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M

Mu Nie

integrated circuits

4H-index
13Paper Count
45Citation Count
Published Papers 5
Publication Date
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Dynamic Meta-Learning with Attentional Prototypes for Few-Shot Wafer Defect Recognition
errJournal of Electronic Testing
IF0
err2026-04-06
err0
PREAI
errTianming Ni; Meifang Yu; Xiaofei Chen; Huaguo Liang; Senling Wang; Muyang Cheng; Mu Nie
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LoongTrack: Exploring long-sequence modeling for visual tracking
errNeural Networks
IF6.3
err2026-03-09
err0
PREAI
errWenkang Zhang; Tianyang Xu; Fei Xie; Mu Nie; Wankou Yang
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errSave
Incremental learning strategies for improved detection of unknown defects in wafer maps with limited samples
errComputers in Industry
IF9.1
err2026-01-05
err0
PREAI
errTianming Ni; Wen Jiang; Huaguo Liang; Xiaoqing Wen; Mu Nie
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errSave
Airs-Net: Adversarial-Improved Reversible Steganography Network for CT Images in the Internet of Medical Things and Telemedicine
errIEEE Journal of Biomedical and Health Informatics
IF6.8
err2025-08-22
err0
PREAI
errKai Chen; Mu Nie; Jean-Louis Coatrieux; Yang Chen; Shipeng Xie
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A Response-Nonlinearized DEMUX-TDC PUF for Resistance Against Modeling Attacks and Secure Authentication Protocols
errIEEE Transactions on Very Large Scale Integration (VLSI) Systems
IF3.1
err
err0
PREAI
errTianming Ni; Hao Wu; Mu Nie; Aibin Yan; Senling Wang; Xiaoqing Wen; Jingchang Bian
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errSave

Research Directions

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Co-authors
Cooperation Journals
陈阳 cover
陈阳 (Yang Chen)
H-index: 52 · Papers: 550
X
Xiaoqing Wen
H-index: 38 · Papers: 380
J
Jean-Louis Coatrieux
H-index: 37 · Papers: 289
W
Wankou Yang
H-index: 34 · Papers: 282
T
Tianyang Xu
H-index: 32 · Papers: 254
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