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W

Werner Frammelsberger

university of barcelona

11H-index
38Paper Count
493Citation Count
Published Papers 9
Publication Date
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Current-Limited Conductive Atomic Force Microscopy
errACS APPLIED MATERIALS & INTERFACES
IF8.2
err2023-11-21
err4
PREAI
errWeber, Jonas; Yuan, Yue; Pazos, Sebastian; Kuehnel, Fabian; Metzke, Christoph; Schaetz, Josef; Frammelsberger, Werner; Benstetter, Guenther; Lanza, Mario
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Solid Platinum Nanoprobes for Highly Reliable Conductive Atomic Force Microscopy
errACS APPLIED MATERIALS & INTERFACES
IF8.2
err2023-04-21
err7
errOAAI
errWeber, Jonas; Yuan, Yue; Kuehnel, Fabian; Metzke, Christoph; Schaetz, Josef; Frammelsberger, Werner; Benstetter, Guenther; Lanza, Mario
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Dielectric Properties of Ultrathin CaF2Ionic Crystals
errADVANCED MATERIALS
IF26.8
err2020-07-14
err54
PREAI
errWen, Chao; Banshchikov, Alexander G.; Illarionov, Yury Y.; Frammelsberger, Werner; Knobloch, Theresia; Hui, Fei; Sokolov, Nikolai S.; Grasser, Tibor; Lanza, Mario
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On the Limits of Scanning Thermal Microscopy of Ultrathin Films
errMATERIALS
IF3.2
err2020-01-22
err9
errOAAI
errMetzke, Christoph; Frammelsberger, Werner; Weber, Jonas; Kuehnel, Fabian; Zhu, Kaichen; Lanza, Mario; Benstetter, Guenther
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errSave
Understanding Current Instabilities in Conductive Atomic Force Microscopy
errMATERIALS
IF3.2
err2019-02-01
err16
errOAAI
errJiang, Lanlan; Weber, Jonas; Puglisi, Francesco Maria; Pavan, Paolo; Larcher, Luca; Frammelsberger, Werner; Benstetter, Guenther; Lanza, Mario
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Nanoscale characterization of CH3-terminated Self-Assembled Monolayer on copper by advanced scanning probe microscopy techniques
errAPPLIED SURFACE SCIENCE
IF6.9
err2015-11-01
err4
PREAI
errBerthold, Tobias; Benstetter, Guenther; Frammelsberger, Werner; Rodriguez, Rosana; Nafria, Montserrat
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C-AFM-based thickness determination of thin and ultra-thin SiO2 films by use of different conductive-coated probe tips
errAPPLIED SURFACE SCIENCE
IF6.9
err2007-01-01
err95
PREAI
errFrammelsberger, Werner; Benstetter, Guenther; Kiely, Janice; Stamp, Richard
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Thickness determination of thin and ultra-thin SiO2 films by C-AFM IV-spectroscopy
errAPPLIED SURFACE SCIENCE
IF6.9
err2006-01-01
err48
PREAI
errFrammelsberger, W; Benstetter, G; Kiely, J; Stamp, R
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The effect of the surface layer of tetrahedral amorphous carbon films on their tribological and electron emission properties investigated by atomic force microscopy
errAPPLIED PHYSICS LETTERS
IF3.6
err2003-06-02
err33
PREAI
errLiu, DP; Benstetter, G; Frammelsberger, W
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Research Directions

No research directions
Co-authors
Cooperation Journals
T
Tibor Grasser
H-index: 59 · Papers: 756
M
Mario Lanza
H-index: 54 · Papers: 324
L
Luca Larcher
H-index: 51 · Papers: 355
M
M. Nafrı́a
H-index: 36 · Papers: 351
P
Paolo Pavan
H-index: 33 · Papers: 318
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