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收藏High-density, nonvolatile SRAM using monolithic 3D integration of InGaZnO thin-film transistors and Hf0.5Zr0.5O2-based ferroelectric capacitors采用单片3D集成InGaZnO薄膜晶体管和Hf0.5Zr0.5O2基铁电电容的高密度非易失性SRAM
Liu, Qihan; Li, Yu; Liu, Liwei; Jiang, Hao; Zhu, Haozhe; Chen, Zexing; Yang, Yang; Si, Mengwei; Li, Can; Lin, Peng; Wei, Yingfen; Liu, Qi
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收藏Are There High-Density Deep States in an Atomic-Layer-Deposited Indium-Gallium-Zinc Oxide Thin Film?原子层沉积的铟镓锌氧化物薄膜中是否存在高密度深能级态?
Zheng, Liankai; Xing, Lijuan; Lin, Zhiyu; Zhao, Wanpeng; Fan, Yuyan; Dong, Yulong; Wang, Ziheng; Li, Siying; Li, Xiuyan; Wu, Ying; Xu, Jeffrey; Si, Mengwei
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收藏Magnesium niobate as a high-κ gate dielectric for two-dimensional electronics铌酸镁作为二维电子学的高 κ 栅极电介质
Zhu, Cheng-Yi; Zhang, Meng-Ru; Chen, Qing; Yue, Lin-Qing; Song, Rong; Wang, Cong; Li, Hui-Zhen; Zhou, Feichi; Li, Yang; Zhao, Weiwei; Zhen, Liang; Si, Mengwei; Li, Jia; Wang, Jingli; Chai, Yang; Xu, Cheng-Yan; Qin, Jing-Kai
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收藏Model tests of a stiffness-similar jack-up, Part 3: Transit condition and uncertainty analysis
Zhang, C.; Zhang, S.; Yeo, C. K.; Soo, H. J.; Law, Y. Z.; Yu, M.; Chen, W. K.; Cai, M.; How, B. V. E.; Santo, H.; Magee, A. R.; Si, M.
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收藏Model tests of a stiffness-similar jack-up, Part 2: In-place and hull-in-water conditions
Zhang, C.; Zhang, S.; Yu, M.; Soo, H. J.; Law, Y. Z.; Chen, W. K.; Yeo, C. K.; Cai, M.; How, B. V. E.; Santo, H.; Magee, A. R.; Si, M.
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