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J

Jong-Ahn Kim

korea research institute of standards & science (kriss)

20H指数
95论文数
1.2K被引数
收录论文 18
发表时间
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Hybrid optical measurement system for evaluation of precision two-dimensional planar stages
errMEASUREMENT
IF5.6
err2022-05-01
err6
errOAAI
errKim, Jong-Ahn; Lee, Jae Yong; Kang, Chu-Shik; Woo, Jae Heun
err分享
err收藏
Absolute Planar Position and Full Angle Orientation Sensor Using a 2-D Color-Coded Binary Scale
errIEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
IF5.9
err2020-05-01
err7
PREAI
errKim, Jong-Ahn; Kim, Jae Wan; Kang, Chu-Shik; Lee, Jae Yong; Woo, Jae Heun
err分享
err收藏
On-machine calibration of angular position and runout of a precision rotation stage using two absolute position sensors
errMEASUREMENT
IF5.6
err2020-03-01
err13
PREAI
errKim, Jong-Ahn; Kim, Jae Wan; Kang, Chu-Shik; Lee, Jae Yong; Jin, Jonghan
err分享
err收藏
Interferometric profile scanning system for measuring large planar mirror surface based on single-interferogram analysis using Fourier transform method
errMEASUREMENT
IF5.6
err2018-03-01
err8
PREAI
errKim, Jong-Ahn; Kim, Jae Wan; Kang, Chu-Shik; Jin, Jonghan; Eom, Tae Bong
err分享
err收藏
Optical Fiber-Based Confocal and Interferometric System for Measuring the Depth and Diameter of Through Silicon Vias基于光纤的共焦和干涉测量系统，用于测量硅通孔的深度和直径
errJOURNAL OF LIGHTWAVE TECHNOLOGY
IF4.8
err2016-12-01
err12
PREAI
errAhn, Heulbi; Park, Jungjae; Kim, Jong-Ahn; Jin, Jonghan
err分享
err收藏
Absolute angle measurement using a phase-encoded binary graduated disk
errMEASUREMENT
IF5.6
err2016-02-01
err51
PREAI
errKim, Jong-Ahn; Kim, Jae Wan; Kang, Chu-Shik; Jin, Jonghan; Eom, Tae Bong
err分享
err收藏
Vibration-insensitive measurements of the thickness profile of large glass panels
errOPTICS EXPRESS
IF3.3
err2015-12-14
err33
errOAAI
errPark, Jungjae; Bae, Jaeseok; Jin, Jonghan; Kim, Jong-Ahn; Kim, Jae Wan
err分享
err收藏
An optical straightness measurement sensor for the KRISS watt balance
errMEASUREMENT
IF5.6
err2015-02-01
err5
PREAI
errKang, Chu-Shik; Kim, Jong-Ahn; Jin, Jonghan; Eom, Tae Bong; Kim, Jae Wan
err分享
err收藏
Fizeau-type interferometric probe to measure geometrical thickness of silicon wafers
errOPTICS EXPRESS
IF3.3
err2014-09-17
err27
errOAAI
errJin, Jonghan; Maeng, Saerom; Park, Jungjae; Kim, Jong-Ahn; Kim, Jae Wan
err分享
err收藏
Vibration-insensitive measurement of thickness variation of glass panels using double-slit interferometry
errOPTICS EXPRESS
IF3.3
err2014-03-12
err15
errOAAI
errKim, Jong-Ahn; Kim, Jae Wan; Eom, Tae Bong; Jin, Jonghan; Kang, Chu-Shik
err分享
err收藏
Precision depth measurement of through silicon vias (TSVs) on 3D semiconductor packaging process
errOPTICS EXPRESS
IF3.3
err2012-02-14
err31
errOAAI
errJin, Jonghan; Kim, Jae Wan; Kang, Chu-Shik; Kim, Jong-Ahn; Lee, Sunghun
err分享
err收藏
Visibility enhanced interferometer based on an injection-locking technique for low reflective materials
errOPTICS EXPRESS
IF3.3
err2010-10-25
err3
errOAAI
errJin, Jonghan; Kim, Jae Wan; Kang, Chu-Shik; Kim, Jong-Ahn
err分享
err收藏
Thickness and refractive index measurement of a silicon wafer based on an optical comb
errOPTICS EXPRESS
IF3.3
err2010-08-12
err95
errOAAI
errJin, Jonghan; Kim, Jae Wan; Kang, Chu-Shik; Kim, Jong-Ahn; Eom, Tae Bong
err分享
err收藏
A passive method to compensate nonlinearity in a homodyne interferometer
errOPTICS EXPRESS
IF3.3
err2009-12-04
err55
errOAAI
errAhn, Jeongho; Kim, Jong-Ahn; Kang, Chu-Shik; Kim, Jae Wan; Kim, Soohyun
err分享
err收藏
High resolution interferometer with multiple-pass optical configuration
errOPTICS EXPRESS
IF3.3
err2009-11-04
err15
errOAAI
errAhn, Jeongho; Kim, Jong-Ahn; Kang, Chu-Shik; Kim, Jae-Wan; Kim, Soohyun
err分享
err收藏
High speed phase shifting interferometry using injection locking of the laser frequency to the resonant modes of a confocal Fabry-Perot cavity
errOPTICS EXPRESS
IF3.3
err2009-01-23
err6
errOAAI
errKang, Chu-Shik; Kim, Jong-Ahn; Eom, Tae Bong; Jang, Roma; Park, Hae Yong; Kim, Jae Wan
err分享
err收藏
A compact system for simultaneous measurement of linear and angular displacements of nano-stages
errOPTICS EXPRESS
IF3.3
err2007-01-01
err43
errOAAI
errKim, Jae Wan; Kang, Chu-Shik; Kim, Jong-Ahn; Eom, Taebong; Cho, Mijung; Kong, Hong Jin
err分享
err收藏
Design methods for six-degree-of-freedom displacement measurement systems using cooperative targets使用合作目标的六自由度位移测量系统的设计方法
errPRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY
IF3.7
err2002-01-01
err39
PREAI
errKim, JA; Bae, EW; Kim, SH; Kwak, YK
err分享
err收藏

研究方向

暂时未获取到该数据
合作学者
合作期刊
H
Hong Jin Kong
H 指数: 32 · 论文数: 421
S
Soohyun Kim
H 指数: 32 · 论文数: 258
S
Sunghun Lee
H 指数: 31 · 论文数: 167
Y
Yoon Keun Kwak
H 指数: 25 · 论文数: 230
J
Jonghan Jin
H 指数: 23 · 论文数: 142
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