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K

Kazuyoshi Torii

Tokushima University

26H指数
192论文数
2.8K被引数
收录论文 15
发表时间
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Predicting molecular weight of end-capped polystyrenes via multivariate analysis of 1H NMR spectra通过多元分析1H NMR谱预测封端聚苯乙烯的分子量
errPolymer
IF4.5
err2026-08-01
err0
PREAI
errTsukaguchi, Yuta; Kawatani, Ryo; Torii, Kohei; Yoshida, Ken; Mizuguchi, Hitoshi; Hirano, Tomohiro
err分享
err收藏
Band Engineering of Ru/Rutile-TiO2/Ru Capacitors by Doping Cobalt to Suppress Leakage Current
errJOURNAL OF THE ELECTROCHEMICAL SOCIETY
IF3.3
err2011-01-01
err19
errOAAI
errTonomura, Osamu; Sekiguchi, Tomoko; Inada, Naomi; Hamada, Tomoyuki; Miki, Hiroshi; Torii, Kazuyoshi
err分享
err收藏
Isotopic labeling study of the oxygen diffusion in HfO2/SiO2/Si
errAPPLIED PHYSICS LETTERS
IF3.6
err2007-03-29
err19
PREAI
errZhao, Ming; Nakajima, Kaoru; Suzuki, Motofumi; Kimura, Kenji; Uematsu, Masashi; Torii, Kazuyoshi; Kamiyama, Satoshi; Nara, Yasuo; Watanabe, Heiji; Shiraishi, Kenji; Chikyow, Toyohiro; Yamada, Keisaku
err分享
err收藏
Silicon light-emitting transistor for on-chip optical interconnection
errAPPLIED PHYSICS LETTERS
IF3.6
err2006-10-16
err31
PREAI
errSaito, Shin-ichi; Hisamoto, Digh; Shimizu, Haruka; Hamamura, Hirotaka; Tsuchiya, Ryuta; Matsui, Yuichi; Mine, Toshiyuki; Arai, Tadashi; Sugii, Nobuyuki; Torii, Kazuyoshi; Kimura, Shin'ichiro; Onai, Takahiro
err分享
err收藏
Si emission from the SiO2/Si interface during the growth of SiO2 in the HfO2/SiO2/Si structure
errAPPLIED PHYSICS LETTERS
IF3.6
err2006-04-13
err38
errOAAI
errMing, Z; Nakajima, K; Suzuki, M; Kimura, K; Uematsu, M; Torii, K; Kamiyama, S; Nara, Y; Yamada, K
err分享
err收藏
High-quality CVD SiO2 interfacial layer prepared by cyclic deposition with O2 plasma treatment
errJOURNAL OF THE ELECTROCHEMICAL SOCIETY
IF3.3
err2006-01-01
err2
PREAI
errHamamura, Hirotaka; Matsumura, Mieko; Mine, Toshiyuki; Torii, Kazuyoshi
err分享
err收藏
First-principles studies of the intrinsic effect of nitrogen atoms on reduction in gate leakage current through Hf-based high-k dielectrics -: art. no. 143507
errAPPLIED PHYSICS LETTERS
IF3.6
err2005-03-31
err170
errOAAI
errUmezawa, N; Shiraishi, K; Ohno, T; Watanabe, H; Chikyow, T; Torii, K; Yamabe, K; Yamada, K; Kitajima, H; Arikado, T
err分享
err收藏
Application of XPS time-dependent measurement to the analysis of charge trapping phenomena in HfAlOx films
errAPPLIED SURFACE SCIENCE
IF6.9
err2004-10-01
err8
PREAI
errHirose, K; Yamawaki, M; Torii, K; Kawahara, T; Kawashiri, S; Hattori, T
err分享
err收藏
Effects of remote-surface-roughness scattering on carrier mobility in field-effect-transistors with ultrathin gate dielectrics
errAPPLIED PHYSICS LETTERS
IF3.6
err2004-02-23
err41
PREAI
errSaito, S; Torii, K; Shimamoto, Y; Tsujikawa, S; Hamamura, H; Tonomura, O; Mine, T; Hisamoto, D; Onai, T; Yugami, J; Hiratani, M; Kimura, S
err分享
err收藏
Built-in interface in high-κ gate stacks高 κ 栅极堆叠中的内置接口
errAPPLIED SURFACE SCIENCE
IF6.9
err2003-06-01
err18
PREAI
errHiratani, M; Torii, K; Shimamoto, Y; Saito, SI
err分享
err收藏
Ultra-thin titanium oxide film with a rutile-type structure
errAPPLIED SURFACE SCIENCE
IF6.9
err2003-02-01
err23
PREAI
errHiratani, M; Kadoshima, M; Hirano, T; Shimamoto, Y; Matsui, Y; Nabatame, T; Torii, K; Kimura, S
err分享
err收藏
Improved theory for remote-charge-scattering-limited mobility in metal-oxide-semiconductor transistors
errAPPLIED PHYSICS LETTERS
IF3.6
err2002-09-23
err44
PREAI
errSaito, S; Torii, K; Hiratani, M; Onai, T
err分享
err收藏
Strain-imaging observation of the polarization freezing of the domains under the electrode of a Pb(Zr, Ti)O3 film
errAPPLIED PHYSICS LETTERS
IF3.6
err1999-11-15
err7
PREAI
errTakata, K; Miki, H; Torii, K; Kushida-Abdelghafar, K; Fujisaki, Y
err分享
err收藏
Analysis and control of surface degenerated layers grown on thin Pb(Zr, Ti)O-3 films
errAPPLIED SURFACE SCIENCE
IF6.9
err1997-03-01
err22
PREAI
errFujisaki, Y; Torii, K; Hiratani, M; KushidaAbdelghafar, K
err分享
err收藏
Electrode-induced degradation of Pb(ZrxTi1-x)O-3 (PZT) polarization hysteresis characteristics in Pt/PZT/Pt ferroelectric thin-film capacitors
errAPPLIED PHYSICS LETTERS
IF3.6
err1996-11-18
err136
errOAAI
errKushidaAbdelghafar, K; Miki, H; Torii, K; Fujisaki, Y
err分享
err收藏

研究方向

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合作学者
合作期刊
赵
赵明 (Ming Zhao)
H 指数: 57 · 论文数: 312
T
Takanori Hattori
H 指数: 57 · 论文数: 791
Y
Yasuo Nara
H 指数: 51 · 论文数: 731
S
Satoshi Kamiyama
H 指数: 48 · 论文数: 888
K
Kenji Shiraishi
H 指数: 47 · 论文数: 748
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