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U

Umberto Celano

arizona state university

29H-index
151Paper Count
3.4KCitation Count
Published Papers 46
Publication Date
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Who needs an electrical back-contact after all?
errNanoscale
IF5.1
err2026-05-06
err0
PREAI
errMd Ashiqur Rahman Laskar; Md Jayed Hossain; Srijan Chakrabarti; Sanchari Sen; Renee Sailus; Youssry Botros; Milan Pesic; Rob Davenport; Ondřej Novotný; Jelínek Eduard; Albert Davydov; Ivan Sanchez Esqueda; Seth Ariel Tongay; Umberto Celano
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Reactive Pulsed Laser Deposition of Epitaxial Bi2O2Se for Field-Effect Transistor Application
errAdvanced Functional Materials
IF19
err2026-05-02
err0
PREAI
errCheng-Lun Wu; Jing Xie; Jayed Hossain; Ângela Agra; Girish J. Patil; Ashiqur Rahman Laskar; Ayesha B. Rahman; Milan Pesic; Youssry Y. Botros; Umberto Celano; Ivan Sanchez Esqueda; Seth Ariel Tongay
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Electrical Conductivity of Copper-Graphene (Cu-Gr) Composites: The Underlying Mechanisms of Ultrahigh Conductivity
errSmall
IF12.1
err2026-04-01
err0
PREAI
errYao, Jiali; Das, Uschuas Dipta; Safari, Hamid; Laskar, Md Ashiqur Rahman; Yeom, Junghoon; Celano, Umberto; Kang, Wonmo
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Electron-Beam Excited Conductive Atomic Force Microscopy for Back Contact Free, Wafer-Scale and In-Line Compatible Electrical Characterization of 2D Materials (Adv. Sci. 44/2025)
errAdvanced Science
IF14.1
err2025-11-27
err0
errOAAI
errMd Ashiqur Rahman Laskar; Sakib Ahmed; Pinakapani Tummala; Alessandro Molle; Alessio Lamperti; Renee Sailus; Youssry Y Botros; Milan Pesic; Rob Davenport; Ondřej Novotný; Jan Neuman; Fabrizio Toia; Ivan Sanchez Esqueda; Seth Ariel Tongay; Umberto Celano
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errSave
Selected Papers from the 50th International Symposium for Testing and Failure Analysis (ISTFA 2024)
errJOURNAL OF FAILURE ANALYSIS AND PREVENTION
IF1.2
err2025-10-01
err0
errOAAI
errCelano, Umberto; Altmann, Frank
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errSave
Electron-Beam Excited Conductive Atomic Force Microscopy for Back Contact Free, Wafer-Scale and In-Line Compatible Electrical Characterization of 2D Materials
errAdvanced Science
IF14.1
err2025-08-27
err0
errOAAI
errMd Ashiqur Rahman Laskar; Sakib Ahmed; Pinakapani Tummala; Alessandro Molle; Alessio Lamperti; Renee Sailus; Youssry Y Botros; Milan Pesic; Rob Davenport; Ondřej Novotný; Jan Neuman; Fabrizio Toia; Ivan Sanchez Esqueda; Seth Ariel Tongay; Umberto Celano
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In-Situ Workflow for Electrical Characterization of Semiconducting Structures using AFM-in-SEM Technology
errMicroscopy and Microanalysis
IF3
err2025-07-25
err0
errOAAI
errOndřej Novotný; Veronika Hegrová; Rosalinda Ring; Umberto Celano; Jan Neuman
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errSave
Optimizing electrical AFM probing for 2D materials: The crucial role of tip-sample electrical interactions and back contact configurations
errMATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
IF4.6
err2025-03-01
err0
PREAI
errLaskar, Md Ashiqur Rahman; Chakrabarti, Srijan; Ahmed, Sakib; Ghoreishi, S. Amir; Tummala, Pinakapani; Afanas'ev, Valeri; Molle, Alessandro; Lamperti, Alessio; Celano, Umberto
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Controllable synthesis of environmentally stable vdW antiferromagnetic oxyhalide CrOCl
errNANOSCALE
IF5.1
err2025-01-01
err0
PREAI
errBanerjee, Rounak; Uppala, Sai; Kopaczek, Jan; Ahmed, Sakib; Wu, Cheng-Lun; Kumar, Mukesh; Yumigeta, Kentaro; Celano, Umberto; Tongay, Seth Ariel
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Adaptive Scalpel Scanning Probe Microscopy for Enhanced Volumetric Sensing in Tomographic Analysis
errADVANCED MATERIALS INTERFACES
IF4.4
err2024-06-24
err1
errOAAI
errLaskar, Md Ashiqur Rahman; Leonetti, Giuseppe; Milano, Gianluca; Novotny, Ondrej; Neuman, Jan; Tongay, Sefaattin; Celano, Umberto
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errSave
Nano-positive up negative down in binary oxide ferroelectrics
errAPL MATERIALS
IF4.5
err2024-02-14
err1
errOAAI
errGomez, Andres; Celano, Umberto
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errSave
Quantum Conductance in Vertical Hexagonal Boron Nitride Memristors with Graphene-Edge Contacts
errNANO LETTERS
IF9.1
err2024-01-22
err8
PREAI
errXie, Jing; Patoary, Md Naim; Rahman Laskar, Md Ashiqur; Ignacio, Nicholas D.; Zhan, Xun; Celano, Umberto; Akinwande, Deji; Esqueda, Ivan Sanchez
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Probing geometry-induced magnetic defects in cylindrical modulated nanowires with optically detected spin resonance in nitrogen-vacancy center in diamond
errNANOSCALE
IF5.1
err2024-01-01
err0
PREAI
errCelano, Umberto; Rickhaus, Peter; Bran, Cristina; Marques-Marchan, Jorge; Borras, Vicent J.; Korytov, Maxim; Asenjo, Agustina; Vazquez, Manuel
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Comprehensive Investigation of Constant Voltage Stress Time-Dependent Breakdown and Cycle-to-Breakdown Reliability in Y-Doped and Si-Doped HfO2 Metal-Ferroelectric-Metal Memory
errNANOMATERIALS
IF4.3
err2023-07-19
err0
errOAAI
errChang, Ting-Yu; Wang, Kuan-Chi; Liu, Hsien-Yang; Hseun, Jing-Hua; Peng, Wei-Cheng; Ronchi, Nicolo; Celano, Umberto; Banerjee, Kaustuv; Van Houdt, Jan; Wu, Tian-Li
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Advanced characterization methods for HfO2/ZrO2-based ferroelectrics
errFRONTIERS IN NANOTECHNOLOGY
IF3.8
err2023-01-24
err2
errOAAI
errLomenzo, Patrick D. D.; Celano, Umberto; Kaempfe, Thomas; McMitchell, Sean R. C.
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errSave
Quantum Conductance in Memristive Devices: Fundamentals, Developments, and Applications
errADVANCED MATERIALS
IF26.8
err2022-07-01
err52
errOAAI
errMilano, Gianluca; Aono, Masakazu; Boarino, Luca; Celano, Umberto; Hasegawa, Tsuyoshi; Kozicki, Michael; Majumdar, Sayani; Menghini, Mariela; Miranda, Enrique; Ricciardi, Carlo; Tappertzhofen, Stefan; Terabe, Kazuya; Valov, Ilia
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Probing Magnetic Defects in Ultra-Scaled Nanowires with Optically Detected Spin Resonance in Nitrogen-Vacancy Center in Diamond
errNANO LETTERS
IF9.1
err2021-12-09
err7
errOAAI
errCelano, Umberto; Zhong, Hai; Ciubotaru, Florin; Stoleriu, Laurentiu; Stark, Alexander; Rickhaus, Peter; de Oliveira, Felipe Favaro; Munsch, Mathieu; Favia, Paola; Korytov, Maxim; Van Marcke, Patricia; Maletinsky, Patrick; Adelmann, Christoph; van der Heide, Paul
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Electrical tuning of phase-change antennas and metasurfaces
errNATURE NANOTECHNOLOGY
IF34.9
err2021-04-19
err240
PREAI
errWang, Yifei; Landreman, Patrick; Schoen, David; Okabe, Kye; Marshall, Ann; Celano, Umberto; Wong, H. -S. Philip; Park, Junghyun; Brongersma, Mark L.
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Elucidating possible crystallographic origins of wake-up mechanisms in ferroelectric hafnia
errAPPLIED PHYSICS LETTERS
IF3.6
err2021-03-02
err16
errOAAI
errMcMitchell, Sean R. C.; Clima, Sergiu; Ronchi, Nicolo'; Banerjee, Kaustuv; Celano, Umberto; Popovici, Mihaela; Di Piazza, Luca; Van den Bosch, Geert; Van Houdt, Jan
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Surface Contamination: A Natural Way toward High-Resolution Electric Force Microscopy in Contact-Resonant Mode
errJOURNAL OF PHYSICAL CHEMISTRY C
IF3.2
err2020-11-10
err0
errOAAI
errMinj, Albert; Serron, Jill; Celano, Umberto; Paredis, Kristof
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errSave

Research Directions

No research directions
Co-authors
Cooperation Journals
M
Mark L. Brongersma
H-index: 101 · Papers: 487
M
Masakazu Aono
H-index: 78 · Papers: 669
G
G. Groeseneken
H-index: 78 · Papers: 1.3K
S
Sefaattin Tongay
H-index: 78 · Papers: 444
S
Stephen Jesse
H-index: 76 · Papers: 637
View more