Canyam
AI summaries for academic research
Home
Preprint
Subscribe
Favorites
Tools
Analysis
Summary
Not logged in
Back
S
S.M. Reddy
Jain University
58
H-index
715
Paper Count
1.5W
Citation Count
0
Related Insights
Subscribe
Published Papers
26
Publication Date
Publication Date
Impact Factor
Citations
RETRACTION: Retraction Note: Utilizing hybrid computing models for network monitoring and security analysis through optical network modeling and data analytics
OPTICAL AND QUANTUM ELECTRONICS
IF
4
2024-09-09
0
PRE
AI
Reddy, Sudhakar; Rastogi, Ajay; Gupta, Mukur; Sharma, Vikas; Kolluru, Dakshinamurthy V.; Nair, Amrutha V.
Share
Save
RETRACTED: Utilizing hybrid computing models for network monitoring and security analysis through optical network modeling and data analytics (Retracted Article)
OPTICAL AND QUANTUM ELECTRONICS
IF
4
2023-12-14
1
PRE
AI
Reddy, Sudhakar; Rastogi, Ajay; Gupta, Mukur; Sharma, Vikas; Kolluru, Dakshinamurthy V.; Nair, Amrutha V.
Share
Save
Ni-Co-based bimetal organic framework as superior electrode material for hydrogen evolution reaction and supercapacitors
ENERGY STORAGE
IF
4
2023-11-30
2
PRE
AI
Bhardwaj, Shiva; Srivastava, Rishabh; Mageto, Teddy; Reddy, Sudhakar; Dawsey, Tim; Kumar, Anuj; Gupta, Ram
Share
Save
Modeling and Mitigating Transient Errors in Logic Circuits
IEEE TRANSACTIONS ON DEPENDABLE AND SECURE COMPUTING
IF
7.5
2011-07-01
22
OA
AI
Polian, Ilia; Hayes, John P.; Reddy, Sudhakar M.; Becker, Bernd
Share
Save
Equivalence, Dominance, and Similarity Relations between Fault Pairs and a Fault Pair Collapsing Process for Fault Diagnosis
IEEE TRANSACTIONS ON COMPUTERS
IF
3.8
2010-02-01
3
PRE
AI
Pomeranz, Irith; Reddy, Sudhakar M.
Share
Save
Semiconcurrent Online Testing of Transition Faults through Output Response Comparison of Identical Circuits
IEEE TRANSACTIONS ON DEPENDABLE AND SECURE COMPUTING
IF
7.5
2009-07-01
0
PRE
AI
Pomeranz, Irith; Reddy, Sudhakar M.
Share
Save
Workload-ahead-driven online energy minimization techniques for battery-powered embedded systems with time-constraints
ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS
IF
2
2007-01-01
6
OA
AI
Cai, Yuan; Schmitz, Marcus T.; Al-Hashimi, Bashir M.; Reddy, Sudhakar M.
Share
Save
On generating tests that avoid the detection of redundant faults in synchronous sequential circuits with full scan
IEEE TRANSACTIONS ON COMPUTERS
IF
3.8
2006-04-01
2
PRE
AI
Pomeranz, I; Reddy, SM
Share
Save
Concurrent online testing of identical circuits using nonidentical input vectors
IEEE TRANSACTIONS ON DEPENDABLE AND SECURE COMPUTING
IF
7.5
2005-03-01
3
PRE
AI
Pomeranz, I; Reddy, SM
Share
Save
Static test compaction for full-scan circuits based on combinational test sets and nonscan input sequences and a lower bound on the number of tests
IEEE TRANSACTIONS ON COMPUTERS
IF
3.8
2004-12-01
3
PRE
AI
Pomeranz, I; Reddy, SM
Share
Save
A measure of quality for n-detection test sets
IEEE TRANSACTIONS ON COMPUTERS
IF
3.8
2004-11-01
44
PRE
AI
Pomeranz, I; Reddy, SM
Share
Save
On maximizing the fault coverage for a given test length limit in a synchronous sequential circuit
IEEE TRANSACTIONS ON COMPUTERS
IF
3.8
2004-09-01
8
PRE
AI
Pomeranz, I; Reddy, SM
Share
Save
Masking of unknown output values during output response compression by using comparison units
IEEE TRANSACTIONS ON COMPUTERS
IF
3.8
2004-01-01
16
PRE
AI
Pomeranz, I; Kundu, S; Reddy, SM
Share
Save
A storage-based built-in test pattern generation method for scan circuits based on partitioning and reduction of a precomputed test set
IEEE TRANSACTIONS ON COMPUTERS
IF
3.8
2002-11-01
14
PRE
AI
Pomeranz, I; Reddy, SM
Share
Save
Enumeration of test sequences in increasing chronological order to improve the levels of compaction achieved by vector omission
IEEE TRANSACTIONS ON COMPUTERS
IF
3.8
2002-07-01
4
PRE
AI
Pomeranz, I; Reddy, SM
Share
Save
Built-in test sequence generation for synchronous sequential circuits based on loading and expansion of input sequences using single and multiple fault detection times
IEEE TRANSACTIONS ON COMPUTERS
IF
3.8
2002-04-01
0
PRE
AI
Pomeranz, I; Reddy, SM
Share
Save
Design-for-testability to achieve complete coverage of delay faults in standard full scan circuits
JOURNAL OF SYSTEMS ARCHITECTURE
IF
4.1
2001-04-01
0
PRE
AI
Pomeranz, I; Reddy, SM
Share
Save
Procedures for static compaction of test sequences for synchronous sequential circuits
IEEE TRANSACTIONS ON COMPUTERS
IF
3.8
2000-06-01
5
PRE
AI
Pomeranz, I; Reddy, SM
Share
Save
On the use of fully specified initial states for testing of synchronous sequential circuits
IEEE TRANSACTIONS ON COMPUTERS
IF
3.8
2000-01-01
5
PRE
AI
Pomeranz, I; Reddy, SM
Share
Save
On finding a minimal functional description of a finite-state machine for test generation for adjacent machines
IEEE TRANSACTIONS ON COMPUTERS
IF
3.8
2000-01-01
0
PRE
AI
Pomeranz, I; Reddy, SM
Share
Save
Research Directions
No research directions
Co-authors
Cooperation Journals
R
Ram K. Gupta
H-index: 60 · Papers: 767
J
John P. Hayes
H-index: 55 · Papers: 354
I
Irith Pomeranz
H-index: 49 · Papers: 809
B
Bashir M. Al‐Hashimi
H-index: 47 · Papers: 508
B
Bernd Becker
H-index: 39 · Papers: 686
View more
.png){kind=icon}
.png){kind=icon}
.png){kind=icon}
.png){kind=icon}
.png){kind=icon}
Share.png){kind=icon}
SaveShareSaveShareSave
Not logged in.png){kind=icon}
ShareSaveNot logged inShareSave