Milić M. Pejović - Publications, H-index & Citations

Milić M. Pejović

University of Nis

23H指数

142论文数

2.0K被引数

收录论文 19

发表时间

Influence of low dose rate gamma radiation on breakdown voltage and electrical breakdown time delay of working gas Geiger-Muller chamber 低剂量率 γ 辐射对工作气体盖革-米勒室击穿电压和电击穿时间延迟的影响

VACUUM

IF3.9

2022-07-01

PREAI

Pejovic, Milic M.

Separation of vacuum and gas breakdown processes in argon and their influence on electrical breakdown time delay 氩气中真空和气体击穿过程的分离及其对电击穿时间延迟的影响

VACUUM

IF3.9

2020-03-01

PREAI

Pejovic, Milic; Pejovic, Momcilo; Belic, Cedomir; Starikovic, Koviljka

The Influence of the Magnetic Field on DC and the Impulse Breakdown of Noble Gases

MATERIALS

IF3.2

2019-03-05

OAAI

Belic, Cedomir I.; Stankovic, Koviljka D.; Pejovic, Milic M.; Osmokrovic, Predrag V.

Influence of the shape, number, position and dimensions of conductive particles within inter-electrode gap on dc and pulse breakdown voltage value of SF6 and N2 mixture 电极间间隙中导电颗粒的形状，数量，位置和尺寸对SF6和N2混合物的直流和脉冲击穿电压值的影响

INTERNATIONAL JOURNAL OF ELECTRICAL POWER & ENERGY SYSTEMS

IF5

2019-01-01

PREAI

Arbutina, Dalibor; Stankovic, Koviljka; Perazic, Luka; Pejovic, Milic

Processes in insulating gas induced by electrical breakdown responsible for commercial gas-filled surge arresters delay response

VACUUM

IF3.9

2017-03-01

PREAI

Pejovic, Milic; Stankovic, Koviljka; Fetahovic, Irfan; Pejovic, Momcilo

Contribution of fixed oxide traps to sensitivity of pMOS dosimeters during gamma ray irradiation and annealing at room and elevated temperature

SENSORS AND ACTUATORS A-PHYSICAL

IF4.9

2012-02-01

PREAI

Pejovic, Milic M.; Pejovic, Momcilo M.; Jaksic, Aleksandar B.

The influence of additional electrons on memory effect in nitrogen at low pressures

JOURNAL OF PHYSICS D-APPLIED PHYSICS

IF3.2

2011-02-17

PREAI

Nesic, Nikola T.; Pejovic, Momcilo M.; Pejovic, Milic M.; Zivanovic, Emilija N.

Effect of fluorination and hydrogenation by ion implantation on reliability of poly-Si TFTs under gamma irradiation

JOURNAL OF PHYSICS D-APPLIED PHYSICS

IF3.2

2010-12-09

PREAI

Jelenkovic, Emil V.; Ristic, G. S.; Pejovic, M. M.; Jevtic, Milan M.; Jha, Shrawan K.; Videnovic-Misic, Mirjana; Pejovic, M.; Tong, K. Y.

Analysis of processes responsible for the memory effect in air at low pressures

PLASMA SOURCES SCIENCE & TECHNOLOGY

IF3.3

2010-07-08

PREAI

Pejovic, Momcilo M.; Zivanovic, Emilija N.; Pejovic, Milic M.; Karamarkovic, Jugoslav P.

Modelling of time delay of electrical breakdown for nitrogen-filled tubes at pressures of 6.6 and 13.3 mbar in the increase region of the memory curve

JOURNAL OF PHYSICS D-APPLIED PHYSICS

IF3.2

2008-10-30

PREAI

Nesic, N. T.; Ristic, G. S.; Karamarkovic, J. P.; Pejovic, M. M.

Memory effect in argon in the presence of vacuum and gas electrical breakdown mechanisms

APPLIED PHYSICS LETTERS

IF3.6

2008-01-11

PREAI

Pejovic, Momcilo M.; Pejovic, Milic M.

Investigations of breakdown voltage and time delay of gas-filled surge arresters

JOURNAL OF PHYSICS D-APPLIED PHYSICS

IF3.2

2006-09-29

PREAI

Pejovic, Milic M.; Pejovic, Momcilo M.

The influence of some species formed during the discharge and gamma and UV radiation on breakdown voltage and time delay in nitrogen and neon at low pressure

PLASMA SOURCES SCIENCE & TECHNOLOGY

IF3.3

2005-05-31

PREAI

Pejovic, MM; Pejovic, MM

Memory effects in the afterglow: open questions on long-lived species and the role of surface processes

JOURNAL OF PHYSICS D-APPLIED PHYSICS

IF3.2

2001-06-06

PREAI

Petrovic, ZL; Markovic, VL; Pejovic, MM; Gocic, SR

Statistical reliability of time delay values for nitrogen-filled tube at pressure of 1.3 mbar

VACUUM

IF3.9

1999-06-01

PREAI

Pejovic, MM; Ristic, GS; Milosavljevic, CS; Vukovic, PD; Karamarkovic, JP

Influence of light from nitrogen-filled lamps on the time delay of electrical breakdown in nitrogen-filled tubes

JOURNAL OF PHYSICS D-APPLIED PHYSICS

IF3.2

1999-01-01

PREAI

Pejovic, MM; Ristic, GS; Petrovic, ZL

Modelling of charged particle decay in nitrogen afterglow

PLASMA SOURCES SCIENCE & TECHNOLOGY

IF3.3

1999-01-01

PREAI

Markovic, VL; Petrovic, ZL; Pejovic, MM

The behaviour of radiation-induced gate-oxide defects in MOSFETs during annealing at 140°C

JOURNAL OF NON-CRYSTALLINE SOLIDS

IF3.5

1998-10-01

PREAI

Pejovic, M; Jaksic, A; Ristic, G

Formation and passivation of interface traps in irradiated n-channel power VDMOSFETs during thermal annealing

APPLIED SURFACE SCIENCE

IF6.9

1997-01-01

PREAI

Pejovic, M; Ristic, G; Jaksic, A

研究方向