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160-A bulk GaN Schottky diode array

delete2003-10-13
delete21
PRE
AI
K
Kwang Hyeon Baik
Y
Yoshihiro Irokawa
J
Jihyun Kim
L
LaRoche, JR
F
F. Ren
S
S. S. Park
Y
Y. J. Park
S
S. J. Pearton
DOI:10.1063/1.1618022delete
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摘要

摘要

En 中文
Pt Schottky rectifier arrays were fabricated on 200-mum-thick, freestanding GaN layers. Even with the reduced dislocation density in these layers (similar to10(5) cm(-2)) relative to conventional GaN on sapphire (>10(8) cm(-2)), rectifiers fabricated on the freestanding GaN show a strong dependence of reverse breakdown on contact diameter. We show that by interconnecting the output of many (similar to130) smaller (500 mumx500 mum) rectifiers, we can achieve high total forward output current (161 A at 7.12 V), low forward turn-on voltage of similar to3 V, and maintain the reverse breakdown voltage. The on/off ratio of the rectifier array was similar to8x10(7) at 5 V/-100 V. (C) 2003 American Institute of Physics.
Keyword:
BREAKDOWN VOLTAGE
POWER
RECTIFIERS
PERFORMANCE
DEVICES
DESIGN
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期刊

Applied Physics Letters 封面图
Applied Physics Letters
IF:
3.6
论文数:
10.4W
被引数:
17.8W

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