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Journal of Electronic Testing-Theory and Applications

IF1.3
论文数31
被引数549
期刊论文 31
发表时间
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deleteJournal of Electronic Testing-Theory and Applications
IF1.3
delete2026-04-01
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PREAI
deleteAgrawal, Vishwani D.
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deleteJournal of Electronic Testing-Theory and Applications
IF1.3
delete2026-03-01
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PREAI
deleteZhan, Wenfa; Zhou, Yangxinzi; Zeng, Xiaoyang; Li, Yan
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deleteJournal of Electronic Testing-Theory and Applications
IF1.3
delete2026-02-01
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PREAI
deleteTang, Cheng; Li, Lang
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deleteJournal of Electronic Testing-Theory and Applications
IF1.3
delete2026-02-01
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PREAI
deleteOu, Yu; Wei, Yongzhuang; Ou, Changhai; Pasalic, Enes
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deleteJournal of Electronic Testing-Theory and Applications
IF1.3
delete2026-02-01
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PREAI
deleteShi, Tianyao; Chen, Sining; Chen, Haijin
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deleteJournal of Electronic Testing-Theory and Applications
IF1.3
delete2026-02-01
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deleteOAAI
deleteFadaeinia, Bijan; Tajik, Shahin; Moradi, Amir
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deleteJournal of Electronic Testing-Theory and Applications
IF1.3
delete2026-01-01
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PREAI
deleteZhang, Lei; Liu, Xuejun; Lei, Dengyun; Liao, Danpeng; Liu, Yuan
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deleteJournal of Electronic Testing-Theory and Applications
IF1.3
delete2026-01-01
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PREAI
deleteAzhaganantham, Arulmurugan; Balasubramaniam, Vivek
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deleteJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
IF1.3
delete2025-12-01
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PREAI
deleteBhadavath, Kiran Kumar; Sajjan, Vijayakumar; Domala, Narsaiah; Konduru, Ashok Kumar; Jadapalli, Sreedhar; Vemula, Ramadevi
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deleteJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
IF1.3
delete2025-12-01
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PREAI
deleteAgrawal, Vishwani D.
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deleteJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
IF1.3
delete2025-11-01
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PREAI
deleteCondia, Josie E. Rodriguez; Guerrero-Balaguera, Juan-David; Nunez, Edwar J. Patino; Limas, Robert; Reorda, Matteo Sonza
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deleteJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
IF1.3
delete2025-11-01
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PREAI
deleteArasteh, Bahman; Bulut, Faruk; Ince, Ibrahim Furkan; Sefati, Seyed Salar; Kusetogullari, Huseyin; Kiani, Farzad
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deleteJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
IF1.3
delete2025-11-01
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PREAI
deleteRajasekar, V. R.
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deleteJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
IF1.3
delete2025-11-01
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PREAI
deleteBhadavath, Kiran Kumar; Sajjan, Vijayakumar; Domala, Narsaiah; Konduru, Ashok Kumar; Sreedhar, Jadapalli; Vemula, Ramadevi
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deleteJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
IF1.3
delete2025-11-01
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PREAI
deleteYang, Na; Jiang, Shuhao; Wang, Yun; Miao, Qing
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deleteJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
IF1.3
delete2025-11-01
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PREAI
deleteAlawandi, Shreevatsa; Mallibhat, Kaushik; Kudachi, Umer; Beedanal, Aishwarya
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deleteJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
IF1.3
delete2025-11-01
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PREAI
deleteSharma, Sanjiv; Bhardwaj, Ankur; Singh, Amar; Singh, Vinay
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deleteJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
IF1.3
delete2025-11-01
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PREAI
deleteArasteh, Bahman; Sefati, Seyed Salar; Gunes, Peri; Hosseinzadeh, Vahid; Kiani, Farzad
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deleteJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
IF1.3
delete2025-10-01
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PREAI
deleteAlawandi, Shreevatsa; Mallibhat, Kaushik; Kudachi, Umer; Beedanal, Aishwarya
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deleteJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
IF1.3
delete2025-10-01
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PREAI
deleteAwal, Md Sadik; Gayanath, Buddhipriya; Rahman, Md Tauhidur
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