logo
CanyamAI summaries for academic research
language
MobileMobile
  • Phone FeatureWeChat Mini Program
EnglishEnglish
noticeNotice
BlogBlog
delete
arrow
BackJournal Details
J

Journal of Electronic Testing

IF
Papers21
Citations
Journal Papers 20
Publication Date
delete
A 1 ps Resolution Built–Out Self–Test (BOST) Method for GaN Gate Drivers Using Gaussian–Distributed Dither (GDD)
deleteJournal of Electronic Testing
IF0
delete2026-06-19
delete0
PREAI
deleteKeno Sato; Masaya Hirakawa; Kenta Suzuki; Haruo Kobayashi
deleteShare
deleteSave
Using DC Transistor Characterization Measurements for LNA Design at Cryogenic Temperatures
deleteJournal of Electronic Testing
IF0
delete2026-06-08
delete0
PREAI
deleteGiovani Britton; Salvador Mir; Estelle Lauga-Larroze; Benjamin Dormieu; José Lugo; Joao Azevedo; Sebastien Sadlo; Quentin Berlingard; Mikaël Cassé; Philippe Galy
deleteShare
deleteSave
GHOST: Graph-based Hardware Ownership Security through Traceability
deleteJournal of Electronic Testing
IF0
delete2026-06-05
delete0
PREAI
deleteAshwin C.S; Suchismita Roy
deleteShare
deleteSave
A Low-Delay Power-Efficient 14T SRAM with Word-Line Separation for Radiation-Hardened Aerospace applications
deleteJournal of Electronic Testing
IF0
delete2026-06-04
delete0
PREAI
deleteShuo Cai; Maoxuan Wei; Zhu Huang; Wei Shuai; Fei Yu
deleteShare
deleteSave
Study on Analysis and Troubleshooting Methods for Common Faults of a Certain Type of On-board Recorder
deleteJournal of Electronic Testing
IF0
delete2026-06-01
delete0
PREAI
deleteNing Wang; Xiang Fan; Zhenquan Zhou; Lihong Zheng
deleteShare
deleteSave
Comparative Design and Analysis of RHBD SRAM Cells for Space Applications
deleteJournal of Electronic Testing
IF0
delete2026-06-01
delete0
PREAI
deleteJamuna S.; Hannan Ashrafi; Suma M. R.; Srividya L.; Suraj Malagar; T Mohammad Nisar
deleteShare
deleteSave
ATPG Optimization for Bridging Faults in Incomplete Testing of SoCs
deleteJournal of Electronic Testing
IF0
delete2026-06-01
delete0
PREAI
deleteKunwer Mrityunjay Singh; Santosh Biswas; Jatindra Deka
deleteShare
deleteSave
Extended Multi-Region Hamming-based ECC for Mitigating Clustered Faults in 3D Memories
deleteJournal of Electronic Testing
IF0
delete2026-06-01
delete0
PREAI
deleteAkshith Kannan; Hafsa Ariba; Hitha B M; Jyotsna Padmanaban Kamali; Sunita M S
deleteShare
deleteSave
An Ultra-Broadband On-Chip DC-Feed Block for Sub-THz Applications in InP Technology
deleteJournal of Electronic Testing
IF0
delete2026-05-21
delete0
PREAI
deleteYao Li; Yan Gao; Liang Zhao; Yan Sun; Weihua Yu
deleteShare
deleteSave
Dynamic Meta-Learning with Attentional Prototypes for Few-Shot Wafer Defect Recognition
deleteJournal of Electronic Testing
IF0
delete2026-04-06
delete0
PREAI
deleteTianming Ni; Meifang Yu; Xiaofei Chen; Huaguo Liang; Senling Wang; Muyang Cheng; Mu Nie
deleteShare
deleteSave
New Primitive Polynomials over GF(2) of Degree 661 Through 1200 for In-System Test Applications
deleteJournal of Electronic Testing
IF0
delete2026-04-01
delete0
PREAI
deleteGrzegorz Mrugalski; Janusz Rajski; Maciej Trawka; Jerzy Tyszer
deleteShare
deleteSave
Error Resilient Transformers: A Novel Soft Error Vulnerability Guided Approach to Error Checking and Suppression
deleteJournal of Electronic Testing
IF0
delete2026-04-01
delete0
deleteOAAI
deleteKwondo Ma; Chandramouli Amarnath; Jackson Isenberg; Abhijit Chatterjee
deleteShare
deleteSave
ResNeSt Wafer Map Defect Pattern Recognition Based on the Multi-attention Mechanism and Enhanced Activation Function
deleteJournal of Electronic Testing
IF0
delete2026-04-01
delete0
PREAI
deleteShouhong Chen; Lingfeng Han; Cong Wei; Ziren Zhu; Xingna Hou; Ling Guo
deleteShare
deleteSave
Nonvolatile Flip-Flop Designs with Soft Error Recovery Based on Magnetic Tunnel Junction and CMOS for Aerospace Applications
deleteJournal of Electronic Testing
IF0
delete2026-04-01
delete0
PREAI
deleteZhongyu Gao; Huan Liu; Jie Song; Zhiyuan Pei; Wangjin Jiang; Qijun Wang; Xiaoqing Wen
deleteShare
deleteSave
Optimized QCA-Based SRAM Cell Using a D-latch: Design and Performance Analysis
deleteJournal of Electronic Testing
IF0
delete2026-03-25
delete0
PREAI
deleteAbhinav Tripathi; G. R. Mishra; Geetika Srivastava; Sachin Singh; Vandana Dubey
deleteShare
deleteSave
SAF-YOLO: a Semantic-Aware Lightweight Framework for Fine-Grained PCB Defect Detection
deleteJournal of Electronic Testing
IF0
delete2026-03-24
delete0
PREAI
deleteXianjun Du; Jingxiang Wang
deleteShare
deleteSave
Exploring Differential Evolution Algorithms in Search of Best Test Vector for Digital Circuit Testing
deleteJournal of Electronic Testing
IF0
delete2026-03-23
delete0
PREAI
deleteIsha Dubey; Manish Kumar; Priyajit Bhattacharya; Rahul Bhattacharya
deleteShare
deleteSave
An Efficient Cybersecurity Method to Detect Phishing Attacks Integrating Heuristic-Driven Feature Optimizer and Deep Learning Algorithms
deleteJournal of Electronic Testing
IF0
delete2026-01-01
delete0
PREAI
deleteShaoju Li; Asgarali Bouyer; Bahman Arasteh
deleteShare
deleteSave
Advancing Low Power BIST Architecture with GAN-Driven Test Pattern Optimization
deleteJournal of Electronic Testing
IF0
delete2024-11-13
delete0
PREAI
deleteC. Thangam; R. Manjith
deleteShare
deleteSave
MATLAB-Open Source Tool Based Framework for Test Generation for Digital Circuits Using Evolutionary Algorithms
deleteJournal of Electronic Testing
IF0
delete2023-10-24
delete0
PREAI
deletePriyajit Bhattacharya; Rahul Bhattacharya; Himasree Deka
deleteShare
deleteSave