M. Nafrı́a - Publications, H-index & Citations

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M. Nafrı́a

universitat autonoma of barcelona

36H-index

351Paper Count

5.6KCitation Count

Published Papers 35

Publication Date

A Proof-of-Concept of a Bio-Inspired Neuromorphic Hierarchical System Behaving as an Associative Memory for Multisensory Integration

Electronics

IF2.6

2026-04-07

OAAI

Marta Pedro; Javier Martin-Martinez; Rosana Rodriguez; Montserrat Nafria

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Comprehensive statistical analysis of random telegraph noise: Impact of gate voltage, temperature, and Bias time

Microelectronic Engineering

IF3.1

2025-12-13

PREAI

J. Martin-Martinez; N. Baghban-Bousari; R. Castro-Lopez; D. Eric; E. Roca; R. Rodriguez; M. Porti; F.V. Fernandez; M. Nafria

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A statistical characterization of dielectric breakdown in FDSOI nanowire transistors

Microelectronic Engineering

IF3.1

2025-10-06

OAAI

R. Goyal; A. Crespo-Yepes; M. Porti; R. Rodriguez; M. Nafria

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Feasibility of Physical Unclonable Functions from Pre-stressed Organic Thin Film Transistors for Secure Microelectronics

Microelectronic Engineering

IF3.1

2025-09-17

OAAI

N. Baghban-Bousari; D. Eric; G. Palau; A. Crespo-Yepes; M. Porti; E. Ramon; S. Ogier; M. Nafria

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Physical Unclonable Functions Based on the Post-Breakdown Current of FDSOI Nanowire Transistors

IEEE Electron Device Letters

IF4.5

2025-08-01

PREAI

Rishab Goyal; Marc Porti; Albert Crespo-Yepes; Montserrat Nafria

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Reliability Assessment of Optical Physical Unclonable Functions Based on the Spatial Distribution of Catastrophic Failure Sites in MIM Structures

IEEE ACCESS

IF3.6

2025-01-01

OAAI

Porti, Marc; Solis, Alvaro; Calatayud, Alex; Nafria, Montserrat; Miranda, Enrique

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On the Aging of OTFTs and Its Impact on PUFs Reliability

MICROMACHINES

IF3

2024-03-26

OAAI

Porti, Marc; Palau, Gerard; Crespo-Yepes, Albert; Rus, August Arnal; Ogier, Simon; Ramon, Eloi; Nafria, Montserrat

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On the Impact of the Biasing History on the Characterization of Random Telegraph Noise

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2022-01-01

OAAI

Saraza-Canflanca, Pablo; Castro-Lopez, Rafael; Roca, Elisenda; Martin-Martinez, Javier; Rodriguez, Rosana; Nafria, Montserrat; Fernandez, Francisco, V

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Power-Efficient Noise-Induced Reduction of ReRAM Cell's Temporal Variability Effects

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS

IF4.9

2021-04-01

OAAI

Ntinas, Vasileios; Rubio, Antonio; Sirakoulis, Georgios Ch; Aguilera, Emili Salvador; Pedro, Marta; Crespo-Yepes, Albert; Martin-Martinez, Javier; Rodriguez, Rosana; Nafria, Montserrat

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Methodology for the Simulation of the Variability of MOSFETs With Polycrystalline High-k Dielectrics Using CAFM Input Data

IEEE ACCESS

IF3.6

2021-01-01

OAAI

Ruiz, A.; Couso, C.; Seoane, N.; Porti, M.; Garcia-Loureiro, A. J.; Nafria, M.

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Flexible Setup for the Measurement of CMOS Time-Dependent Variability With Array-Based Integrated Circuits

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2020-03-01

OAAI

Diaz-Fortuny, Javier; Saraza-Canflanca, Pablo; Castro-Lopez, Rafael; Roca, Elisenda; Martin-Martinez, Javier; Rodriguez, Rosana; Fernandez, Francisco V.; Nafria, Montserrat

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Self-Organizing Neural Networks Based on OxRAM Devices under a Fully Unsupervised Training Scheme

MATERIALS

IF3.2

2019-10-24

OAAI

Pedro, Marta; Martin-Martinez, Javier; Maestro-Izquierdo, Marcos; Rodriguez, Rosana; Nafria, Montserrat

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Experimental Verification of Memristor-Based Material Implication NAND Operation

IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING

IF5.4

2019-10-01

OAAI

Maestro-Izquierdo, Marcos; Martin-Martinez, Javier; Crespo Yepes, Albert; Escudero, Manel; Rodriguez, Rosana; Nafria, Montserrat; Aymerich, Xavier; Rubio, Antonio

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Low-Power, High-Performance, Non-volatile Inkjet-Printed HfO2-Based Resistive Random Access Memory: From Device to Nanoscale Characterization

ACS APPLIED MATERIALS & INTERFACES

IF8.2

2019-06-10

OAAI

Vescio, Giovanni; Martin, Gemma; Crespo-Yepes, Albert; Claramunt, Sergi; Alonso, Daniel; Lopez-Vidrier, Julian; Estrade, Sonia; Porti, Marc; Rodriguez, Rosana; Peiro, Francesca; Cornet, Albert; Cirera, Albert; Nafria, Montserrat

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Workfunction fluctuations in polycrystalline TiN observed with KPFM and their impact on MOSFETs variability

APPLIED PHYSICS LETTERS

IF3.6

2019-03-05

OAAI

Ruiz, A.; Seoane, N.; Claramunt, S.; Garcia-Loureiro, A.; Porti, M.; Couso, C.; Martin-Martinez, J.; Nafria, M.

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Reliability in Super- and Near-Threshold Computing: A Unified Model of RTN, BTI, and PV

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS

IF5.2

2018-01-01

PREAI

van Santen, Victor M.; Martin-Martinez, Javier; Amrouch, Hussam; Maqueda Nafria, Montserrat; Henkel, Jorg

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Nanoscale characterization of CH3-terminated Self-Assembled Monolayer on copper by advanced scanning probe microscopy techniques

APPLIED SURFACE SCIENCE

IF6.9

2015-11-01

PREAI

Berthold, Tobias; Benstetter, Guenther; Frammelsberger, Werner; Rodriguez, Rosana; Nafria, Montserrat

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Electrical and mechanical performance of graphene sheets exposed to oxidative environments

NANO RESEARCH

IF9

2013-05-21

PREAI

Lanza, Mario; Wang, Yan; Gao, Teng; Bayerl, Albin; Porti, Marc; Nafria, Montserrat; Zhou, Yangbo; Jing, Guangyin; Zhang, Yanfeng; Liu, Zhongfan; Yu, Dapeng; Duan, Huiling

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Graphene-Coated Atomic Force Microscope Tips for Reliable Nanoscale Electrical Characterization

ADVANCED MATERIALS

IF26.8

2012-12-27

PREAI

Lanza, M.; Bayerl, A.; Gao, T.; Porti, M.; Nafria, M.; Jing, G. Y.; Zhang, Y. F.; Liu, Z. F.; Duan, H. L.

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Resistive switching in hafnium dioxide layers: Local phenomenon at grain boundaries

APPLIED PHYSICS LETTERS

IF3.6

2012-11-06

159

OAAI

Lanza, M.; Bersuker, G.; Porti, M.; Miranda, E.; Nafria, M.; Aymerich, X.

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Research Directions