H.E. Maes - Publications, H-index & Citations

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H.E. Maes

interuniversity microelectronics centre

49H-index

396Paper Count

1.1WCitation Count

Published Papers 8

Publication Date

Control and readout of current-induced magnetic flux quantization in a superconducting transformer

SUPERCONDUCTOR SCIENCE & TECHNOLOGY

IF4.2

2008-12-23

PREAI

Kerner, C.; Hackens, B.; Golubovic, D. S.; Poli, S.; Faniel, S.; Magnus, W.; Schoenmaker, W.; Bayot, V.; Maes, H.

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Interface characterization of Si-passivated HfO2 germanium capacitors using DLTS measurements

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

IF4.6

2006-08-01

PREAI

Martens, K.; Simoen, E.; De Jaeger, B.; Meuris, M.; Groeseneken, G.; Maes, H.

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TSUPREM-4 based modeling of boron and carbon diffusion in SiGeC base layers under rapid thermal annealing conditions

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

IF4.6

2005-02-01

PREAI

Sibaja-Hernandez, A; Xu, MW; Decoutere, S; Maes, H

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Trends in microelectronics, optical detectors, and biosensors

ADVANCED ENGINEERING MATERIALS

IF3.3

2001-10-01

PREAI

Maes, HE; Claeys, C; Mertens, R; Campitelli, A; Van Hoof, C; De Boeck, J

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Effect of RuO2 growth temperature on ferroelectric properties of RuO2/Pb(Zr, Ti)O3/RuO2/Pt capacitors

APPLIED PHYSICS LETTERS

IF3.6

2000-03-06

PREAI

Norga, GJ; Fè, L; Wouters, DJ; Maes, HE

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Nonvolatile multilevel memories for digital applications

PROCEEDINGS OF THE IEEE

IF25.9

1998-01-01

158

PREAI

Riccò, B; Torelli, G; Lanzoni, M; Manstretta, A; Maes, HE; Montanari, D; Modelli, A

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Influence of Zr/Ti ratios on the deformation in the hysteresis loop of Pb(Zr,Ti)O-3 thin film capacitors

APPLIED PHYSICS LETTERS

IF3.6

1997-05-05

PREAI

Lee, EG; Wouters, DJ; Willems, G; Maes, HE

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Voltage shift and deformation in the hysteresis loop of Pb(Zr,Ti)O-3 thin film by defects

APPLIED PHYSICS LETTERS

IF3.6

1996-08-26

PREAI

Lee, EG; Wouters, DJ; Willems, G; Maes, HE

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Research Directions