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Yoshihiro Irokawa

National Institute for Materials Science

22H指数
129论文数
1.7K被引数
收录论文 17
发表时间
Investigation of Deep States in GaN Metal-Oxide-Semiconductor Interfaces氮化镓金属-氧化物-半导体界面中深能级的研究
err2026-05-01
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errOAAI
errIrokawa, Yoshihiro; Usami, Mamoru; Uzuhashi, Jun; Ohkubo, Tadakatsu; Nabatame, Toshihide; Koide, Yasuo
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Mapping of a Lattice-Plane Tilting in a GaN Wafer Using Energy-Resolved X-Ray Diffraction Topography
err2019-02-28
err5
errOAAI
errKim, Jaemyung; Seo, Okkyun; Song, Chulho; Hiroi, Satoshi; Chen, Yanna; Irokawa, Yoshihiro; Nabatame, Toshihide; Koide, Yasuo; Sakata, Osami
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Comparative Analysis of Defects in Mg-Implanted and Mg-Doped GaN Layers on Freestanding GaN Substrates自支撑GaN衬底上Mg注入和Mg掺杂GaN层中缺陷的比较分析
err2018-12-11
err19
errOAAI
errKumar, Ashutosh; Mitsuishi, Kazutaka; Hara, Toru; Kimoto, Koji; Irokawa, Yoshihiro; Nabatame, Toshihide; Takashima, Shinya; Ueno, Katsunori; Edo, Masaharu; Koide, Yasuo
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First-Principles Studies of Hydrogen Adsorption at Pd-SiO2 Interfaces
errSENSORS
IF3.5
err2015-06-22
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errOAAI
errIrokawa, Yoshihiro; Usami, Mamoru
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π-Conjugated polymer/GaN Schottky solar cells
err2011-01-01
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PREAI
errMatsuki, Nobuyuki; Irokawa, Yoshihiro; Nakano, Yoshitaka; Sumiya, Masatomo
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Implantation temperature dependence of Si activation in AlGaN
err2006-05-04
err15
PREAI
errIrokawa, Y; Ishiguro, O; Kachi, T; Pearton, SJ; Ren, F
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Activation characteristics of ion-implanted Si+ in AlGaN -: art. no. 192102
err2005-05-02
err24
PREAI
errIrokawa, Y; Fujishima, O; Kachi, T; Pearton, SJ; Ren, F
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MgO/p-GaN enhancement mode metal-oxide semiconductor field-effect transistors
err2004-04-12
err117
PREAI
errIrokawa, Y; Nakano, Y; Ishiko, M; Kachi, T; Kim, J; Ren, F; Gila, BP; Onstine, AH; Abernathy, CR; Pearton, SJ; Pan, CC; Chen, GT; Chyi, JI
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Activation kinetics of implanted Si+ in GaN and application to fabricating lateral Schottky diodes
err2003-12-15
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errOAAI
errIrokawa, Y; Kim, J; Ren, F; Baik, KH; Gila, BP; Abernathy, CR; Pearton, SJ; Pan, CC; Chen, GT; Chyi, JI
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160-A bulk GaN Schottky diode array
err2003-10-13
err21
PREAI
errBaik, KH; Irokawa, Y; Kim, J; LaRoche, JR; Ren, F; Park, SS; Park, YJ; Pearton, SJ
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Current-voltage and reverse recovery characteristics of bulk GaN p-i-n rectifiers
err2003-09-15
err39
PREAI
errIrokawa, Y; Luo, B; Kim, J; LaRoche, JR; Ren, F; Baik, KH; Pearton, SJ; Pan, CC; Chen, GT; Chyi, JI; Park, SS; Park, YJ
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Inversion behavior in Sc2O3/GaN gated diodes
err2002-07-08
err76
errOAAI
errKim, J; Mehandru, R; Luo, B; Ren, F; Gila, BP; Onstine, AH; Abernathy, CR; Pearton, SJ; Irokawa, Y
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Characteristics of MgO/GaN gate-controlled metal-oxide-semiconductor diodes
err2002-06-17
err103
PREAI
errKim, J; Mehandru, R; Luo, B; Ren, F; Gila, BP; Onstine, AH; Abernathy, CR; Pearton, SJ; Irokawa, Y
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Comparison of surface passivation films for reduction of current collapse in AlGaN/GaN high electron mobility transistors
err2002-01-01
err41
PREAI
errLuo, B; Mehandru, R; Kim, J; Ren, F; Gila, BP; Onstine, AH; Abernathy, CR; Pearton, SJ; Fitch, R; Gillespie, J; Jenkins, T; Sewell, J; Via, D; Crespo, A; Irokawa, Y
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