Yoshikazu Nagamura
H-index: 4 · Papers: 22
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