arrow
Back
A

Andrew Stollenwerk

university of northern iowa

10H-index
61Paper Count
533Citation Count
Published Papers 21
Publication Date
Binding mechanism of Ni and Cu on layered semiconductors
err2025-12-15
err0
PREAI
errCaden Sadler; Ty Porter; Timothy E Kidd; Paul M Shand; Andrew J Stollenwerk; Pavel V Lukashev
errShare
errSave
Surface deposition of nanometer scale carbon structures on Bi2Sr2CaCu2O8+δ using a low-cost scanning electron microscope
err2025-12-01
err0
PREAI
errPorter, Ty; Hemesath, Colin M.; Lukashev, Pavel V.; Ye, Gaihua; Nnokwe, Cynthia; He, Rui; Wei, Bingqiang; Zhou, Lin; Gu, Genda; Shand, Paul M.; Kidd, Timothy E.; Stollenwerk, Andrew J.
errShare
errSave
Dilute magnetic impurity-induced effective phonon magnetic moment in Fe-doped monolayer MoS2
err2025-09-19
err0
PREAI
errHussam Mustafa; Gaihua Ye; Cynthia Nnokwe; Mengqi Fang; Mohamed Kandil; Abdullah Al-Mahboob; Kai Wu; Andrew James Stollenwerk; Timothy E Kidd; Paul M Shand; Jerzy T Sadowski; Eui-Hyeok Yang; Yinong Zhou; Rui He; Wencan Jin
errShare
errSave
Surface dependence of electronic growth of Cu(111) on MoS2
err2024-08-21
err1
PREAI
errHarms, Haley A.; Cunningham, Connor J.; Kidd, Timothy E.; Stollenwerk, Andrew J.
errShare
errSave
Hopping crossover and high-temperature superspin glass behavior in Ni films deposited on MoS2
err2024-06-27
err2
PREAI
errShand, P. M.; Moua, Y.; Harms, H.; Gorgen, C.; Cunningham, C. J.; Lukashev, P., V; Kidd, T. E.; Stollenwerk, A. J.
errShare
errSave
Natural formation of linear defect structures in MoS2
err2024-02-23
err2
PREAI
errLukashev, Pavel V.; Kidd, Timothy E.; Harms, Haley A.; Gorgen, Colin; Stollenwerk, Andrew J.
errShare
errSave
Preparation of Ultrathin Gold Films with Subatomic Surface Roughness
err2021-07-26
err7
errOAAI
errKidd, Timothy E.; Weber, Jacob; O'Leary, Evan; Stollenwerk, Andrew James
errShare
errSave
Self-assembled Ag(111) nanostructures induced by Fermi surface nesting
err2019-12-24
err8
errOAAI
errKidd, Timothy E.; O'Leary, Evan; Anderson, Aaron; Scott, Skylar; Stollenwerk, Andrew J.
errShare
errSave
Influence of interface coupling on the electronic properties of the Au/MoS2 junction
err2015-11-06
err15
errOAAI
errCook, Matt; Palandech, Robert; Doore, Keith; Ye, Zhipeng; Ye, Gaihua; He, Rui; Stollenwerk, Andrew J.
errShare
errSave
Manipulation of subsurface carbon nanoparticles in Bi2Sr2CaCu2O8+δ using a scanning tunneling microscope
err2015-03-19
err2
errOAAI
errStollenwerk, A. J.; Hurley, N.; Beck, B.; Spurgeon, K.; Kidd, T. E.; Gu, G.
errShare
errSave
Universal Method for Creating Optically Active Nanostructures on Layered Materials
err2014-05-13
err2
PREAI
errKidd, Timothy E.; O'Shea, Aaron; Beck, Benjamin; He, Rui; Delaney, Conor; Shand, Paul M.; Strauss, Laura H.; Stollenwerk, Andrew; Hurley, Noah; Spurgeon, Kyle; Gu, Genda
errShare
errSave
Ballistic electron transport properties across the manganese/silicon interface
err2013-03-08
err2
PREAI
errFriend, B. E.; Wolter, E.; Kidd, T. E.; Stollenwerk, A. J.
errShare
errSave
Emergence of Long Range One-Dimensional Nanostructures in a Disordered Two-Dimensional System: Mn-Doped Ti1+δS2
err2012-01-04
err3
PREAI
errStollenwerk, Andrew J.; O'Shea, Aaron; Wolter, Erik; Roth, Michael W.; Strauss, Laura H.; Kidd, Timothy E.
errShare
errSave
Measuring charge trap occupation and energy level in CdSe/ZnS quantum dots using a scanning tunneling microscope
err2010-03-22
err49
errOAAI
errHummon, M. R.; Stollenwerk, A. J.; Narayanamurti, V.; Anikeeva, P. O.; Panzer, M. J.; Wood, V.; Bulovic, V.
errShare
errSave
errShare
errSave
Effect of interface band structure on hot-electron attenuation lengths in Au thin films
err2008-01-25
err10
PREAI
errStollenwerk, A. J.; Spadafora, E. J.; Garramone, J. J.; Matyi, R. J.; Moore, R. L.; LaBella, V. P.
errShare
errSave
errShare
errSave
Measurement of the clustering energy for manganese silicide islands on Si(001) by Ostwald ripening
err2007-07-24
err7
PREAI
errKrause, M. R.; Stollenwerk, A. J.; Licurse, M.; LaBella, V. P.
errShare
errSave
Electronic structure changes of Si(001)-(2x1) from subsurface Mn observed by STM
err2007-05-18
err29
errOAAI
errKrause, M. R.; Stollenwerk, A. J.; Reed, J.; LaBella, V. P.; Hortamani, M.; Kratzer, P.; Scheffler, M.
errShare
errSave
errShare
errSave