arrow
Back
M

M. Jurczak

interuniversity microelectronics centre

56H-index
605Paper Count
1.3WCitation Count
Published Papers 32
Publication Date
Te-based chalcogenide materials for selector applications
err2017-08-14
err140
errOAAI
errVelea, A.; Opsomer, K.; Devulder, W.; Dumortier, J.; Fan, J.; Detavernier, C.; Jurczak, M.; Govoreanu, B.
errShare
errSave
Atomic Layer Deposition of Ruthenium Thin Films from (Ethylbenzyl) (1-Ethyl-1,4-cyclohexadienyl) Ru: Process Characteristics, Surface Chemistry, and Film Properties
err2017-05-31
err48
PREAI
errPopovici, Mihaela; Groven, Benjamin; Marcoen, Kristof; Quan Manh Phung; Dutta, Shibesh; Swerts, Johan; Meersschaut, Johan; van den Berg, Jaap A.; Franquet, Alexis; Moussa, Alain; Vanstreels, Kris; Lagrain, Pieter; Bender, Hugo; Jurczak, Malgorzata; Van Elshocht, Sven; Delabie, Annelies; Adelmann, Christoph
errShare
errSave
All-nanocellulose nonvolatile resistive memory
err2016-09-16
err68
errOAAI
errCelano, Umberto; Nagashima, Kazuki; Koga, Hirotaka; Nogi, Masaya; Zhuge, Fuwei; Meng, Gang; He, Yong; De Boeck, Jo; Jurczak, Malgorzata; Vandervorst, Wilfried; Yanagida, Takeshi
errShare
errSave
Transient Thermometry and High-Resolution Transmission Electron Microscopy Analysis of Filamentary Resistive Switches
err2016-07-26
err34
PREAI
errKwon, Jonghan; Sharma, Abhishek A.; Chen, Chao-Yang; Fantini, Andrea; Jurczak, Malgorzata; Herzing, Andrew A.; Bain, James A.; Picard, Yoosuf N.; Skowronski, Marek
errShare
errSave
Multimode resistive switching in nanoscale hafnium oxide stack as studied by atomic force microscopy
err2016-07-12
err16
PREAI
errHou, Y.; Celano, U.; Goux, L.; Liu, L.; Degraeve, R.; Cheng, Y.; Kang, J.; Jurczak, M.; Vandervorst, W.
errShare
errSave
Sub-10 nm low current resistive switching behavior in hafnium oxide stack
err2016-03-24
err31
PREAI
errHou, Y.; Celano, U.; Goux, L.; Liu, L.; Fantini, A.; Degraeve, R.; Youssef, A.; Xu, Z.; Cheng, Y.; Kang, J.; Jurczak, M.; Vandervorst, W.
errShare
errSave
Nanoscopic structural rearrangements of the Cu-filament in conductive-bridge memories
err2016-01-01
err46
PREAI
errCelano, U.; Giammaria, G.; Goux, L.; Belmonte, A.; Jurczak, M.; Vandervorst, W.
errShare
errSave
Imaging the Three-Dimensional Conductive Channel in Filamentary-Based Oxide Resistive Switching Memory
err2015-11-03
err170
PREAI
errCelano, Umberto; Goux, Ludovic; Degraeve, Robin; Fantini, Andrea; Richard, Olivier; Bender, Hugo; Jurczak, Malgorzata; Vandervorst, Wilfried
errShare
errSave
Ab initio modeling of oxygen-vacancy formation in doped-HfOx RRAM: Effects of oxide phases, stoichiometry, and dopant concentrations
err2015-07-06
err55
PREAI
errZhao, Liang; Clima, Sergiu; Magyari-Kope, Blanka; Jurczak, Malgorzata; Nishi, Yoshio
errShare
errSave
Endurance degradation mechanisms in TiN\Ta2O5\Ta resistive random-access memory cells
err2015-02-02
err43
PREAI
errChen, C. Y.; Goux, L.; Fantini, A.; Clima, S.; Degraeve, R.; Redolfi, A.; Chen, Y. Y.; Groeseneken, G.; Jurczak, M.
errShare
errSave
Improved thermal stability and retention properties of Cu-Te based CBRAM by Ge alloying
err2015-01-01
err16
PREAI
errDevulder, Wouter; Opsomer, Karl; Rampelberg, Geert; De Schutter, Bob; Devloo-Casier, Kilian; Jurczak, Malgorzata; Goux, Ludovic; Detavernier, Christophe
errShare
errSave
Metal-Insulator Transition in ALD VO2 Ultrathin Films and Nanoparticles: Morphological Control
err2014-12-15
err85
PREAI
errPeter, Antony P.; Martens, Koen; Rampelberg, Geert; Toeller, Michael; Ablett, James M.; Meersschaut, Johan; Cuypers, Daniel; Franquet, Alexis; Detavernier, Christophe; Rueff, Jean-Pascal; Schaekers, Marc; Van Elshocht, Sven; Jurczak, Malgorzata; Adelmann, Christoph; Radu, Iuliana P.
errShare
errSave
Cellulose Nanofiber Paper as an Ultra Flexible Nonvolatile Memory
err2014-07-02
err117
errOAAI
errNagashima, Kazuki; Koga, Hirotaka; Celano, Umberto; Zhuge, Fuwei; Kanai, Masaki; Rahong, Sakon; Meng, Gang; He, Yong; De Boeck, Jo; Jurczak, Malgorzata; Vandervorst, Wilfried; Kitaoka, Takuya; Nogi, Masaya; Yanagida, Takeshi
errShare
errSave
Three-Dimensional Observation of the Conductive Filament in Nanoscaled Resistive Memory Devices
err2014-04-10
err303
PREAI
errCelano, Umberto; Goux, Ludovic; Belmonte, Attilio; Opsomer, Karl; Franquet, Alexis; Schulze, Andreas; Detavernier, Christophe; Richard, Olivier; Bender, Hugo; Jurczak, Malgorzata; Vandervorst, Wilfried
errShare
errSave
Identification of the ferroelectric switching process and dopant-dependent switching properties in orthorhombic HfO2: A first principles insight
err2014-03-05
err210
PREAI
errClima, S.; Wouters, D. J.; Adelmann, C.; Schenk, T.; Schroeder, U.; Jurczak, M.; Pourtois, G.
errShare
errSave
Low leakage Ru-strontium titanate-Ru metal-insulator-metal capacitors for sub-20 nm technology node in dynamic random access memory
err2014-02-26
err34
PREAI
errPopovici, M.; Swerts, J.; Redolfi, A.; Kaczer, B.; Aoulaiche, M.; Radu, I.; Clima, S.; Everaert, J. -L.; Van Elshocht, S.; Jurczak, M.
errShare
errSave
Influence of Carbon Alloying on the Thermal Stability and Resistive Switching Behavior of Copper-Telluride Based CBRAM Cells
err2013-07-17
err35
errOAAI
errDevulder, Wouter; Opsomer, Karl; Seidel, Felix; Belmonte, Attilio; Muller, Robert; De Schutter, Bob; Bender, Hugo; Vandervorst, Wilfried; Van Elshocht, Sven; Jurczak, Malgorzata; Goux, Ludovic; Detavernier, Christophe
errShare
errSave
Filament observation in metal-oxide resistive switching devices
err2013-03-26
err99
PREAI
errCelano, Umberto; Chen, Yang Yin; Wouters, Dirk J.; Groeseneken, Guido; Jurczak, Malgorzata; Vandervorst, Wilfried
errShare
errSave
Switching mechanism and reverse engineering of low-power Cu-based resistive switching devices
err2013-01-01
err31
PREAI
errCelano, Umberto; Goux, Ludovic; Opsomer, Karl; Belmonte, Attilio; Iapichino, Martina; Detavernier, Christophe; Jurczak, Malgorzata; Vandervorst, Wilfried
errShare
errSave