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Adrianna Piejko

wroclaw university of science & technology

4H-index
9Paper Count
37Citation Count
Published Papers 7
Publication Date
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Effect of Temperature on the Optoelectrical Properties of Photodetectors Based on Mo(SXSe1-X)2 Alloys
errACS APPLIED ELECTRONIC MATERIALS
IF4.7
err2025-12-01
err0
PREAI
errKrol, Konrad; Tamulewicz-Szwajkowska, Magdalena; Piejko, Adrianna; Kopaczek, Jan; Gelczuk, Lukasz; Serafinczuk, Jaroslaw
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Engineering of Interface Barrier in Hybrid MXene/GaN Heterostructures for Schottky Diode Applications
errACS APPLIED MATERIALS & INTERFACES
IF8.2
err2024-10-18
err0
errOAAI
errMajchrzak, Dominika; Kulinowski, Karol; Olszewski, Wojciech; Kuna, Rafal; Hlushchenko, Daria; Piejko, Adrianna; Grodzicki, Milosz; Hommel, Detlef; Kudrawiec, Robert
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Thickness and Mg doping of graded AlGaN layers: Influence on contact layer's structural and electrical properties for DUV emitters
errMATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
IF4.6
err2024-08-01
err1
errOAAI
errMajchrzak, D.; Tran, L. M.; Babij, M.; Serafinczuk, J.; Olszewski, W.; Kuna, R.; Opolczynska, K.; Piejko, A.; Michalowski, P. P.; Kudrawiec, R.; Hommel, D.
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Electronic Band Structure and Optical Properties of HgPS3 Crystal and Layers
errJOURNAL OF PHYSICAL CHEMISTRY C
IF3.2
err2024-05-24
err0
errOAAI
errde Simoni, Beatriz; Rybak, Milosz; Antonatos, Nikolas; Herman, Artur P.; Ciesiolkiewicz, Karolina; Tolloczko, Agata K.; Peter, Maciej; Piejko, Adrianna; Mosina, Kseniia; Sofer, Zdenek; Kudrawiec, Robert
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High-resolution X-ray diffraction to probe quantum dot asymmetry
errMEASUREMENT
IF5.6
err2023-11-01
err2
errOAAI
errSerafinczuk, J.; Rudno-Rudzinski, W.; Gawelczyk, M.; Podemski, P.; Parzyszek, K.; Piejko, A.; Sichkovskyi, V.; Reithmaier, J. P.; Sek, G.
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Four-Point Measurement Setup for Correlative Microscopy of Nanowires
errNANOMATERIALS
IF4.3
err2023-08-30
err1
errOAAI
errPruchnik, Bartosz C.; Fidelus, Janusz D.; Gacka, Ewelina; Kwoka, Krzysztof; Pruchnik, Julia; Piejko, Adrianna; Usydus, Lukasz; Zaraska, Leszek; Sulka, Grzegorz D.; Piasecki, Tomasz; Gotszalk, Teodor P.
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Impedance spectroscopy of electrostatically driven MEMS resonators
errMEASUREMENT
IF5.6
err2023-06-01
err1
PREAI
errKwoka, Krzysztof; Piasecki, Tomasz; Orlowska, Karolina; Grabarczyk, Paulina; Sierakowski, Andrzej; Gotszalk, Teodor; Gacka, Ewelina; Piejko, Adrianna; Gajewski, Krzysztof
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Research Directions

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Co-authors
Cooperation Journals
Z
Zdeněk Sofer
H-index: 98 · Papers: 1.1K
D
D. Hommel
H-index: 48 · Papers: 685
R
R. Kudrawiec
H-index: 43 · Papers: 586
G
Grzegorz D. Sulka
H-index: 41 · Papers: 219
J
Johann Peter Reithmaier
H-index: 38 · Papers: 424
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