Claudia Fleischmann - Publications, H-index & Citations

Claudia Fleischmann

imec

18H指数

123论文数

959被引数

收录论文 34

发表时间

Investigation of a Reversible Apex Topography in Core/Shell Field Emitters 对核壳场发射体中可逆顶点形貌的研究

Microscopy and Microanalysis

IF3

2026-09-16

PREAI

Nadya Spettel; Jeroen E Scheerder; Tsung-Wei Chou; Yuan Tu; Shreya Garg; Jorden De Bolle; Christophe Detavernier; Claudia Fleischmann; André Vantomme

Reviewing the Experimental Estimation of the Laser-Induced Apex Temperature in Atom Probe Tomography and Application to Si Field Emitter in UV 回顾激光诱导原子探针断层术中顶点温度的实验估计及其在Si场发射体UV中的应用

Microscopy and Microanalysis

IF3

2026-08-07

PREAI

Jeroen E Scheerder; Zeno Maesen; Richard J H Morris; Masoud Dialameh; André Vantomme; Claudia Fleischmann

Rethinking surface engineering - Conclusions from the 100th IUVSTA workshop dedicated to responsible surface engineering 重新思考表面工程——来自第100届IUVSTA关于负责任表面工程研讨会的结论

SURFACE & COATINGS TECHNOLOGY

IF6.1

2026-08-01

PREAI

Hans, Marcus; Greczynski, Grzegorz; Rebholz, Claus; Ulrich, Sven; Fleischmann, Claudia; Pedersen, Henrik; Sundgren, Jan-Eric; Mitterer, Christian

Leveraging AutoTEM for Automated Specimen Lift-out for Atom Probe Tomography 利用AutoTEM实现原子探针断层术的自动化样品拾取

Microscopy and Microanalysis

IF3

2026-07-27

OAAI

Jeroen E Scheerder; Kris Paulussen; Richard J H Morris; Eva Grieten; Claudia Fleischmann

Detection and Modulation of Gap States at the Grain Boundaries of Monolayer WS2 单层WS2晶界间隙态的检测和调制

ACS Applied Materials and Interfaces

IF8.2

2026-02-05

PREAI

Fateme Yekefalah; Albert Minj; Ankit Nalin Mehta; Thomas Nuytten; Pawan Kumar; Claudia Fleischmann; Ingrid De Wolf

A Statistical Approach for Evaluating the Spatial Distribution and Local Atomic Environment of Dopants Using Atom Probe Tomography 一种用于评估掺杂剂空间分布和局部原子环境的方法：基于原子探针断层术的统计方法

MICROSCOPY AND MICROANALYSIS

IF3

2025-12-01

PREAI

Lin, Jhao-Rong; Morris, Richard J. H.; Scheerder, Jeroen E.; Hikavyy, Andriy; Porret, Clement; Vantomme, Andre; Fleischmann, Claudia

The Impact of NiO Interlayers and Annealing on Pt/Co for SOT-MRAM NiO中间层和退火对Pt/Co中SOT-MRAM的影响

ACS Applied Electronic Materials

IF4.7

2025-07-22

PREAI

Michelle Wijshoff; Robert Carpenter; Giacomo Talmelli; Sébastien Couet; Jeroen E. Scheerder; Rikkie Joris; Margriet J. Van Bael; Claudia Fleischmann; Kristiaan Temst

Soft X-ray chemically sensitive ptychographic imaging of 3D nano-objects

OPTICS EXPRESS

IF3.3

2024-11-18

OAAI

Krasnov, Vitaly; Makhotkin, Igor; Scheerder, Jeroen e.; Loetgering, Lars; Soltwisch, Victor; van der Heide, Paul a. w.; Fleischmann, Claudia

Raman spectroscopy capabilities for advanced semiconductor technology devices

APPLIED PHYSICS LETTERS

IF3.6

2024-07-31

PREAI

Nuytten, Thomas; Bogdanowicz, Janusz; Sergeant, Stefanie; Fleischmann, Claudia

Vacancy-Type Defects and Oxygen Incorporation in NiAl for Advanced Interconnects Probed by Monoenergetic Positron Beams and Atom Probe Tomography

ACS APPLIED ELECTRONIC MATERIALS

IF4.7

2024-07-10

PREAI

Uedono, Akira; Fleischmann, Claudia; Soulie, Jean-Philippe; Ayyad, Mustafa; Scheerder, Jeroen E.; Adelmann, Christoph; Uzuhashi, Jun; Ohkubo, Tadakatsu; Michishio, Koji; Oshima, Nagayasu; Ishibashi, Shoji

Automated calibration of model-driven reconstructions in atom probe tomography

JOURNAL OF PHYSICS D-APPLIED PHYSICS

IF3.2

2022-07-01

OAAI

Fletcher, Charles; Moody, Michael P.; Fleischmann, Claudia; Dialameh, Masoud; Porret, Clement; Geiser, Brian; Haley, Daniel

Simultaneous Dimensional and Analytical Characterization of Ordered Nanostructures

SMALL

IF12.1

2021-11-25

OAAI

Hoenicke, Philipp; Kayser, Yves; Nikolaev, Konstantin, V; Soltwisch, Victor; Scheerder, Jeroen E.; Fleischmann, Claudia; Siefke, Thomas; Andrle, Anna; Gwalt, Grzegorz; Siewert, Frank; Davis, Jeffrey; Huth, Martin; Veloso, Anabela; Loo, Roger; Skroblin, Dieter; Steinert, Michael; Undisz, Andreas; Rettenmayr, Markus; Beckhoff, Burkhard

Grain-boundary segregation of magnesium in doped cuprous oxide and impact on electrical transport properties (vol 11, 7788, 2021)

SCIENTIFIC REPORTS

IF3.9

2021-08-25

OAAI

Resende, Joao; Nguyen, Van-Son; Fleischmann, Claudia; Bottiglieri, Lorenzo; Brochen, Stephane; Vandervorst, Wilfried; Favre, Wilfried; Jimenez, Carmen; Deschanvres, Jean-Luc; Nguyen, Ngoc Duy

Grain-boundary segregation of magnesium in doped cuprous oxide and impact on electrical transport properties

SCIENTIFIC REPORTS

IF3.9

2021-04-08

OAAI

Resende, Joao; Van-Son Nguyen; Fleischmann, Claudia; Bottiglieri, Lorenzo; Brochen, Stephane; Vandervorst, Wilfried; Favre, Wilfried; Jimenez, Carmen; Deschanvres, Jean-Luc; Ngoc Duy Nguyen

Bipolar device fabrication using a scanning tunnelling microscope

NATURE ELECTRONICS

IF40.9

2020-07-27

PREAI

Skeren, Tomas; Koester, Sigrun A.; Douhard, Bastien; Fleischmann, Claudia; Fuhrer, Andreas

A Correlative ToF-SIMS/SPM Methodology for Probing 3D Devices

ANALYTICAL CHEMISTRY

IF6.7

2020-07-15

OAAI

Spampinato, Valentina; Dialameh, Masoud; Franquet, Alexis; Fleischmann, Claudia; Conard, Thierry; van der Heide, Paul; Vandervorst, Wilfried

Nanoscale Localization of an Atom Probe Tip through Electric Field Mapping

JOURNAL OF PHYSICAL CHEMISTRY C

IF3.2

2019-12-16

OAAI

de Beeck, Jonathan Op; Fleischmann, C.; Vandervorst, W.; Paredis, K.

Amorphous Gadolinium Aluminate as a Dielectric and Sulfur for Indium Phosphide Passivation 非晶铝酸钆作为电介质和硫用于磷化铟钝化

ACS APPLIED ELECTRONIC MATERIALS

IF4.7

2019-10-25

PREAI

van Dorp, Dennis H.; Nyns, Laura; Cuypers, Daniel; Ivanov, Tsvetan; Brizzi, Simone; Tallarida, Massimo; Fleischmann, Claudia; Hoenicke, Philipp; Mueller, Matthias; Richard, Olivier; Schmeisser, Dieter; De Gendt, Stefan; Lin, Dennis H. C.; Adelmann, Christoph

Inorganic material profiling using Arn+ cluster: Can we achieve high quality profiles?

APPLIED SURFACE SCIENCE

IF6.9

2018-06-01

OAAI

Conard, T.; Fleischmann, C.; Havelund, R.; Franquet, A.; Poleunis, C.; Delcorte, A.; Vandervorst, W.

Atom probe tomography for advanced nanoelectronic devices: Current status and perspectives

SCRIPTA MATERIALIA

IF5.6

2018-04-01

PREAI

Barnes, J. P.; Grenier, A.; Mouton, I.; Barraud, S.; Audoit, G.; Bogdanowicz, J.; Fleischmann, C.; Melkonyan, D.; Vandervorst, W.; Duguay, S.; Rolland, N.; Vurpillot, F.; Blavette, D.

研究方向